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MT28F016S5VG-9

Part # MT28F016S5VG-9
Description NOR Flash Parallel 5V 16Mbit2M x 8bit 90ns 40-Pin TSOP-I
Category IC
Availability In Stock
Qty 23
Qty Price
1 - 4 $9.18410
5 - 9 $7.30553
10 - 14 $6.88807
15 - 19 $6.40104
20 + $5.70527
Manufacturer Available Qty
Micron Technology
Date Code: 9928
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Technical Document


DISCLAIMER: The information provided herein is solely for informational purposes. Customers must be aware of the suitability of this product for their application, and consider that variable factors such as Manufacturer, Product Category, Date Codes, Pictures and Descriptions may differ from available inventory.

16
2 Meg x 8 Smart 5 Even-Sectored Flash Memory Micron Technology, Inc., reserves the right to change products or specifications without notice.
F42.p65 – Rev. 1/00 ©2000, Micron Technology, Inc.
ADVANCE
2 MEG x 8
SMART 5 EVEN-SECTORED FLASH MEMORY
ELECTRICAL CHARACTERISTICS AND RECOMMENDED DC READ
OPERATING CONDITIONS
(0°C £ T
A
£ +70°C)
PARAMETER/CONDITION SYMBOL MIN MAX UNITS NOTES
5V Supply Voltage VCC 4.5 5.5 V 1
Input High (Logic 1) Voltage, all inputs VIH 2VCC + 0.5 V 1
Input Low (Logic 0) Voltage, all inputs VIL -0.5 0.8 V 1
ABSOLUTE MAXIMUM RATINGS*
Voltage on VCC Supply
Relative to VSS ............................. -0.5V to +6V**
Input Voltage Relative to VSS ................ -0.5V to +6V**
VPP Voltage Relative to VSS ................. -0.5V to +12.6V
Temperature Under Bias ...................... -10°C to +80°C
Storage Temperature (plastic) ............ -55°C to +125°C
Power Dissipation ................................................... 1W
*Stresses greater than those listed under “Absolute
Maximum Ratings” may cause permanent damage to
the device. This is a stress rating only, and functional
operation of the device at these or any other conditions
above those indicated in the operational sections of
this specification is not implied. Exposure to absolute
maximum rating conditions for extended periods may
affect reliability.
**VCC, input and I/O pins may transition to -2V for
<20ns and VCC + 2V for <20ns.
Voltage may pulse to -2V for <20ns and 14V for <20ns.
DC OPERATING CHARACTERISTICS
(0°C £ T
A
£ +70°C)
PARAMETER/CONDITION SYMBOL MIN MAX UNITS NOTES
OUTPUT VOLTAGE LEVELS (TTL) VOH1 2.4 V
Output High Voltage (IOH = -2.5mA) 1
Output Low Voltage (IOL = 5.8mA) VOL 0.45 V
OUTPUT VOLTAGE LEVELS (CMOS) VOH2 VCC - 0.4 V 1
Output High Voltage (IOH = -100µA)
INPUT LEAKAGE CURRENT
Any input (0V £ VIN £ VCC); IL -1 1 µA
All other pins not under test = 0V
OUTPUT LEAKAGE CURRENT IOZ -10 10 µA
(DOUT is disabled; 0V £ VOUT £ VCC)
NOTE: 1. All voltages referenced to VSS.
17
2 Meg x 8 Smart 5 Even-Sectored Flash Memory Micron Technology, Inc., reserves the right to change products or specifications without notice.
F42.p65 – Rev. 1/00 ©2000, Micron Technology, Inc.
ADVANCE
2 MEG x 8
SMART 5 EVEN-SECTORED FLASH MEMORY
CAPACITANCE
(T
A
= +25°C; f = 1 MHz)
PARAMETER/CONDITION SYMBOL MAX UNITS NOTES
Input Capacitance CI 8pF
Output Capacitance CO 12 pF
READ AND STANDBY CURRENT DRAIN
(0°C £ T
A
£ +70°C; VCC = +5V ±10%)
PARAMETER/CONDITION SYMBOL TYP MAX UNITS NOTES
READ CURRENT: TTL INPUT LEVELS ICC1 8 50 mA 1, 2
(CE# = VIL; OE# = VIH; f =
8 MHz; Other inputs = VIL or VIH; RP# = VIH)
READ CURRENT: CMOS INPUT LEVELS
(CE# £ 0.2V; OE# • VCC - 0.2V; f =
8 MHz; Other inputs £ 0.2V ICC2 5 35 mA 1, 2
or • VCC - 0.2V; RP# = VCC - 0.2V)
STANDBY CURRENT: TTL INPUT LEVELS
VCC power supply standby current ICC3 0.2 2 mA
(CE# = RP# = VIH; Other inputs = VIL or VIH)
STANDBY CURRENT: CMOS INPUT LEVELS
VCC power supply standby current ICC4 65 100 µA
(CE# = RP# = VCC - 0.2V)
DEEP POWER-DOWN CURRENT: VCC SUPPLY (RP# = VSS ±0.2V) ICC5 120µA
STANDBY OR READ CURRENT: VPP SUPPLY (VPPVCC)IPP1 ±2 ±15 µA
DEEP POWER-DOWN CURRENT: VPP SUPPLY (RP# = VSS ±0.2V) IPP2 25µA
NOTE: 1. ICC is dependent on cycle rates.
2. ICC is dependent on output loading. Specified values are obtained with the outputs open.
18
2 Meg x 8 Smart 5 Even-Sectored Flash Memory Micron Technology, Inc., reserves the right to change products or specifications without notice.
F42.p65 – Rev. 1/00 ©2000, Micron Technology, Inc.
ADVANCE
2 MEG x 8
SMART 5 EVEN-SECTORED FLASH MEMORY
READ TIMING PARAMETERS
ELECTRICAL CHARACTERISTICS AND RECOMMENDED AC OPERATING CONDITIONS
(0°C £ T
A
£ +70°C; VCC = +5V ±10%)
AC CHARACTERISTICS -9
PARAMETER SYMBOL MIN MAX UNITS NOTES
READ cycle time
t
RC 90 ns
Access time from CE#
t
ACE 90 ns 1
Access time from OE#
t
AOE 45 ns 1
Access time from address
t
AA 90 ns
RP# HIGH to output valid delay
t
RWH 400 ns
OE# or CE# HIGH to output in High-Z
t
OD 20 ns
Output hold time from OE#, CE# or address change
t
OH 0 ns
AC TEST CONDITIONS
Input pulse levels ............................................... 0.4V to 2.4V
Input rise and fall times ................................................ <10ns
Input timing reference level .............................. 0.8V and 2V
Output timing reference level........................... 0.8V and 2V
Output load ................................. 1 TTL gate and C
L = 100pF
NOTE: 1. OE# may be delayed by
t
ACE minus
t
AOE after CE# falls before
t
ACE is affected.
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