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PE97022-11

Part # PE97022-11
Description 3500 MHz Ultra CMOS Integer-N44Lead CQFJ Rad Hard for Space
Category IC
Availability In Stock
Qty 5
Qty Price
1 - 1 $5218.95044
2 - 2 $4151.43785
3 - 3 $3914.21283
4 + $3637.45030
Manufacturer Available Qty
PEREGRINE
Date Code: 0821
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Technical Document


DISCLAIMER: The information provided herein is solely for informational purposes. Customers must be aware of the suitability of this product for their application, and consider that variable factors such as Manufacturer, Product Category, Date Codes, Pictures and Descriptions may differ from available inventory.

Product Specification
PE97022
Page 4 of 14
©2007-2008 Peregrine Semiconductor Corp. All rights reserved.
Document No. 70-0235-04 UltraCMOS™ RFIC Solutions
Table 1. Pin Descriptions (continued)
Note 1: V
DD
pins 1, 11, 12, 23, 31, 33, 35, and 38 are connected by diodes and must be supplied with the same positive voltage level.
V
DD
pins 31 and 38 are used to enable test modes and should be left floating.
Note 2: All digital input pins have 70 k pull-down resistors to ground.
Pin No. Pin Name Interface Mode Type Description
31 V
DD
-f
p
ALL (Note 1) V
DD
for f
p
. Can be left floating or connected to GND to disable the f
p
output.
32 Dout Serial, Parallel Output
Data Out. The MSEL signal and the raw prescaler output are available on Dout
through enhancement register programming.
33 V
DD
ALL (Note 1) Same as pin 1.
34 Cext ALL Output
Logical “NAND” of PD_Ū and PD_D ¯ terminated through an on chip, 2 k series
resistor. Connecting Cext to an external capacitor will low pass filter the input to the
inverting amplifier used for driving LD.
35 V
DD
ALL (Note 1) Same as pin 1.
36
PD_D ¯
ALL Output
PD_D ¯ is pulse down when f
p
leads f
c
.
37 PD_Ū ALL PD_Ū is pulse down when f
c
leads f
p
.
38 V
DD
-f
c
ALL (Note 1) V
DD
for f
c
. Can be left floating or connected to GND to disable the f
c
output.
39 f
c
ALL Output
Monitor pin for reference divider output. Switching activity can be disabled through
enhancement register programming or by floating or grounding V
DD
pin 38.
40 GND ALL Ground.
41 GND ALL Ground.
42 f
r
ALL Input Reference frequency input.
43 LD ALL
Output,
OD
Lock detect and open drain logical inversion of CEXT. When the loop is in lock, LD
is high impedance, otherwise LD is a logic low (“0”).
44
E¯n¯h¯
Serial, Parallel Input
Enhancement mode. When asserted low (“0”), enhancement register bits are
functional.
Product Specification
PE97022
Page 5 of 14
Document No. 70-0235-04 www.psemi.com
©2007-2008 Peregrine Semiconductor Corp. All rights reserved.
Table 2. Absolute Maximum Ratings
Note 1: Periodically sampled, not 100% tested. Tested per MIL-
STD-883, M3015 C2
Table 4. ESD Ratings
Electrostatic Discharge (ESD) Precautions
When handling this UltraCMOS™ device, observe
the same precautions that you would use with
other ESD-sensitive devices. Although this device
contains circuitry to protect it from damage due to
ESD, precautions should be taken to avoid
exceeding the specified rating in Table 4.
Latch-Up Avoidance
Unlike conventional CMOS devices, UltraCMOS™
devices are immune to latch-up.
Table 3. Operating Ratings
Table 5. DC Characteristics:
V
DD
= 3.3 V, -40° C < T
A
< 85° C, unless otherwise specified
Symbol Parameter/Conditions Min Max Units
V
DD
Supply voltage -0.3 4.0 V
V
I
Voltage on any input -0.3
V
DD
+ 0.3
V
I
I
DC into any input -10 +10 mA
I
O
DC into any output -10 +10 mA
T
stg
Storage temperature
range
-65 150 °C
Symbol Parameter/Conditions Level Units
V
ESD
ESD voltage (Human Body Model)
– Note 1
1000 V
