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ADG406BN

Part # ADG406BN
Description Analog Multiplexer Single 16:1 28-Pin PDIP W Tube
Category IC
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Technical Document


DISCLAIMER: The information provided herein is solely for informational purposes. Customers must be aware of the suitability of this product for their application, and consider that variable factors such as Manufacturer, Product Category, Date Codes, Pictures and Descriptions may differ from available inventory.

One Technology Way, P.O. Box 9106, Norwood. MA 02062-9106, U.S.A.
Tel: 617/329-4700 Fax: 617/326-8703
a
FUNCTIONAL BLOCK DIAGRAMS
REV. 0
Information furnished by Analog Devices is believed to be accurate and
reliable. However, no responsibility is assumed by Analog Devices for its
use, nor for any infringements of patents or other rights of third parties
which may result from its use. No license is granted by implication or
otherwise under any patent or patent rights of Analog Devices.
FEATURES
44 V Supply Maximum Ratings
V
SS
to V
DD
Analog Signal Range
Low On Resistance (80 max)
Low Power
Fast Switching
t
ON
< 160 ns
t
OFF
< 150 ns
Break Before Make Switching Action
Plug-In Upgrade for
DG506A/ADG506A, DG507A/ADG507A,
DG526/ADG526A
ADG406/ADG407 are Plug-In Replacements for
DG406/DG407
APPLICATIONS
Audio and Video Routing
Automatic Test Equipment
Data Acquisition Systems
Battery Powered Systems
Sample Hold Systems
Communication Systems
Avionics
LC
2
MOS 8-/16-Channel
High Performance Analog Multiplexers
ADG406/ADG407/ADG426
ADG407
ENA0 A1 A2
S1A
S8A
DA
S8B
DB
S1B
1 OF 8
DECODER
ENA0 A1 A2 A3 RS
ADG426
S1
S16
D
WR
DECODER/
LATCHES
ADG406
ENA0 A1 A2 A3
S1
S16
D
1 OF 16
DECODER
GENERAL DESCRIPTION
The ADG406, ADG407 and ADG426 are monolithic CMOS
analog multiplexers. The ADG406 and ADG426 switch one of
sixteen inputs to a common output as determined by the 4-bit
binary address lines A0, A1, A2 and A3. The ADG426 has on-
chip address and control latches that facilitate microprocessor
interfacing. The ADG407 switches one of eight differential
inputs to a common differential output as determined by the 3-
bit binary address lines A0, A1 and A2. An EN input on all
devices is used to enable or disable the device. When disabled,
all channels are switched OFF.
The ADG406/ADG407/ADG426 are designed on an enhanced
LC
2
MOS process that provides low power dissipation yet gives
high switching speed and low on resistance. These features
make the parts suitable for high speed data acquisition systems
and audio signal switching. Low power dissipation makes the
parts suitable for battery powered systems. Each channel
conducts equally well in both directions when ON and has an
input signal range which extends to the supplies. In the OFF
condition, signal levels up to the supplies are blocked. All
channels exhibit break before make switching action preventing
momentary shorting when switching channels. Inherent in the
design is low charge injection for minimum transients when
switching the digital inputs.
PRODUCT HIGHLIGHTS
1. Extended Signal Range
The ADG406/ADG407/ADG426 are fabricated on an
enhanced LC
2
MOS process giving an increased signal range
which extends to the supply rails
2. Low Power Dissipation
3. Low R
ON
4. Single/Dual Supply Operation
5. Single Supply Operation
For applications where the analog signal is unipolar, the
ADG406/ADG407/ADG426 can be operated from a single
rail power supply. The parts are fully specified with a single
+12 V power supply and will remain functional with single
supplies as low as +5 V.
