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74LVQ74SC

Part # 74LVQ74SC
Description IC D-TYPE POS TRG DUAL 14SOIC
Category IC
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Fairchild Semiconductor
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Technical Document


DISCLAIMER: The information provided herein is solely for informational purposes. Customers must be aware of the suitability of this product for their application, and consider that variable factors such as Manufacturer, Product Category, Date Codes, Pictures and Descriptions may differ from available inventory.

74LVQ74
Low Voltage Dual D-Type Positive Edge-Triggered
Flip-Flop
General Description
The LVQ74 is a dual D-type flip-flop with Asynchronous
Clear and Set inputs and complementary (Q, Q) outputs. In-
formation at the input is transferred to the outputs on the
positive edge of the clock pulse. Clock triggering occurs at a
voltage level of the clock pulse and is not directly related to
the transition time of the positive-going pulse. After the Clock
Pulse input threshold voltage has been passed, the Data in-
put is locked out and information present will not be trans-
ferred to the outputs until the next rising edge of the Clock
Pulse input.
Asynchronous Inputs:
LOW input to S
D
(Set) sets Q to HIGH level
LOW input to C
D
(Clear) sets Q to LOW level
Clear and Set are independent of clock
Simultaneous LOW on C
D
and S
D
makes both Q and Q
HIGH
Features
n Ideal for low power/low noise 3.3V applications
n Guaranteed simultaneous switching noise level and
dynamic threshold performance
n Guaranteed pin-to-pin skew AC performance
n Guaranteed incident wave switching into 75
Ordering Code:
Order Number Package Number Package Description
74LVQ74SC M14A 14-Lead (0.150" Wide) Molded Small Outline Integrated Circuit, SOIC JEDEC
74LVQ74SJ M14D 14-Lead Molded Small Outline Package, SOIC EIAJ
Devices also available in Tape and Reel. Specify by appending the suffix letter “X” to the ordering code.
Logic Symbols
Connection Diagram
DS011347-1
DS011347-2
IEEE/IEC
DS011347-3
Pin Assignment
for SOIC JEDEC and EIAJ
DS011347-4
May 1998
74LVQ74 Low Voltage Dual D-Type Positive Edge-Triggered Flip-Flop
© 1998 Fairchild Semiconductor Corporation DS011347 www.fairchildsemi.com
Pin Descriptions
Pin Names Description
D
1
,D
2
Data Inputs
CP
1
,CP
2
Clock Pulse Inputs
C
D1
,C
D2
Direct Clear Inputs
S
D1
,S
D2
Direct Set Inputs
Q
1
,Q
1
,Q
2
,Q
2
Outputs
Truth Table
Inputs Outputs
S
D
C
D
CP D Q Q
LHXXHL
HLXXLH
LLXXHH
HH
N
HH L
HH
N
LL H
HHLXQ
0
Q
0
H
=
HIGH Voltage Level
L
=
LOW Voltage Level
X
=
Immaterial
N
=
LOW-to-HIGH Clock Transition
Q
0
(Q
0
)
=
Previous Q(Q) before LOW-to-HIGH Transition of Clock
Logic Diagram
DS011347-6
Please note that this diagram is provided only for the understanding of logic operations and should not be used to estimate propagation delays.
www.fairchildsemi.com 2
Absolute Maximum Ratings (Note 1)
Supply Voltage (V
CC
) −0.5V to +7.0V
DC Input Diode Current (I
IK
)
V
I
=
−0.5V −20 mA
V
I
=
V
CC
+ 0.5V +20 mA
DC Input Voltage (V
I
) −0.5V to V
CC
+ 0.5V
DC Output Diode Current (I
OK
)
V
O
=
−0.5V −20 mA
V
O
=
V
CC
+ 0.5V +20 mA
DC Output Voltage (V
O
) −0.5V to to V
CC
+ 0.5V
DC Output Source
or Sink Current (I
O
)
±
50 mA
DC V
CC
or Ground Current
(I
CC
or I
GND
)
±
200 mA
Storage Temperature (T
STG
) −65˚C to +150˚C
DC Latch-Up Source or
Sink Current
±
100 mA
Recommended Operating
Conditions
(Note 2)
Supply Voltage (V
CC
) 2.0V to 3.6V
Input Voltage (V
I
) 0VtoV
CC
Output Voltage (V
O
) 0VtoV
CC
Operating Temperature (T
A
) −40˚C to +85˚C
Minimum Input Edge Rate (V/t)
V
IN
from 0.8V to 2.0V
V
CC
@
3.0V 125 mV/ns
Note 1: The “Absolute Maximum Ratings” are those values beyond which
the safety of the device cannot be guaranteed. The device should not be op-
erated at these limits. The parametric values defined in the Electrical Charac-
teritics tables are not guaranteed at the absolute maximum ratings. The “Rec-
ommended Operating Conditions” table will define the conditions for actual
device operation.
Note 2: Unused inputs must be held HIGH or LOW. They may not float.
DC Electrical Characteristics
Symbol Parameter
V
CC
(V)
T
A
=
+25˚C T
A
=
−40˚C to +85˚C Units Conditions
Typ Guaranteed Limits
V
IH
Minimum High Level 3.0 1.5 2.0 2.0 V V
OUT
=
0.1V
or V
CC
0.1V
V
IL
Maximum Low Level
Input Voltage
3.0 1.5 0.8 0.8 V V
OUT
=
0.1V
or V
CC
0.1V
V
OH
Minimum High Level
Output Voltage
3.0 2.99 2.9 2.9 V I
OUT
=
−50 µA
3.0 2.58 2.48 V V
IN
=
V
IL
or V
IH
(Note 3)
I
OH
=
−12 mA
V
OL
Maximum Low Level
Output Voltage
3.0 0.002 0.1 0.1 V I
OUT
=
50 µA
3.0 0.36 0.44 V V
IN
=
V
IL
or V
IH
(Note 3)
I
OL
=
12 mA
I
IN
Maximum Input
Leakage Current
3.6
±
0.1
±
1.0 µA V
I
=
V
CC
, GND
I
OLD
Minimum Dynamic (Note 4)
Output Current
3.6 36 mA V
OLD
=
0.8V Max (Note 5)
I
OHD
3.6 −25 mA V
OHD
=
2.0V Min (Note 5)
I
CC
Maximum Quiescent
Supply Current
3.6 2.0 20.0 µA V
IN
=
V
CC
or GND
V
OLP
Quiet Output
Maximum Dynamic V
OL
3.3 0.2 0.8 V (Notes 6, 7)
V
OLV
Quiet Output
Minimum Dynamic V
OL
3.3 −0.2 −0.8 V (Notes 6, 7)
V
IHD
Maximum High Level
Dynamic Input Voltage
3.3 1.7 2.0 V (Notes 6, 8)
V
ILD
Maximum Low Level
Dynamic Input Voltage
3.3 1.6 0.8 V (Notes 6, 8)
Note 3: All outputs loaded; thresholds on input associated with output under test.
Note 4: Maximum test duration 2.0 ms, one output loaded at a time.
Note 5: Incident wave switching on transmission lines with impedances as low as 75 for commercial temperature range is guaranteed for 74LVQ.
Note 6: Worst case package.
Note 7: Max number of outputs defined as (n). Data inputs are driven 0V to 3.3V; one output at GND.
Note 8: Max number of Data Inputs (n) switching. (n 1) inputs switching 0V to 3.3V. Input-under-test switching: 3.3V to threshold (V
ILD
), 0V to threshold
(V
IHD
), f
=
1 MHz.
3 www.fairchildsemi.com
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