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ADG408BR

Part # ADG408BR
Description ANLG MUX SGL 8:1 22V/32V 16SOIC N - Rail/Tube
Category IC
Availability Out of Stock
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Technical Document


DISCLAIMER: The information provided herein is solely for informational purposes. Customers must be aware of the suitability of this product for their application, and consider that variable factors such as Manufacturer, Product Category, Date Codes, Pictures and Descriptions may differ from available inventory.

REV. A
Information furnished by Analog Devices is believed to be accurate and
reliable. However, no responsibility is assumed by Analog Devices for its
use, nor for any infringements of patents or other rights of third parties
which may result from its use. No license is granted by implication or
otherwise under any patent or patent rights of Analog Devices.
a
LC
2
MOS 4-/8-Channel
High Performance Analog Multiplexers
ADG408/ADG409
FEATURES
44 V Supply Maximum Ratings
V
SS
to V
DD
Analog Signal Range
Low On Resistance (100 V max)
Low Power (I
SUPPLY
< 75 mA)
Fast Switching
Break-Before-Make Switching Action
Plug-in Replacement for DG408/DG409
APPLICATIONS
Audio and Video Routing
Automatic Test Equipment
Data Acquisition Systems
Battery Powered Systems
Sample and Hold Systems
Communication Systems
GENERAL DESCRIPTION
The ADG408 and ADG409 are monolithic CMOS analog
multiplexers comprising eight single channels and four differen-
tial channels respectively. The ADG408 switches one of eight
inputs to a common output as determined by the 3-bit binary
address lines A0, A1 and A2. The ADG409 switches one of four
differential inputs to a common differential output as deter-
mined by the 2-bit binary address lines A0 and A1. An EN
input on both devices is used to enable or disable the device.
When disabled, all channels are switched OFF.
The ADG408/ADG409 are designed on an enhanced LC
2
MOS
process which provides low power dissipation yet gives high
switching speed and low on resistance. Each channel conducts
equally well in both directions when ON and has an input signal
range that extends to the supplies. In the OFF condition, signal
levels up to the supplies are blocked. All channels exhibit break-
before-make switching action, preventing momentary shorting
when switching channels. Inherent in the design is low charge
injection for minimum transients when switching the digital
inputs.
The ADG408/ADG409 are improved replacements for the
DG408/DG409 Analog Multiplexers.
PRODUCT HIGHLIGHTS
1. Extended Signal Range
The ADG408/ADG409 are fabricated on an enhanced
LC
2
MOS process giving an increased signal range that
extends to the supply rails.
2. Low Power Dissipation
3 Low R
ON
4. Single Supply Operation
For applications where the analog signal is unipolar, the
ADG408/ADG409 can be operated from a single rail power
supply. The parts are fully specified with a single +12 V
power supply and will remain functional with single supplies
as low as +5 V.
FUNCTIONAL BLOCK DIAGRAMS
ADG408
1 OF 8
DECODER
S1
S8
D
A0 A1 A2 EN
ADG409
1 OF 4
DECODER
S1A
S4B
DA
A0 A1 EN
DB
S4A
S1B
One Technology Way, P.O. Box 9106, Norwood, MA 02062-9106, U.S.A.
Tel: 781/329-4700 World Wide Web Site: http://www.analog.com
Fax: 781/326-8703 © Analog Devices, Inc., 1998
ADG408/ADG409–SPECIFICATIONS
DUAL SUPPLY
1
B Version T Version
–408C to –558C to
Parameter +258C +858C +258C +1258C Units Test Conditions/Comments
ANALOG SWITCH
Analog Signal Range V
SS
to V
DD
V
SS
to V
DD
V
R
ON
40 40 typ V
D
= ±10 V, I
S
= –10 mA
100 125 100 125 max
R
ON
15 15 max V
D
= +10 V, –10 V
LEAKAGE CURRENTS
Source OFF Leakage I
S
(OFF) ±0.5 ±50 ±0.5 ±50 nA max V
D
= ±10 V, V
S
= 710 V;
