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MT28F016S5VG-9

Part # MT28F016S5VG-9
Description NOR Flash Parallel 5V 16Mbit2M x 8bit 90ns 40-Pin TSOP-I
Category IC
Availability In Stock
Qty 23
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5 - 9 $7.30553
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20 + $5.70527
Manufacturer Available Qty
Micron Technology
Date Code: 9928
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Technical Document


DISCLAIMER: The information provided herein is solely for informational purposes. Customers must be aware of the suitability of this product for their application, and consider that variable factors such as Manufacturer, Product Category, Date Codes, Pictures and Descriptions may differ from available inventory.

4
2 Meg x 8 Smart 5 Even-Sectored Flash Memory Micron Technology, Inc., reserves the right to change products or specifications without notice.
F42.p65 – Rev. 1/00 ©2000, Micron Technology, Inc.
ADVANCE
2 MEG x 8
SMART 5 EVEN-SECTORED FLASH MEMORY
NOTE: 1. L = VIL (LOW), H = VIH (HIGH), X = VIL or VIH (“Don’t Care”).
2. VPPH = 5V.
3. BA = Block Address; WA = Write Address.
4. Operation must be preceded by ERASE SETUP command.
5. Operation must be preceded by WRITE SETUP command.
6. The READ ARRAY command must be issued before reading the array after writing or erasing.
TRUTH TABLE
1
FUNCTION RP# CE# OE# WE# ADDRESS V
PP
DQ0-DQ7 RY/BY#
Standby H H XXXXHigh-Z V
OH
Deep Power-Down/Reset L XXXXXHigh-Z V
OH
READ
READ H L L H X X Data-Out V
OH
Output Disable H L H H X X High-Z V
OH
WRITE/ERASE
2, 3
ERASE SETUP H L H L X X 20H V
OH
ERASE CONFIRM
4
HLHLBAV
PPH
D0H V
OH
Æ V
OL
WRITE SETUP H L H L X X 10H/40H V
OH
WRITE
5
HLHLWAV
PPH
Data-In V
OH
Æ V
OL
READ ARRAY
6
H L H L X X FFH V
OH
DEVICE CONFIGURATION
Manufacturer Compatibility ID H L L H 000000H X 89H V
OH
Device ID H L L H 000001H X A0H V
OH
5
2 Meg x 8 Smart 5 Even-Sectored Flash Memory Micron Technology, Inc., reserves the right to change products or specifications without notice.
F42.p65 – Rev. 1/00 ©2000, Micron Technology, Inc.
ADVANCE
2 MEG x 8
SMART 5 EVEN-SECTORED FLASH MEMORY
FUNCTIONAL DESCRIPTION
The MT28F016S5 flash memory incorporates a num-
ber of features that make it ideally suited for system
firmware or data storage. The memory array is seg-
mented into individual erase blocks. Each block may be
erased without affecting data stored in other blocks.
These memory blocks are read, written and erased by
issuing commands to the command execution logic
(CEL). The CEL controls the operation of the internal
state machine (ISM), which completely controls all
WRITE, BLOCK ERASE and VERIFY operations. The ISM
protects each memory location from over-erasure and
optimizes each memory location for maximum data
retention. In addition, the ISM greatly simplifies the
control necessary for writing the device in-system or in
an external programmer.
The Functional Description provides detailed infor-
mation on the operation of the MT28F016S5 and is
organized into these sections:
Overview
Memory Architecture
Output (READ) Operations
Input Operations
Command Set
ISM Status Register
Device Configuration Registers
Command Execution
Error Handling
WRITE/ERASE Cycle Endurance
Power Usage
Power-Up
OVERVIEW
SMART 5 TECHNOLOGY
Smart 5 technology allows maximum flexibility for
in-system READ, WRITE and ERASE operations. For 5V-
only systems, WRITE and ERASE operations may be
executed with a VPP voltage of 5V. Due to process
technology advances, 5V VPP is optimal for application
and production programming. For backward compat-
ibility with SmartVoltage technology, 12V VPP is sup-
ported for a maximum of 100 cycles and may be
connected for up to 100 cumulative hours. However,
no performance increase is realized. For any operation,
VCC is at 5V.
THIRTY-TWO INDEPENDENTLY ERASABLE
MEMORY BLOCKS
The MT28F016S5 is organized into 32 indepen-
dently erasable memory blocks that allow portions of
the memory to be erased without affecting the rest of
the memory data.
INTERNAL STATE MACHINE (ISM)
BLOCK ERASE and WRITE timing are simplified
with an ISM that controls all erase and write algorithms
in the memory array. The ISM ensures protection against
over-erasure and optimizes write margin to each cell.
During WRITE operations, the ISM automatically
increments and monitors WRITE attempts, verifies write
margin on each memory cell and updates the ISM status
register. When a BLOCK ERASE is performed, the ISM
automatically overwrites the entire addressed block
(eliminates overerasure), increments and monitors
ERASE attempts, and sets bits in the ISM status register.
ISM STATUS REGISTER
The ISM status register allows an external processor
to monitor the status of the ISM during WRITE and
ERASE operations. Two bits of the 8-bit status register
