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MT28F016S5VG-9

Part # MT28F016S5VG-9
Description NOR Flash Parallel 5V 16Mbit2M x 8bit 90ns 40-Pin TSOP-I
Category IC
Availability In Stock
Qty 23
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Manufacturer Available Qty
Micron Technology
Date Code: 9928
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Technical Document


DISCLAIMER: The information provided herein is solely for informational purposes. Customers must be aware of the suitability of this product for their application, and consider that variable factors such as Manufacturer, Product Category, Date Codes, Pictures and Descriptions may differ from available inventory.

10
2 Meg x 8 Smart 5 Even-Sectored Flash Memory Micron Technology, Inc., reserves the right to change products or specifications without notice.
F42.p65 – Rev. 1/00 ©2000, Micron Technology, Inc.
ADVANCE
2 MEG x 8
SMART 5 EVEN-SECTORED FLASH MEMORY
Table 4
Command Sequences
BUS 1ST 2ND
CYCLES CYCLE CYCLE
COMMANDS REQ’D OPERATION ADDRESS DATA OPERATION ADDRESS DATA NOTES
READ ARRAY 1 WRITE X FFH 1
READ DEVICE CONFIGURATION 2 WRITE X 90H READ CA CD 2, 3
READ STATUS REGISTER 2 WRITE X 70H READ X SRD 4
CLEAR STATUS REGISTER 1 WRITE X 50H
ERASE SETUP/CONFIRM 2 WRITE X 20H WRITE BA D0H 5, 6
ERASE SUSPEND/RESUME 2 WRITE X B0H WRITE X D0H
WRITE SETUP/WRITE 2 WRITE X 40H WRITE WA WD 6, 7
ALTERNATE WRITE 2 WRITE X 10H WRITE WA WD 6, 7
COMMAND EXECUTION
Commands are issued to bring the device into
different operational modes. Each mode allows specific
operations to be performed. Several modes require a
sequence of commands to be written before they are
reached. The following section describes the properties
of each mode, and Table 4 lists all command sequences
required to perform the desired operation.
READ ARRAY
The array read mode is the initial state of the device
upon power-up and is also entered after a RESET. If the
device is in any other mode, READ ARRAY (FFH) must
be given to return to the array read mode. Unlike the
WRITE SETUP command (40H), READ ARRAY does not
need to be given before each individual read access.
DEVICE CONFIGURATION
To read the device ID and manufacturer compatibil-
ity ID, the READ DEVICE CONFIGURATION (90H)
command must be issued. While the device is in this
mode, specific addresses must be issued to read the
desired information. The manufacturer compatibility
ID is read at 000000H, and the device ID is read at
000001H.
WRITE SEQUENCE
Two consecutive cycles are needed to input data to
the array. WRITE SETUP (40H or 10H) is given in the
first cycle. The next cycle is the WRITE, during which
the write address and data are issued and VPP is brought
to VPPH. The ISM will now begin to write the byte. VPP
must be held at VPPH until the WRITE is completed (SR7
= 1 and RY/BY# = VOH).
While the ISM executes the WRITE, the ISM status
bit (SR7) will be at “0” and RY/BY# = VOL, and the device
will not respond to any commands. Any READ opera-
tion will produce the status register contents on DQ0-
DQ7. When the ISM status bit (SR7) is set to a logic 1 and
RY/BY# = VOH, the WRITE has been completed, and the
device will go into the status register read mode until
another command is given.
NOTE: 1. Must follow WRITE or ERASE CONFIRM commands to the CEL in order to enable flash array READ cycles.
2. CA = Configuration Address: 00000H for manufacturer compatibility ID and 00001H for device ID.
3. CD = Configuration Data.
4. SRD = Status Register Data.
5. BA = Block Address.
6. Addresses are “Don’t Care” in first cycle but must be held stable.
7. WA = Address to be written; WD = Data to be written to WA.
11
2 Meg x 8 Smart 5 Even-Sectored Flash Memory Micron Technology, Inc., reserves the right to change products or specifications without notice.
F42.p65 – Rev. 1/00 ©2000, Micron Technology, Inc.
ADVANCE
2 MEG x 8
SMART 5 EVEN-SECTORED FLASH MEMORY
ERASE SEQUENCE
Executing an ERASE sequence will set all bits within
a block to logic 1. The command sequence necessary to
execute an ERASE is similar to that of a WRITE. To
provide added security against accidental block era-
sure, two consecutive command cycles are required to
