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54FCT273ADB

Part # 54FCT273ADB
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Category IC
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Technical Document


DISCLAIMER: The information provided herein is solely for informational purposes. Customers must be aware of the suitability of this product for their application, and consider that variable factors such as Manufacturer, Product Category, Date Codes, Pictures and Descriptions may differ from available inventory.

Integrated Device Technology, Inc.
MILITARY AND COMMERCIAL TEMPERATURE RANGES MAY 1992
1992 Integrated Device Technology, Inc. 7.10 DSC-4609/2
IDT54/74FCT273
IDT54/74FCT273A
IDT54/74FCT273C
FAST CMOS
OCTAL FLIP-FLOP
WITH MASTER RESET
FEATURES:
IDT54/74FCT273 equivalent to FAST speed;
IDT54/74FCT273A 45% faster than FAST
IDT54/74FCT273C 55% faster than FAST
Equivalent to FAST output drive over full temperature
and voltage supply extremes
•IOL = 48mA (commercial) and 32mA (military)
CMOS power levels (1mW typ. static)
TTL input and output level compatible
CMOS output level compatible
Substantially lower input current levels than FAST
(5µA max.)
Octal D flip-flop with Master Reset
JEDEC standard pinout for DIP and LCC
Product available in Radiation Tolerant and Radiation
Enhanced versions
Military product compliant to MIL-STD-883, Class B
DESCRIPTION:
The IDT54/74FCT273/A/C are octal D flip-flops built using
an advanced dual metal CMOS technology. The IDT54/
74FCT273/A/C have eight edge-triggered D-type flip-flops
with individual D inputs and O outputs. The common buffered
Clock (CP) and Master Reset ( ) inputs load and reset
(clear) all flip-flops simultaneously.
The register is fully edge-triggered. The state of each D
input, one set-up time before the LOW-to-HIGH clock
transition, is transferred to the corresponding flip-flop’s O
output.
All outputs will be forced LOW independently of Clock or
Data inputs by a LOW voltage level on the input. The
device is useful for applications where the true output only is
required and the Clock and Master Reset are common to all
storage elements.
FUNCTIONAL BLOCK DIAGRAM
2558 drw 01
D
O
7
CP
Q
D
7
D
O
6
CP
Q
D
6
D
O
5
CP
Q
D
5
D
O
4
CP
Q
D
4
D
O
3
CP
Q
D
3
D
O
2
CP
Q
D
2
D
O
1
CP
Q
D
1
D
O
0
CP
Q
D
0
MR
CP
R
D
R
D
R
D
R
D
R
D
R
D
R
D
R
D
PIN CONFIGURATIONS
5
6
7
8
9
10
D0
D1
O1
1
2
3
4
20
19
18
17
16
15
14
13
Vcc
12
11
MR
D
7
O2
D2
D3
O3
CP
D
6
O6
O5
D5
D4
GND
O
4
O0
O7
P20-1
D20-1
SO20-2
&
E20-1
2558 drw 02
INDEX
15
14
18
17
16
5
6
7
8
4
L20-2
D
0
D1
O1
Vcc
MR
D7
O2
D2
D3
O3
CP
D6
O6
O5
D5
D
4
GND
O
4
O
0
O
7
9
10 11 12 13
32
1
20 19
The IDT logo is a registered trademark of Integrated Device Technology, Inc.
FAST is a registered trademark of National Semiconductor Co.
DIP/SOIC/CERPACK
TOP VIEW
LCC
TOP VIEW
1
7.10 2
IDT54/74FCT273/A/C FAST CMOS
OCTAL D FLIP-FLOP WITH MASTER RESET MILITARY AND COMMERCIAL TEMPERATURE RANGES
FUNCTION TABLE
Inputs Outputs
Operating Mode CP D
N ON
Reset (Clear) L X X L
Load “1” H hH
Load “0” H lL
NOTES: 2558 tbl 06
H = HIGH voltage level steady-state
h = HIGH voltage level one set-up time prior to the LOW-to-HIGH clock
