CY74FCT191T
2
Maximum Ratings
[3, 4]
(Above which the useful life may be impaired. For user guide-
lines, not tested.)
Storage Temperature .................................–65°C to +150°C
Ambient Temperature with
Power Applied............................................. –65°C to +135°C
Supply Voltage to Ground Potential............... –0.5V to +7.0V
DC Input Voltage ........................................... –0.5V to +7.0V
DC Output Voltage......................................... –0.5V to +7.0V
DC Output Current (Maximum Sink Current/Pin) ......120 mA
Power Dissipation..........................................................0.5W
Static Discharge Voltage............................................>2001V
(per MIL-STD-883, Method 3015)
Notes:
1. H = HIGH Voltage Level, L = LOW Voltage Level, X = Don‘t Care,
= LOW-to-HIGH clock transition. =Low Pulse.
2. TC is generated internally.
Mode Select
[1]
Inputs
PL CE U/D CP Mode
H
H
L
H
L
L
X
H
L
H
X
X
X
X
Count Up
Count Down
Preset (Asynchronous)
No Change (Hold)
RC Function Table
[1]
Inputs Outputs
CE CP T
[2]
RC
Operating Range
Range
Ambient
Temperature V
CC
Commercial –40°C to +85°C 5V ± 5%
Electrical Characteristics Over the Operating Range
Parameter Description Test Conditions Min. Typ.
[5]
Max. Unit
V
OH
Output HIGH Voltage V
CC
=Min., I
OH
=–32 mA 2.0 V
V
CC
=Min., I
OH
=–15 mA 2.4 3.3 V
V
OL
Output LOW Voltage V
CC
=Min., I
OL
=64 mA 0.3 0.55 V
V
IH
Input HIGH Voltage 2.0 V
V
IL
Input LOW Voltage 0.8 V
V
H
Hysteresis
[6]
All inputs 0.2 V
V
IK
Input Clamp Diode Voltage V
CC
=Min., I
IN
=–18 mA –0.7 –1.2 V
I
I
Input HIGH Current V
CC
=Max., V
IN
=V
CC
5 µA
I
IH
Input HIGH Current V
CC
=Max., V
IN
=2.7V ±1 µA
I
IL
Input LOW Current V
CC
=Max., V
IN
=0.5V ±1 µA
I
OS
Output Short Circuit Current
[7]
V
CC
=Max., V
OUT
=0.0V –60 –120 –225 mA
I
OFF
Power-Off Disable V
CC
=0V, V
OUT
=4.5V ±1 µA
Capacitance
[6]
Parameter Description Typ.
[5]
Max. Unit
C
IN
Input Capacitance 5 10 pF
C
OUT
Output Capacitance 9 12 pF
Notes:
3. Unless otherwise noted, these limits are over the operating free-air temperature range.
4. Unused inputs must always be connected to an appropriate logic voltage level, preferably either V
CC
or ground.
5. Typical values are at V
CC
=5.0V, T
A
=+25˚C ambient.
6. This parameter is specified but not tested.
7. Not more than one output should be shorted at a time. Duration of short should not exceed one second. The use of high-speed test apparatus and/or sample
and hold techniques are preferable in order to minimize internal chip heating and more accurately reflect operational values. Otherwise prolonged shorting of
a high output may raise the chip temperature well above normal and thereby cause invalid readings in other parametric tests. In any sequence of parameter
tests, I
OS
tests should be performed last.
