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IRF5210S

Part # IRF5210S
Description Trans MOSFET P-CH 100V 40A 3-Pin(2+Tab) D2PAK - Rail/Tube
Category IC
Availability Out of Stock
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1 + $1.56547



Technical Document


DISCLAIMER: The information provided herein is solely for informational purposes. Customers must be aware of the suitability of this product for their application, and consider that variable factors such as Manufacturer, Product Category, Date Codes, Pictures and Descriptions may differ from available inventory.

IRF5210S/L
HEXFET
®
Power MOSFET
PD - 91405C
l Advanced Process Technology
l Surface Mount (IRF5210S)
l Low-profile through-hole (IRF5210L)
l 175°C Operating Temperature
l Fast Switching
l P-Channel
l Fully Avalanche Rated
5/13/98
S
D
G
Absolute Maximum Ratings
Fifth Generation HEXFETs from International Rectifier utilize
advanced processing techniques to achieve extremely low
on-resistance per silicon area. This benefit, combined with
the fast switching speed and ruggedized device design that
HEXFET Power MOSFETs are well known for, provides the
designer with an extremely efficient and reliable device for
use in a wide variety of applications.
The D
2
Pak is a surface mount power package capable of
accommodating die sizes up to HEX-4. It provides the highest
power capability and the lowest possible on-resistance in
any existing surface mount package. The D
2
Pak is suitable
for high current applications because of its low internal
connection resistance and can dissipate up to 2.0W in a
typical surface mount application.
The through-hole version (IRF5210L) is available for low-
profile applications.
Description
V
DSS
= -100V
R
DS(on)
= 0.06
I
D
= -40A
2
D Pak
TO-262
Parameter Typ. Max. Units
R
θJC
Junction-to-Case ––– 0.75
R
θJA
Junction-to-Ambient ( PCB Mounted,steady-state)** 40
Thermal Resistance
°C/W
Parameter Max. Units
I
D
@ T
C
= 25°C Continuous Drain Current, V
GS
@ -10V -40
I
D
@ T
C
= 100°C Continuous Drain Current, V
GS
@ -10V -29 A
I
DM
Pulsed Drain Current  -140
P
D
@T
A
= 25°C Power Dissipation 3.8 W
P
D
@T
C
= 25°C Power Dissipation 200 W
Linear Derating Factor 1.3 W/°C
V
GS
Gate-to-Source Voltage ± 20 V
E
AS
Single Pulse Avalanche Energy 780 mJ
I
AR
Avalanche Current -21 A
E
AR
Repetitive Avalanche Energy 20 mJ
dv/dt Peak Diode Recovery dv/dt  -5.0 V/ns
T
J
Operating Junction and -55 to + 175
T
STG
Storage Temperature Range
Soldering Temperature, for 10 seconds 300 (1.6mm from case )
°C
IRF5210S/L
Starting T
J
= 25°C, L = 3.1mH
R
G
= 25, I
AS
= -21A. (See Figure 12)
Repetitive rating; pulse width limited by
max. junction temperature. ( See fig. 11 )
Notes:
** When mounted on 1" square PCB (FR-4 or G-10 Material ).
For recommended footprint and soldering techniques refer to application note #AN-994.
I
SD
-21A, di/dt -480A/µs, V
DD
V
(BR)DSS
,
T
J
175°C
Pulse width 300µs; duty cycle 2%.
Uses IRF5210 data and test conditions
Source-Drain Ratings and Characteristics
Parameter Min. Typ. Max. Units Conditions
V
(BR)DSS
Drain-to-Source Breakdown Voltage -100 –– –– V V
GS
= 0V, I
D
= -250µA
V
(BR)DSS
/T
J
Breakdown Voltage Temp. Coefficient –– -0.11 ––– V/°C Reference to 25°C, I
D
= -1mA
R
DS(on)
Static Drain-to-Source On-Resistance ––– ––– 0.06 V
GS
= -10V, I
D
= -24A
V
GS(th)
Gate Threshold Voltage -2.0 ––– -4.0 V V
DS
= V
GS
, I
D
= -250µA
g
fs
Forward Transconductance 10 ––– ––– S V
DS
= -50V, I
D
= -21A
––– ––– -25
µA
V
DS
= -100V, V
GS
= 0V
–– ––– -250 V
DS
= -80V, V
GS
= 0V, T
J
= 150°C
Gate-to-Source Forward Leakage ––– ––– 100 V
GS
= 20V
Gate-to-Source Reverse Leakage ––– ––– -100
nA
V
GS
= -20V
Q
g
Total Gate Charge –– ––– 180 I
D
= -21A
Q
gs
Gate-to-Source Charge ––– ––– 25 nC V
DS
= -80V
Q
gd
Gate-to-Drain ("Miller") Charge ––– ––– 97 V
GS
= -10V, See Fig. 6 and 13 
t
d(on)
Turn-On Delay Time ––– 17 –– V
DD
= -50V
t
r
Rise Time ––– 86 ––– I
D
= -21A
t
d(off)
Turn-Off Delay Time ––– 79 –– R
G
= 2.5
t
f
Fall Time –– 81 –– R
D
= 2.4Ω, See Fig. 10
Between lead,
––– –––
and center of die contact
C
iss
Input Capacitance ––– 2700 ––– V
GS
= 0V
C
oss
Output Capacitance ––– 790 ––– pF V
DS
= -25V
C
rss
Reverse Transfer Capacitance ––– 450 ––– ƒ = 1.0MHz, See Fig. 5
Electrical Characteristics @ T
J
= 25°C (unless otherwise specified)
I
GSS
ns
I
DSS
Drain-to-Source Leakage Current
nH
7.5
L
S
Internal Source Inductance
Parameter Min. Typ. Max. Units Conditions
I
S
Continuous Source Current MOSFET symbol
(Body Diode)
––– –––
showing the
I
SM
Pulsed Source Current integral reverse
(Body Diode)
––– –––
p-n junction diode.
V
SD
Diode Forward Voltage ––– ––– -1.6 V T
J
= 25°C, I
S
= -24A, V
GS
= 0V
t
rr
Reverse Recovery Time ––– 170 260 ns T
J
= 25°C, I
F
= -21A
Q
rr
Reverse Recovery Charge ––– 1.2 1.8 µC di/dt = -100A/µs