transition
L = LOW voltage level steady state
l = LOW voltage level one set-up time prior to the LOW-to-HIGH clock
transition
X = Don’t care
= LOW-to-HIGH clock transition
PIN DESCRIPTION
Pin Names Description
D
N Data Input
Master Reset (Active LOW)
CP Clock Pulse Input (Active Rising Edge)
O
N Data Outputs
2558 tbl 05
ABSOLUTE MAXIMUM RATINGS
(1)
Symbol Rating Commercial Military Unit
V
TERM
(2)
Terminal Voltage –0.5 to +7.0 –0.5 to +7.0 V
with Respect
to GND
V
TERM
(3)
Terminal Voltage –0.5 to VCC –0.5 to VCC V
with Respect
to GND
T
A Operating 0 to +70 –55 to +125 °C
Temperature
T
BIAS Temperature –55 to +125 –65 to +135 °C
Under Bias
T
STG Storage –55 to +125 –65 to +150 °C
Temperature
P
T Power Dissipation 0.5 0.5 W
I
OUT DC Output Current 120 120 mA
NOTES: 2558 tbl 01
1. Stresses greater than those listed under ABSOLUTE MAXIMUM
RATINGS may cause permanent damage to the device. This is a stress
rating only and functional operation of the device at these or any other
conditions above those indicated in the operational sections of this
specification is not implied. Exposure to absolute maximum rating
conditions for extended periods may affect reliability. No terminal voltage
may exceed V
CC by +0.5V unless otherwise noted.
2. Input and V
CC terminals only.
3. Outputs and I/O terminals only.
CAPACITANCE (TA = +25°C, f = 1.0MHz)
Symbol Parameter
(1)
Conditions Typ. Max. Unit
C
IN Input Capacitance VIN = 0V 6 10 pF
C
OUT Output Capacitance VOUT = 0V 8 12 pF
NOTE: 2558 tbl 02
1. This parameter is guaranteed by characterization data and not tested.
7.10 3
IDT54/74FCT273/A/C FAST CMOS
OCTAL D FLIP-FLOP WITH MASTER RESET MILITARY AND COMMERCIAL TEMPERATURE RANGES
DC ELECTRICAL CHARACTERISTICS OVER OPERATING RANGE
Following Conditions Apply Unless Otherwise Specified: VLC = 0.2V; VHC = VCC – 0.2V
Commercial: TA = 0°C to +70°C, VCC = 5.0V ± 5%; Military: TA = –55°C to +125°C, VCC = 5.0V ± 10%
Symbol Parameter Test Conditions
(1)
Min. Typ.
(2)
Max. Unit
V
IH Input HIGH Level Guaranteed Logic HIGH Level 2.0 V
V
IL Input LOW Level Guaranteed Logic LOW Level 0.8 V
I
IH Input HIGH Current VCC = Max. VI = VCC ——5µA
V
I = 2.7V 5
(4)
IIL Input LOW Current VI = 0.5V –5
(4)
VI = GND –5
V
IK Clamp Diode Voltage Vcc = Min., IN = –18mA –0.7 –1.2 V
I
OS Short Circuit Current Vcc = Max.
(3)
, VO = GND –60 –120 mA
V
OH Output HIGH Voltage Vcc = 3V, VIN = VLC or VHC, IOH = –32µAVHC VCC —V
Vcc = Min. I
OH = –300µAVHC VCC
V
IN = VIH or VIL IOH = –12mA MIL. 2.4 4.3
I
OH = –15mA COM’L. 2.4 4.3
V
OL Output LOW Voltage Vcc = 3V, VIN = VLC or VHC, IOL = 300µA GND VLC V
Vcc = Min. I
OL = 300µA GND VLC
(4)
VIN = VIH or VIL IOL = 32mA MIL. 0.3 0.5
I
OL = 48mA COM’L. 0.3 0.5
NOTES: 2558 tbl 03
1. For conditions shown as Max. or Min., use appropriate value specified under Electrical Characteristics for the applicable device type.
2. Typical values are at V
CC = 5.0V, +25°C ambient and maximum loading.
3. Not more than one output should be shorted at one time. Duration of the short circuit test should not exceed one second.
4. This parameter is guaranteed but not tested.
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