Freelance Electronics Components Distributor
Closed Dec 25th-26th
800-300-1968
We Stock Hard to Find Parts

ULN2003AIDR

Part # ULN2003AIDR
Description Trans Darlington NPN 50V 0.5A16-Pin SOIC T/R - Tape and R
Category IC
Availability Out of Stock
Qty 0
Qty Price
1 + $0.13690



Technical Document


DISCLAIMER: The information provided herein is solely for informational purposes. Customers must be aware of the suitability of this product for their application, and consider that variable factors such as Manufacturer, Product Category, Date Codes, Pictures and Descriptions may differ from available inventory.

www.ti.com
Electrical Characteristics
Switching Characteristics
Switching Characteristics
ULN2003AI
HIGH-VOLTAGE, HIGH-CURRENT
DARLINGTON TRANSISTOR ARRAY
SLRS054B JULY 2003 REVISED FEBRUARY 2005
T
A
= –40 ° C to 105 ° C
PARAMETER TEST FIGURE TEST CONDITIONS MIN TYP MAX UNIT
I
C
= 200 mA 2.7
V
I(on)
On-state input voltage 5 V
CE
= 2 V I
C
= 250 mA 2.9 V
I
C
= 300 mA 3
I
I
= 250 µ A, I
C
= 100 mA 0.9 1.2
V
CE(sat)
Collector-emitter saturation voltage 4 I
I
= 350 µ A, I
C
= 200 mA 1 1.4 V
I
I
= 500 µ A, I
C
= 350 mA 1.2 1.7
I
CEX
Collector cutoff current 1 V
CE
= 50 V, I
I
= 0 100 µ A
V
F
Clamp forward voltage 7 I
F
= 350 mA 1.7 2.2 V
I
I(off)
Off-state input current 2 V
CE
= 50 V, I
C
= 500 µ A 30 65 µ A
I
I
Input current 3 V
I
= 3.85 V 0.93 1.35 mA
I
R
Clamp reverse current 6 V
R
= 50 V 100 µ A
C
i
Input capacitance V
I
= 0, f = 1 MHz 15 25 pF
T
A
= 25 ° C
PARAMETER TEST CONDITIONS MIN TYP MAX UNIT
t
PLH
Propagation delay time, low- to high-level output See Figure 8 0.25 1 µ s
t
PHL
Propagation delay time, high- to low-level output See Figure 8 0.25 1 µ s
V
OH
High-level output voltage after switching V
S
= 50 V, I
O
300 mA, See Figure 9 V
S
20 mV
T
A
= –40 ° C to 105 ° C
PARAMETER TEST CONDITIONS MIN TYP MAX UNIT
t
PLH
Propagation delay time, low- to high-level output See Figure 8 1 10 µ s
t
PHL
Propagation delay time, high- to low-level output See Figure 8 1 10 µ s
V
OH
High-level output voltage after switching V
S
= 50 V, I
O
300 mA, See Figure 9 V
S
50 mV
4
www.ti.com
PARAMETER MEASUREMENT INFORMATION
Open
V
CE
Open
I
CEX
Figure 1. I
CEX
Test Circuit
Open
V
CE
I
C
I
I(off)
Figure 2. I
I(off)
Test Circuit
Open
Open
I
I(on)
V
I
Figure 3. I
I
Test Circuit
Open
V
CE
I
C
I
I
h
FE
=
I
C
I
I
NOTE: I
I
is fixed for measuring V
CE(sat)
, variable for
measuring h
FE
.
Figure 4. h
FE
, V
CE(sat)
Test Circuit
Open
V
CE
I
C
V
I(on)
Figure 5. V
I(on)
Test Circuit
V
R
Open
I
R
Figure 6. I
R
Test Circuit
I
F
V
F
Open
Figure 7. V
F
Test Circuit
ULN2003AI
HIGH-VOLTAGE, HIGH-CURRENT
DARLINGTON TRANSISTOR ARRAY
SLRS054B JULY 2003 REVISED FEBRUARY 2005
5
www.ti.com
PARAMETER MEASUREMENT INFORMATION
50% 50%
50% 50%
t
PHL
VOLTAGE WAVEFORMS
Input
t
PLH
Figure 8. Propagation Delay-Time Waveforms
Output
Input
Open
V
S
200
Output
C
L
= 15 pF
(see Note B)
90% 90%
1.5 V 1.5 V
10% 10%
40 µs
10 ns5 ns
V
IH
(see Note C)
0 V
V
OH
V
OL
Input
Output
TEST CIRCUIT
VOLTAGE WAVEFORMS
1N3064
2 mH
Pulse
Generator
(see Note A)
NOTES: A. The pulse generator has the following characteristics: PRR = 12.5 kHz, Z
O
= 50 .
B. C
L
includes probe and jig capacitance.
C. For testing, V
IH
= 3 V
Figure 9. Latch-Up Test Circuit and Voltage Waveforms
ULN2003AI
HIGH-VOLTAGE, HIGH-CURRENT
DARLINGTON TRANSISTOR ARRAY
SLRS054B JULY 2003 REVISED FEBRUARY 2005
6
PREVIOUS12345NEXT