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FQP6N40C

Part # FQP6N40C
Description Trans MOSFET N-CH 400V 6A 3-Pin(3+Tab) TO-220AB Rail (Alt:
Category RECTIFIER
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Technical Document


DISCLAIMER: The information provided herein is solely for informational purposes. Customers must be aware of the suitability of this product for their application, and consider that variable factors such as Manufacturer, Product Category, Date Codes, Pictures and Descriptions may differ from available inventory.

©2003 Fairchild Semiconductor Corporation Rev. A, May 2003
FQP6N40C/FQPF6N40C
QFET
TM
FQP6N40C/FQPF6N40C
400V N-Channel MOSFET
General Description
These N-Channel enhancement mode power field effect
transistors are produced using Fairchild’s proprietary,
planar stripe, DMOS technology.
This advanced technology has been especially tailored to
minimize on-state resistance, provide superior switching
performance, and withstand high energy pulse in the
avalanche and commutation mode. These devices are well
suited for high efficiency switched mode power supplies,
electronic lamp ballasts based on half bridge topology.
Features
6A, 400V, R
DS(on)
= 1.0 @V
GS
= 10 V
Low gate charge ( typical 16nC)
Low Crss ( typical 15pF)
Fast switching
100% avalanche tested
Improved dv/dt capability
Absolute Maximum Ratings T
C
= 25°C unless otherwise noted
* Drain current limited by maximum junction temperature
Thermal Characteristics
Symbol Parameter FQP6N40C FQPF6N40C Units
V
DSS
Drain-Source Voltage 400 V
I
D
Drain Current
- Continuous (T
C
= 25°C)
66 *A
- Continuous (T
C
= 100°C)
3.6 3.6 * A
I
DM
Drain Current - Pulsed
(Note 1)
24 24 * A
V
GSS
Gate-Source Voltage ± 30 V
E
AS
Single Pulsed Avalanche Energy
(Note 2)
270 mJ
I
AR
Avalanche Current
(Note 1)
6A
E
AR
Repetitive Avalanche Energy
(Note 1)
7.3 mJ
dv/dt Peak Diode Recovery dv/dt
(Note 3)
4.5 V/ns
P
D
Power Dissipation (T
C
= 25°C)
73 38 W
- Derate above 25°C 0.58 0.3 W/°C
T
J
, T
STG
Operating and Storage Temperature Range -55 to +150 °C
T
L
Maximum lead temperature for soldering purposes,
1/8" from case for 5 seconds
300 °C
Symbol Parameter FQP6N40C FQPF6N40C Units
R
θJC
Thermal Resistance, Junction-to-Case 1.71 3.31 °C/W
R
θCS
Thermal Resistance, Case-to-Sink Typ. 0.5 -- °C/W
R
θJA
Thermal Resistance, Junction-to-Ambient 62.5 62.5 °C/W
TO-220
FQP Series
G
SD
TO-220F
FQPF Series
G
S
D
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S
D
G
Rev. A, May 2003
FQP6N40C/FQPF6N40C
©2003 Fairchild Semiconductor Corporation
Electrical Characteristics T
C
= 25°C unless otherwise noted
Notes:
1. Repetitive Rating : Pulse width limited by maximum junction temperature
2. L = 13.7 mH, I
AS
= 6 A, V
DD
= 50V, R
G
= 25 Ω, Starting T
J
= 25°C
3. I
SD
6A, di/dt 200A/µs, V
DD
BV
DSS,
Starting T
J
= 25°C
4. Pulse Test : Pulse width 300µs, Duty cycle 2%
5. Essentially independent of operating temperature
Symbol Parameter Test Conditions Min Typ Max Units
Off Characteristics
BV
DSS
Drain-Source Breakdown Voltage
V
GS
= 0 V, I
D
= 250 µA