B Version T Version
–40°C to –55°C to
Parameter +25°C +85°C +25°C +125°C Units Test Conditions/Comments
ANALOG SWITCH
Analog Signal Range V
SS
to V
DD
V
SS
to V
DD
V
R
ON
50 50 typ V
D
= ±10 V, I
S
= –1 mA
80 125 80 125 max V
DD
= +13.5 V, V
SS
= –13.5 V
R
ON
Match 4 4 typ V
D
= 0 V, I
S
= –1 mA
LEAKAGE CURRENTS V
DD
= +16.5 V, V
SS
= –16.5 V
Source OFF Leakage I
S
(OFF) ±0.5 ±20 ±0.5 ± 50 nA max V
D
= ±10 V, V
S
= 710 V, Test Circuit 2
Drain OFF Leakage I
D
(OFF) V
D
= ±10 V, V
S
= 710 V;
ADG406, ADG426 ±1 ±20 ±1 ±200 nA max Test Circuit 3
ADG407 ±1 ±20 ±1 ±100 nA max
Channel ON Leakage I
D
, I
S
(ON) V
S
= V
D
= ±10 V;
ADG406, ADG426 ±1 ±20 ±1 ±200 nA max Test Circuit 4
ADG407 ±1 ±20 ±1 ±100 nA max
DIGITAL INPUTS
Input High Voltage, V
INH
2.4 2.4 V min
Input Low Voltage, V
INL
0.8 0.8 V max
Input Current
I
INL
or I
INH
±1 ±1 µA max V
IN
= 0 or V
DD
C
IN
, Digital Input Capacitance 8 8 pF typ f = 1 MHz
DYNAMIC CHARACTERISTICS
2
t
TRANSITION
120 120 ns typ R
L
= 300 , C
L
= 35 pF;
150 250 150 250 ns max V
1
= ±10 V, V
2
= 710 V;
Test Circuit 5
Break Before Make Delay, t
OPEN
10 10 10 10 ns min R
L
= 300 , C
L
= 35 pF;
V
S
= +5 V, Test Circuit 6
t
ON
(EN, WR) 120 175 120 175 ns typ R
L
= 300 , C
L
= 35 pF;
160 225 160 225 ns max V
S
= +5 V, Test Circuit 7
t
OFF
(EN, RS) 110 130 110 130 ns typ R
L
= 300 , C
L
= 35 pF;
150 180 150 180 ns max V
S
= +5 V, Test Circuit 7
ADG426 Only
t
W
, Write Pulse Width 100 100 ns min
t
S
, Address, Enable Setup Time 100 100 ns min
t
H
, Address, Enable Hold Time 10 10 ns min
t
RS
, Reset Pulse Width 100 100 ns min V
S
= +5 V
Charge Injection 8 8 pC typ V
S
= 0 V, R
S
= 0 , C
L
= 1 nF;
Test Circuit 10
OFF Isolation –75 –75 dB typ R
L
= 1 k, f = 100 kHz;
V
EN
= 0 V, Test Circuit 11
Channel-to-Channel Crosstalk 85 85 dB typ R
L
= 1 k, f = 100 kHz, Test Circuit 12
C
S
(OFF) 5 5 pF typ f = 1 MHz
C
D
(OFF) f = 1 MHz
ADG406, ADG426 50 50 pF typ
ADG407 25 25 pF typ
C
D
, C
S
(ON) f = 1 MHz
ADG406, ADG426 60 60 pF typ
ADG407 40 40 pF typ
POWER REQUIREMENTS V
DD
= +16.5 V, V
SS
= –16.5 V
I
DD
11µA typ V
IN
= 0 V, V
EN
= 0 V
55µA max
I
SS
11µA typ
55µA max
I
DD
100 100 µA typ V
IN
= 0 V, V
EN
= 2.4 V
200 500 200 500 µA max
I
SS
11µA typ
55µA max
N
OTES
1
Temperature ranges are as follows: B Versions: –40°C to +85°C; T Versions: –55°C to +125°C.
2
Guaranteed by design, not subject to production test.
Specifications subject to change without notice.
