Characteristics subject to change without notice

Doc. No. 1115, Rev. C

CAT24C01/02/04/08/16

1-Kb, 2-Kb, 4-Kb, 8-Kb and 16-Kb CMOS Serial EEPROM

PIN CONFIGURATION FUNCTIONAL SYMBOL

FEATURES

■ Supports Standard and Fast I

C Protocol

■ 1.8 V to 5.5 V Supply Voltage Range

■ 16-Byte Page Write Buffer

■ Hardware Write Protection for entire memory

■ Schmitt Triggers and Noise Suppression Filters

on I

C Bus Inputs (SCL and SDA).

■ Low power CMOS technology

■ 1,000,000 program/erase cycles

■ 100 year data retention

■ Industrial temperature range

■ RoHS-compliant 8-lead PDIP, SOIC, MSOP

and TSSOP, 8-pad TDFN and 5-lead TSOT-23

packages.

PDIP (L)

SOIC (W)

TSSOP (Y)

MSOP (Z)

TDFN (VP2)

SCL

CAT24Cxx

, A

DEVICE DESCRIPTION

The CAT24C01/02/04/08/16 are 1-Kb, 2-Kb, 4-Kb,

8-Kb and 16-Kb respectively CMOS Serial EEPROM

devices organized internally as 8/16/32/64 and 128

pages respectively of 16 bytes each. All devices support

both the Standard (100 kHz) as well as Fast (400 kHz)

C protocol.

Data is written by providing a starting address, then

loading 1 to 16 contiguous bytes into a Page Write

Buffer, and then writing all data to non-volatile memory

in one internal write cycle. Data is read by providing a

starting address and then shifting out data serially while

automatically incrementing the internal address count.

External address pins make it possible to address

up to eight CAT24C01 or CAT24C02, four CAT24C04,

two CAT24C08 and one CAT24C16 device on the

same bus.

SCL

SDA

NC / A

/ A

2 /

NC / NC / NC / A

0 /

CAT24C16 / 08 / 04 / 02

NC / NC / A

/ A

1 /

For the location of Pin 1, please consult the corresponding package drawing.

PIN FUNCTIONS

, A

Device Address Inputs

SDA Serial Data Input/Output

SCL Serial Clock Input

WP Write Protect Input

Power Supply

Ground

NC No Connect

* Catalyst carries the I

C protocol under a license from the Philips Corporation.

TSOT-23 (TD)

SCL

SDA

For Ordering Information details, see page 16.

CAT24C01/02/04/08/16

Doc. No. 1115, Rev. C

Characteristics subject to change without notice

ABSOLUTE MAXIMUM RATINGS

(1)

Storage Temperature -65°C to +150°C

Voltage on Any Pin with Respect to Ground

(2)

-0.5 V to +6.5 V

RELIABILITY CHARACTERISTICS

(3)

Symbol Parameter Min Units

END

(4)

Endurance 1,000,000 Program/ Erase Cycles

Data Retention 100 Years

D.C. OPERATING CHARACTERISTICS

= 1.8 V to 5.5 V, T

= -40°C to 85°C, unless otherwise speciﬁed.

Symbol Parameter Test Conditions Min Max Units

CCR

Read Current Read, f

SCL

= 400 kHz 1 mA

CCW

Write Current Write, f

SCL

= 400 kHz 1 mA

Standby Current

All I/O Pins at GND or V

μA

I/O Pin Leakage

Pin at GND or V

1 μA

Input Low Voltage -0.5 V

x 0.3 V

Input High Voltage V

x 0.7 V

+ 0.5 V

OL1

Output Low Voltage

≥ 2.5 V, I

= 3.0 mA

0.4 V

OL2

Output Low Voltage V

< 2.5 V, I

= 1.0 mA 0.2 V

PIN IMPEDANCE CHARACTERISTICS

= 1.8 V to 5.5 V, T

= -40°C to 85°C, unless otherwise speciﬁed.

Symbol Parameter Conditions Max Units

(3)

SDA I/O Pin Capacitance V

= 0 V 8 pF

(3)

Input Capacitance (other pins) V

= 0 V 6 pF

(5)

WP Input Current

< V

IH,

= 5.5 V 200

μA

< V

IH,

= 3.3 V 150

< V

IH,

= 1.8 V 100

> V

Note:

(1) Stresses above those listed under “Absolute Maximum Ratings” may cause permanent damage to the device. These are stress ratings

only, and functional operation of the device at these or any other conditions outside of those listed in the operational sections of this speci

ﬁcation is not implied. Exposure to any absolute maximum rating for extended periods may affect device performance and reliability.

(2) The DC input voltage on any pin should not be lower than -0.5 V or higher than V

+ 0.5 V. During transitions, the voltage on any pin may

undershoot to no less than -1.5 V or overshoot to no more than V

+ 1.5 V, for periods of less than 20 ns.

(3) These parameters are tested initially and after a design or process change that affects the parameter according to appropriate AEC-Q100

and JEDEC test methods.

(4) Page Mode, V

= 5 V, 25°C

(5) When not driven, the WP pin is pulled down to GND internally. For improved noise immunity, the internal pull-down is relatively strong;

therefore the external driver must be able to supply the pull-down current when attempting to drive the input HIGH. To conserve power,

as the input level exceeds the trip point of the CMOS input buffer (~ 0.5 x V

), the strong pull-down reverts to a weak current source.

CAT24C01/02/04/08/16

Doc No. 1115, Rev. C

Characteristics subject to change without notice

A.C. CHARACTERISTICS

(1)

= 1.8 V to 5.5 V, T

= -40°C to 85°C.

Symbol Parameter

Standard Fast

UnitsMin Max Min Max

SCL

Clock Frequency 100 400 kHz

HD:STA

START Condition Hold Time 4 0.6 μs

LOW

Low Period of SCL Clock 4.7 1.3 μs

HIGH

High Period of SCL Clock 4 0.6 μs

SU:STA

START Condition Setup Time 4.7 0.6 μs

HD:DAT

Data In Hold Time 0 0 μs

SU:DAT

Data In Setup Time 250 100 ns

SDA and SCL Rise Time 1000 300 ns

(2)

SDA and SCL Fall Time 300 300 ns

SU:STO

STOP Condition Setup Time 4 0.6 μs

BUF

Bus Free Time Between STOP and START 4.7 1.3 μs

SCL Low to Data Out Valid 3.5 0.9 μs

Data Out Hold Time 100 100 ns

(2)

Noise Pulse Filtered at SCL and SDA Inputs 100 100 ns

SU:WP

WP Setup Time 0 0 μs

HD:WP

WP Hold Time 2.5 2.5 μs

Write Cycle Time 5 5

(2, 3)

Power-up to Ready Mode 1 1

Note:

(1) Test conditions according to “A.C. Test Conditions” table.

(2) Tested initially and after a design or process change that affects this parameter.

(3) t

is the delay between the time V

is stable and the device is ready to accept commands.

A.C. TEST CONDITIONS

Input Levels 0.2 x V

to 0.8 x V

Input Rise and Fall Times

≤ 50 ns

Input Reference Levels 0.3 x V

, 0.7 x V

Output Reference Levels 0.5 x V

Output Load

Current Source: I

= 3 mA (V

≥ 2.5 V); I

= 1 mA (V

< 2.5 V); C

= 100 pF

Part #	CAT24C08YI-GT3
Description	8KB I2C SER EEPROM
Category	IC
Availability	In Stock
Qty	6

CAT24C08YI-GT3

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