400 -- -- V
BV
DSS
/ T
J
Breakdown Voltage Temperature
Coefficient
I
D
= 250 µA, Referenced to 25°C
-- 0.54 -- V/°C
I
DSS
Zero Gate Voltage Drain Current
V
DS
= 400 V, V
GS
= 0 V
-- -- 1 µA
V
DS
= 320 V, T
C
= 125°C
-- -- 10 µA
I
GSSF
Gate-Body Leakage Current, Forward
V
GS
= 30 V, V
DS
= 0 V
-- -- 100 nA
I
GSSR
Gate-Body Leakage Current, Reverse
V
GS
= -30 V, V
DS
= 0 V
-- -- -100 nA
On Characteristics
V
GS(th)
Gate Threshold Voltage
V
DS
= V
GS
, I
D
= 250 µA
2.0 -- 4.0 V
R
DS(on)
Static Drain-Source
On-Resistance
V
GS
= 10 V, I
D
= 3A
-- 0.83 1
g
FS
Forward Transconductance
V
DS
= 40 V, I
D
= 3A
(Note 4)
-- 4.7 -- S
Dynamic Characteristics
C
iss
Input Capacitance
V
DS
= 25 V, V
GS
= 0 V,
f = 1.0 MHz
-- 480 625 pF
C
oss
Output Capacitance -- 80 105 pF
C
rss
Reverse Transfer Capacitance -- 15 20 pF
Switching Characteristics
t
d(on)
Turn-On Delay Time
V
DD
= 200 V, I
D
= 6A,
R
G
= 25
(Note 4, 5)
-- 13 35 ns
t
r
Turn-On Rise Time -- 65 140 ns
t
d(off)
Turn-Off Delay Time -- 21 55 ns
t
f
Turn-Off Fall Time -- 38 85 ns
Q
g
Total Gate Charge
V
DS
= 320 V, I
D
= 6A,
V
GS
= 10 V
(Note 4, 5)
-- 16 20 nC
Q
gs
Gate-Source Charge -- 2.3 -- nC
Q
gd
Gate-Drain Charge -- 8.2 -- nC
Drain-Source Diode Characteristics and Maximum Ratings
I
S
Maximum Continuous Drain-Source Diode Forward Current -- -- 6 A
I
SM
Maximum Pulsed Drain-Source Diode Forward Current -- -- 24 A
V
SD
Drain-Source Diode Forward Voltage
V
GS
= 0 V, I
S
= 6 A
-- -- 1.4 V
t
rr
Reverse Recovery Time
V
GS
= 0 V, I
S
= 6 A,
dI
F
/ dt = 100 A/µs
(Note 4)
-- 230 -- ns
Q
rr
Reverse Recovery Charge -- 1.7 -- µC
Rev. A, May 2003
FQP6N40C/FQPF6N40C
©2003 Fairchild Semiconductor Corporation
0.2 0.4 0.6 0.8 1.0 1.2 1.4
10
-1
10
0
10
1
150
$
%
Notes :
1. V
GS
= 0V
2. 250
&
s Pulse Test
25
$
I
DR
, Reverse Drain Current [A]
V
SD
, Source-Drain voltage [V]
0 5 10 15 20
0.5
1.0
1.5
2.0
2.5
3.0
3.5
V
GS
= 20V
V
GS
= 10V
%
Note : T
J
= 25
$
R
DS( ON)
[
'
],
Drain-Source On-Resistance
I
D
, Drain Current [A]
Typical Characteristics
Figure 5. Capacitance Characteristics Figure 6. Gate Charge Characteristics
Figure 1. On-Region Characteristics Figure 2. Transfer Characteristics
10
-1
10
0
10
1
10
-1
10
0
10
1
V
GS
Top : 15.0 V
10.0 V
8.0 V
7.0 V
6.5 V
6.0 V
5.5 V
Bottom : 5.0 V
%
Notes :
1. 250
&
s Pulse Test
2. T
C
= 25
$
I
D
, Drain Current [A]
V
DS
, Drain-Source Voltage [V]
246810
10
-1
10
0
10
1
150
o
C
25
o
C
-55
o
C
%
Notes :
1. V
DS
= 40V
2. 250
&
s Pulse Test
I
D
, Drain Current [A]
V
GS
, Gate-Source Voltage [V]
10
-1
10
0
10
1
0
200
400
600
800
1000
1200
C
iss
= C
gs
+ C
gd
(C
ds
= shorted)
C
oss
= C
ds
+ C
gd
C
rss
= C
gd
%
Note ;
1. V
GS
= 0 V
2. f = 1 MHz
C
rss
C
oss
C
iss
Capacitances [pF]
V
DS
, Drain-Source Voltage [V]
0 5 10 15 20
0
2
4
6
8
10
12
V
DS
= 200V
V
DS
= 80V
V
DS
= 320V
%
Note : I
D
= 6A
V
GS
, Gate-Source Voltage [V]
Q
G
, Total Gate Charge [nC]
Figure 3. On-Resistance Variation vs
Drain Current and Gate Voltage
Figure 4. Body Diode Forward Voltage
Variation with Source Current
and Temperature
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