t
on
Forward Turn-On Time Intrinsic turn-on time is negligible (turn-on is dominated by L
S
+L
D
)
A
S
D
G
-40
-140
IRF5210S/L
Fig 4. Normalized On-Resistance
Vs. Temperature
Fig 2. Typical Output Characteristics
Fig 1. Typical Output Characteristics
Fig 3. Typical Transfer Characteristics
1
10
100
1000
0.1 1 10 100
D
DS
A
-I , Drain-to-Source Current (A)
-V , Drain-to-Source Voltage (V)
VGS
TOP - 15V
- 10V
- 8.0V
- 7.0V
- 6.0V
- 5.5V
- 5.0V
BOTTOM - 4.5V
-4.5V
40µs PULSE WIDTH
T = 2C
c
1
10
100
1000
0.1 1 10 100
D
DS
A
-I , Drain-to-Source Current (A)
-V , Drain-to-Source Volta
g
e
(
V
)
VGS
TOP - 15V
- 10V
- 8.0V
- 7.0V
- 6.0V
- 5.5V
- 5.0V
BOTTOM - 4.5V
-4.5V
40
µ
s PULSE WIDTH
T = 17C
C
1
10
100
1000
45678910
T = 25°C
J
GS
D
A
-I , Drain-to-Source Current (A)
-V , Gate-to-Source Volta
g
e (V)
T = 175°C
V = -50V
40µs PULSE WIDTH
DS
J
0.0
0.5
1.0
1.5
2.0
2.5
3.0
-60 -40 -20 0 20 40 60 80 100 120 140 160 180
J
T , Junction Temperature (°C)
R , Drain-to-Source On Resistance
DS(on)
(Norm alized)
A
V = -10V
GS
I = -35A
D
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