ADG406/ADG407/ADG426–SPECIFICATIONS
1
DUAL SUPPLY
–2–
REV. 0
(V
DD
= +15 V ± 10%, V
SS
= –15 V ± 10%, GND = 0 V, unless otherwise noted)
REV. 0
–3–
ADG406/ADG407/ADG426
SINGLE SUPPLY
(V
DD
= +12 V ± 10%, V
SS
= 0 V, GND = 0 V, unless otherwise noted)
B Version T Version
–40°C to –55°C to
Parameter +25°C +85°C +25°C +125°C Units Test Conditions/Comments
ANALOG SWITCH
Analog Signal Range 0 to V
DD
0 to V
DD
V
R
ON
90 90 typ V
D
= +3 V, +8.5 V, I
S
= –1 mA;
125 200 125 200 max V
DD
= +10.8 V
LEAKAGE CURRENTS V
DD
= +13.2 V
Source OFF Leakage I
S
(OFF) ±0.5 ± 20 ±0.5 ±50 nA max V
D
= 8 V/0.1 V, V
S
= 0.1 V/8 V;
Test Circuit 2
Drain OFF Leakage I
D
(OFF) V
D
= 8 V/0.1 V, V
S
= 0.1 V/8 V;
ADG406, ADG426 ±1 ±20 ±1 ±200 nA max Test Circuit 3
ADG407 ±1 ±20 ±1 ±100 nA max
Channel ON Leakage I
D
, I
S
(ON) V
S
= V
D
= 8 V/0.1 V, Test Circuit 4
ADG406, ADG426 ±1 ±20 ±1 ±200 nA max
ADG407 ±1 ±20 ±1 ±100 nA max
DIGITAL INPUTS
Input High Voltage, V
INH
2.4 2.4 V min
Input Low Voltage, V
INL
0.8 0.8 V max
Input Current
I
INL
or I
INH
±1 ±1 µA max V
IN
= 0 or V
DD
C
IN
, Digital Input Capacitance 8 8 pF typ f = 1 MHz
DYNAMIC CHARACTERISTICS
2
t
TRANSITION
180 180 ns typ R
L
= 300 , C
L
= 35 pF;
220 350 220 350 ns max V
1
= 8 V/0 V, V
2
= 0 V/8 V;
Test Circuit 5
Break Before Make Delay, t
OPEN
10 10 ns typ R
L
= 300 , C
L
= 35 pF;
V
S
= +5 V, Test Circuit 6
t
ON
(EN, WR) 180 180 ns typ R
L
= 300 , C
L
= 35 pF;
240 350 240 350 ns max V
S
= +5 V, Test Circuit 7
t
OFF
(EN, RS) 135 135 ns typ R
L
= 300 , C
L
= 35 pF;
180 220 180 220 ns max V
S
= +5 V, Test Circuit 7
ADG426 Only
t
W
, Write Pulse Width 100 100 ns min
t
S
, Address, Enable Setup Time 100 100 ns min
t
H
, Address, Enable Hold Time 10 10 ns min
t
RS
, Reset Pulse Width 100 100 ns min V
S
= +5 V
Charge Injection 5 5 pC typ V
S
= 6 V, R
S
= 0 , C
L
= 1 nF;
Test Circuit 10
OFF Isolation –75 –75 dB typ R
L
= 1 k, f = 100 kHz;
Test Circuit 11
Channel-to-Channel Crosstalk 85 85 dB typ R
L
= 1 k, f = 100 kHz;
Test Circuit 12
C
S
(OFF) 8 8 pF typ f = 1 MHz
C
D
(OFF) f = 1 MHz
ADG406, ADG426 80 80 pF typ
ADG407 40 40 pF typ
C
D
, C
S
(ON) f = 1 MHz
ADG406, ADG426 100 100 pF typ
ADG407 50 50 pF typ
POWER REQUIREMENTS V
DD
= +13.2 V
I
DD
11µA typ V
IN
= 0 V, V
EN
= 0 V
55µA max
I
DD
100 100 µA typ V
IN
= 0 V, V
EN
= 2.4 V
200 500 200 500 µA max
NOTES
1
Temperature ranges are as follows: B Versions: –40°C to +85°C; T Versions: –55°C to +125°C.
2
Guaranteed by design, not subject to production test.
Specifications subject to change without notice.
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