Symbol Parameter/Conditions Min Max Units
V
DD
Supply voltage 2.85 3.45 V
T
A
Operating ambient
temperature range
-40 85
°C
Symbol Parameter Conditions Min Typ Max Units
I
DD
Operational supply current;
V
DD
= 2.85 to 3.45 V
Prescaler disabled 15 mA
Prescaler enabled 45 50 mA
Digital Inputs: All except f
r
, F
in
, F
in
V
IH
High level input voltage V
DD
= 2.85 to 3.45 V 0.7 x V
DD
V
V
IL
Low level input voltage V
DD
= 2.85 to 3.45 V 0.3 x V
DD
V
I
IH
High level input current V
IH
= V
DD
= 3.45 V 70
µA
I
IL
Low level input current V
IL
= 0, V
DD
= 3.45 V -1
µA
Reference Divider input: f
r
I
IHR
High level input current V
IH
= V
DD
= 3.45 V 100
µA
I
ILR
Low level input current V
IL
= 0, V
DD
= 3.45 V -100
µA
Counter and phase detector outputs: f
c
, f
p
.
V
OLD
Output voltage LOW I
out
= 6 mA 0.4 V
V
OHD
Output voltage HIGH I
out
= -3 mA V
DD
- 0.4 V
Lock detect outputs: Cext, LD
V
OLC
Output voltage LOW, Cext
I
out
= 100 µA
0.4 V
V
OHC
Output voltage HIGH, Cext
I
out
= -100 µA
V
DD
- 0.4 V
V
OLLD
Output voltage LOW, LD I
out
= 1 mA 0.4 V
Product Specification
PE97022
Page 6 of 14
©2007-2008 Peregrine Semiconductor Corp. All rights reserved.
Document No. 70-0235-04 UltraCMOS™ RFIC Solutions
Table 6. AC Characteristics: V
DD
= 3.3 V, -40° C < T
A
< 85° C, unless otherwise specified
Note 1: Fclk is verified during the functional pattern test. Serial programming sections of the functional pattern are clocked at 10 MHz to verify Fclk
specification.
Note 2: CMOS logic levels can be used to drive reference input if DC coupled. Voltage input needs to be a minimum of 0.5Vp-p.
Note 3: Parameter is guaranteed through characterization only and is not tested.
Note 4: Parameters below are not tested for die sales. These parameters are verified during the element evaluation.
Symbol Parameter Conditions Min Typical Max Units
Control Interface and Latches (see Figures 4, 5, 6)
f
Clk
Serial data clock frequency (Note 1) 10 MHz
t
ClkH
Serial clock HIGH time 30 ns
t
ClkL
Serial clock LOW time 30 ns
t
DSU
Sdata set-up time after Sclk rising edge, D[7:0] set-up
time to M1_WR, M2_WR, A_WR, E_WR rising edge
10 ns
t
DHLD
Sdata hold time after Sclk rising edge, D[7:0] hold
time to M1_WR, M2_WR, A_WR, E_WR rising edge
10 ns
t
PW
S_WR, M1_WR, M2_WR, A_WR, E_WR pulse width 30 ns
t
CWR
Sclk rising edge to S_WR rising edge. S_WR,
M1_WR, M2_WR, A_WR falling edge to Hop_WR
rising edge
30 ns
t
CE
Sclk falling edge to E_WR transition 30 ns
t
WRC
S_WR falling edge to Sclk rising edge. Hop_WR
falling edge to S_WR, M1_WR, M2_WR, A_WR rising
edge
30 ns
t
EC
E_WR transition to Sclk rising edge 30 ns
t
MDO
MSEL data out delay after Fin rising edge C
L
= 12 pf 8 ns
Main Divider (Including Prescaler) (Note 4)
P
Fin
Input level range
External AC coupling
275 MHz Freq 3200MHz
-5 5 dBm
External AC coupling
3.2 GHz < Freq 3.5 GHz
3.15 V VDD 3.45 V
0 5 dBm
Main Divider (Prescaler Bypassed) (Note 4)
F
in
Operating frequency 50 300 MHz
P
Fin
Input level range External AC coupling -5 5 dBm
Reference Divider
f
r
Operating frequency (Note 3) 100 MHz
P
fr
Reference input power (Note 2) Single-ended input -2 10 dBm
Phase Detector
f
c
Comparison frequency (Note 3) 50 MHz
SSB Phase Noise (F
in
= 1.9 GHz, f
r
= 20 MHz, f
c
= 20 MHz, LBW = 50 kHz, V
DD
= 3.3 V, Temp = 25° C) (Note 4)
Φ
N
Phase Noise 100 Hz Offset -89 dBc/Hz
Φ
N
Phase Noise 1 kHz Offset -95 dBc/Hz
Φ
N
Phase Noise 10 kHz Offset -102 dBc/Hz
SSB Phase Noise (F
in
= 1.9 GHz, f
r
= 20 MHz, f
c
= 20 MHz, LBW = 50 kHz, V
DD
= 3.0 V, Temp = 25° C) (Note 4)
Φ
N
Phase Noise 100 Hz Offset -87 dBc/Hz
Φ
N
Phase Noise 1 kHz Offset -94 dBc/Hz
Φ
N
Phase Noise 10 kHz Offset -101 dBc/Hz
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