Test Circuit 2
Drain OFF Leakage I
D
(OFF) V
D
= ±10 V; V
S
= 710 V;
ADG408 ±1 ±100 ±1 ±100 nA max Test Circuit 3
ADG409 ±1 ±50 ±1 ±50 nA max
Channel ON Leakage I
D
, I
S
(ON) V
S
= V
D
= ±10 V;
ADG408 ±1 ±100 ±1 ±100 nA max Test Circuit 4
ADG409 ±1 ±50 ±1 ±50 nA max
DIGITAL INPUTS
Input High Voltage, V
INH
2.4 2.4 V min
Input Low Voltage, V
INL
0.8 0.8 V max
Input Current
I
INL
or I
INH
±10 ±10 µA max V
IN
= 0 or V
DD
C
IN
, Digital Input Capacitance 8 8 pF typ f = 1 MHz
DYNAMIC CHARACTERISTICS
2
t
TRANSITION
120 120 ns typ R
L
= 300 , C
L
= 35 pF;
250 250 ns max V
S1
= ±10 V, V
SS
= 710 V;
Test Circuit 5
t
OPEN
10 10 10 10 ns min R
L
= 300 , C
L
= 35 pF;
V
S
= +5 V; Test Circuit 6
t
ON
(EN) 85 125 85 125 ns typ R
L
= 300 , C
L
= 35 pF;
150 225 150 225 ns max V
S
= +5 V; Test Circuit 7
t
OFF
(EN) 65 65 ns typ R
L
= 300 , C
L
= 35 pF;
150 150 ns max V
S
= +5 V; Test Circuit 7
Charge Injection 20 20 pC typ V
S
= 0 V, R
S
= 0 , C
L
= 10 nF;
Test Circuit 8
OFF Isolation –75 –75 dB typ R
L
= 1 k, f = 100 kHz;
V
EN
= 0 V; Test Circuit 9
Channel-to-Channel Crosstalk 85 85 dB typ R
L
= 1 k, f = 100 kHz;
Test Circuit 10
C
S
(OFF) 11 11 pF typ f = 1 MHz
C
D
(OFF) f = 1 MHz
ADG408 40 40 pF typ
ADG409 20 20 pF typ
C
D
, C
S
(ON) f = 1 MHz
ADG408 54 54 pF typ
ADG409 34 34 pF typ
POWER REQUIREMENTS
I
DD
11µA typ V
IN
= 0 V, V
EN
= 0 V
55µA max
I
SS
11µA typ
55µA max
I
DD
100 100 µA typ V
IN
= 0 V, V
EN
= 2.4 V
200 500 200 500 µA max
NOTES
1
Temperature ranges are as follows: B Version: –40°C to +85°C; T Version: –55°C to +125°C.
2
Guaranteed by design, not subject to production test.
Specifications subject to change without notice.
REV. A
–2–
(V
DD
= +15 V, V
SS
= –15 V, GND = 0 V, unless otherwise noted)
–3–
REV. A
ADG408/ADG409
SINGLE SUPPLY
1
B Version T Version
–408C to –558C to
Parameter +258C +858C +258C +1258C Units Test Conditions/Comments
ANALOG SWITCH
Analog Signal Range 0 to V
DD
0 to V
DD
V
R
ON
90 90 typ V
D
= +3 V, +10 V, I
S
= –1 mA
LEAKAGE CURRENTS
Source OFF Leakage I
S
(OFF) ±0.5 ±50 ±0.5 ±50 nA max V
D
=8 V/0 V, V
S
= 0 V/8 V;
Test Circuit 2
Drain OFF Leakage I
D
(OFF) V
D
=8 V/0 V, V
S
= 0 V/8 V;
ADG408 ±1 ±100 ±1 ±100 nA max Test Circuit 3
ADG409 ±1 ±50 ±1 ±50 nA max
Channel ON Leakage I
D
, I
S
(ON) V
S
= V
D
= 8 V/0 V;
ADG408 ±1 ±100 ±1 ±100 nA max Test Circuit 4
ADG409 ±1 ±50 ±1 ±50 nA max
DIGITAL INPUTS
Input High Voltage, V
INH
2.4 2.4 V min
Input Low Voltage, V
INL
0.8 0.8 V max
Input Current
I
INL
or I
INH
±10 ±10 µA max V
IN
= 0 or V
DD
C
IN
, Digital Input Capacitance 8 8 pF typ f = 1 MHz
DYNAMIC CHARACTERISTICS
2
t
TRANSITION
130 130 ns typ R
L
= 300 , C
L
= 35 pF;
V
S1
= 8 V/0 V, V
S8
= 0 V/8 V;
Test Circuit 5
t
OPEN
10 10 ns typ R
L
= 300 , C
L
= 35 pF;
V
S
= +5 V; Test Circuit 6
t
ON
(EN) 140 140 ns typ R
L
= 300 , C
L
= 35 pF;
V
S
= +5 V; Test Circuit 7
t
OFF
(EN) 60 60 ns typ R
L
= 300 , C
L
= 35 pF;
V
S
= +5 V; Test Circuit 7
Charge Injection 5 5 pC typ V
S
= 0 V, R
S
= 0 , C
L
= 10 nF;
Test Circuit 8
OFF Isolation –75 –75 dB typ R
L
= 1 k, f = 100 kHz;
V
EN
= 0 V; Test Circuit 9
Channel-to-Channel Crosstalk 85 85 dB typ R
L
= 1 k, f = 100 kHz;
Test Circuit 10
C
S
(OFF) 11 11 pF typ f = 1 MHz
C
D
(OFF) f = 1 MHz
ADG408 40 40 pF typ
ADG409 20 20 pF typ
C
D
, C
S
(ON) f = 1 MHz
ADG408 54 54 pF typ
ADG409 34 34 pF typ
POWER REQUIREMENTS
I
DD
11µA typ V
IN
= 0 V, V
EN
= 0 V
55µA max
I
DD
100 100 µA typ V
IN
= 0 V, V
EN
= 2.4 V
200 500 200 500 µA max
NOTES
1
Temperature ranges are as follows: B Version: –40°C to +85°C; T Version: –55°C to +125°C.
2
Guaranteed by design, not subject to production test.
Specifications subject to change without notice.
(V
DD
= +12 V, V
SS
= 0 V, GND = 0 V, unless otherwise noted)
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