are set and cleared entirely by the ISM. These two bits
indicate whether the ISM is busy with an ERASE or
WRITE task and when an ERASE has been suspended.
Additional error information is set in three other bits:
VPP status, erase status and write status. These three bits
must be cleared by the host system.
READY/BUSY# (RY/BY#) OUTPUT
In addition to status register polling, the MT28F016S5
provides an asynchronous RY/BY# output to indicate
the status of the ISM. RY/BY# is VOH when the state
machine is inactive and VOL during a WRITE or ERASE
operation. This output is always active.
COMMAND EXECUTION LOGIC (CEL)
The CEL receives and interprets commands to the
device. These commands control the operation of the
ISM and the read path (i.e., memory array, device
configuration or status register). Commands may be
issued to the CEL while the ISM is active. However,
there are restrictions on what commands are allowed in
this condition. See the Command Execution section for
more detail.
DEEP POWER-DOWN MODE
To allow for maximum power conservation, the
MT28F016S5 features a very low current, deep power-
down mode. To enter this mode, the RP# pin is taken to
VSS ±0.2V. In this mode, the current draw is a maximum
of 10µA. Entering deep power-down also clears the
status register and sets the ISM to the read array mode.
6
2 Meg x 8 Smart 5 Even-Sectored Flash Memory Micron Technology, Inc., reserves the right to change products or specifications without notice.
F42.p65 – Rev. 1/00 ©2000, Micron Technology, Inc.
ADVANCE
2 MEG x 8
SMART 5 EVEN-SECTORED FLASH MEMORY
MEMORY ARCHITECTURE
The MT28F016S5 memory array architecture is de-
signed to allow sectors to be erased without disturbing
the rest of the array. The array is divided into 32
addressable blocks that are independently erasable.
When blocks rather than the entire array are erased, the
total device endurance is enhanced, as is system flex-
ibility. Only the ERASE functions are block-oriented.
All READ and WRITE operations are done on a random-
access basis. Figure 1 illustrates the memory address
map.
OUTPUT (READ) OPERATIONS
The MT28F016S5 features three different types of
READs. Depending on the current mode of the device,
a READ operation will produce data from the memory
array, status register or one of the device configuration
registers. In each of these three cases, the WE#, CE# and
OE# inputs are controlled in a similar manner. Moving
between modes to perform a specific READ will be
covered in the Command Execution section.
MEMORY ARRAY
To read the memory array, WE# must be HIGH, and
OE# and CE# must be LOW. Valid data will be output
on the DQ pins once these conditions have been met
and a valid address is given. Valid data will remain on
the DQ pins until the address changes, or until OE# or
CE# goes HIGH, whichever occurs first. The DQ pins
will continue to output new data after each address
transition as long as OE# and CE# remain LOW.
After power-up or RESET, the device will automati-
cally be in the array read mode. All commands and their
operations are covered in the Command Set and Com-
mand Execution sections.
STATUS REGISTER
Performing a READ of the status register requires the
same input sequencing as a READ of the array except
that the address inputs are “Don’t Care.” Data from the
status register is latched on the falling edge of OE# or
CE#, whichever occurs last. If the contents of the status
register change during a READ of the status register,
either OE# or CE# may be toggled while the other is
held LOW to update the output.
Following a WRITE or ERASE operation, the device
automatically enters the status register read mode. In
addition, a READ during a WRITE or ERASE operation
will produce the status register contents on DQ0-DQ7.
When the device is in ERASE SUSPEND mode, a READ
operation will produce the status register contents until
another command is issued. While the device is in
certain other modes, READ STATUS REGISTER may be
given to return to the status register read mode. All
commands and their operations are covered in the
Command Set and Command Execution sections.
DEVICE CONFIGURATION REGISTERS
Reading any of the device configuration registers
requires the same input sequencing as reading the
status register except that specific addresses must be
issued. WE# must be HIGH, and OE# and CE# must be
LOW. To read the manufacturer compatibility ID, ad-
dresses must be at 000000H, and to read the device ID,
addresses must be at 000001H.
While the device is in certain other modes, READ
DEVICE CONFIGURATION may be given to return to
the configuration registers read mode. All commands
and their operations are covered in the Command Set
and Command Execution sections.
Figure 1
Memory Address Map
31
0
64KB
16Mb
64KB
64KB
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