initiate an ERASE of a block. In the first cycle, addresses
are “Don’t Care,” and ERASE SETUP (20H) is given. In
the second cycle, VPP is brought to VPPH, an address
within the block to be erased is issued, and ERASE
CONFIRM (D0H) is given. If a command other than
ERASE CONFIRM is given, the write and erase status bits
(SR4 and SR5) will be set, and the device will be in the
read status mode.
After the ERASE CONFIRM (D0H) is issued, the ISM
will start the ERASE of the addressed block. Any READ
operation will output the status register contents on
DQ0-DQ7. VPP must be held at VPPH until the ERASE is
completed (SR7 = 1 and RY/BY# = VOH). Once the ERASE
is completed, the device will be in the status register
read mode until another command is issued.
ERASE SUSPENSION
The only command that may be issued while an
ERASE is in progress is ERASE SUSPEND. This command
allows other commands to be executed while pausing
the ERASE in progress. Once the device has reached the
suspend mode, the erase suspend status bit (SR6) and
ISM status bit (SR7) will be set and RY/BY# will transi-
tion to VOH. The device may now be given a READ
ARRAY, ERASE RESUME or READ STATUS REGISTER
command. After READ ARRAY has been issued, any
location not within the block being erased may be read.
If ERASE RESUME is issued before SR6 has been set, the
device will immediately proceed with the ERASE in
progress. During an ERASE SUSPEND, VPP and RP# must
remain at the same levels used for the ERASE.
ERROR HANDLING
After the ISM status bit (SR7) has been set, VPP (SR3),
write (SR4) and erase (SR5) status bits may be checked.
If one or a combination of these four bits has been set,
an error has occurred. The ISM cannot reset these four
bits. To clear these bits, CLEAR STATUS REGISTER
(50H) must be given. Table 6 lists the combination of
errors.
WRITE/ERASE CYCLE ENDURANCE
The MT28F016S5 is designed and fabricated to meet
advanced firmware and data storage requirements. To
ensure this level of reliability, VPP must be at 5V ±10%
during WRITE or ERASE cycles. For SmartVoltage-
compatible production programming, 12V VPP is sup-
ported for a maximum of 100 cycles and may be
connected for up to 100 cumulative hours. Operation
outside these limits may reduce the number of WRITE
and ERASE cycles that can be performed on the device.
POWER USAGE
The MT28F016S5 offers several power-saving fea-
tures that may be utilized in the array read mode to
conserve power. Deep power-down mode is enabled by
bringing RP# to VSS ±0.2V. Current draw (ICC) in this
mode is a maximum of 10µA. When CE# is HIGH, the
device will enter standby mode. In this mode, maxi-
mum ICC current is 100µA. If CE# is brought HIGH
during a WRITE or ERASE, the ISM will continue to
operate, and the device will consume the respective
active power until the WRITE or ERASE is completed.
POWER-UP
The likelihood of unwanted WRITE or ERASE opera-
tions is minimized since two consecutive cycles are
required to execute either operation. However, to reset
the ISM and to provide additional protection while VCC
is ramping, one of the following conditions must be
met:
RP# must be held LOW until VCC is at valid func-
tional level; or
CE# or WE# may be held HIGH and
RP# must be toggled from VCC-GND-VCC.
After a power-up or RESET, the status register is reset,
and the device will enter the array read mode.
Figure 2
Power-Up/Reset Timing Diagram
VALID
VALID
V
CC
(5V)
Data
Address
UNDEFINED
t
Note 1
RP#
RWH
t
AA
NOTE: 1. V
CC
must be within the valid operating range before RP#
g
oes HIGH.
12
2 Meg x 8 Smart 5 Even-Sectored Flash Memory Micron Technology, Inc., reserves the right to change products or specifications without notice.
F42.p65 – Rev. 1/00 ©2000, Micron Technology, Inc.
ADVANCE
2 MEG x 8
SMART 5 EVEN-SECTORED FLASH MEMORY
Table 6
Status Register Error Decode
1
STATUS BITS
SR5 SR4 SR3 ERROR DESCRIPTION
2
0 0 0 No errors
001VPP voltage error
0 1 0 WRITE error
0 1 1 WRITE error, VPP voltage not valid
1 0 0 ERASE error
1 0 1 ERASE error, VPP voltage not valid
1 1 0 Command sequencing error
NOTE: 1. SR3-SR5 must be cleared using CLEAR STATUS REGISTER.
2. SR3-SR4 reflect noncumulative results.
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