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XC4VFX100-11FF1152I

Part # XC4VFX100-11FF1152I
Description FPGA VIRTEX-4 94896 CELLS 90NM 1.2V 1152FCBGA - Trays
Category IC
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Technical Document


DISCLAIMER: The information provided herein is solely for informational purposes. Customers must be aware of the suitability of this product for their application, and consider that variable factors such as Manufacturer, Product Category, Date Codes, Pictures and Descriptions may differ from available inventory.

Virtex-4 FPGA Data Sheet: DC and Switching Characteristics
DS302 (v3.7) September 9, 2009 www.xilinx.com
Product Specification 22
Ethernet MAC Switching Characteristics
Consult UG074: Virtex-4 FPGA Embedded Tri-mode Ethernet MAC User Guide for further information.
HSTL_II_DCI
(3)
1.28 1.47 1.64 1.83 1.96 2.13 1.83 1.96 2.13 ns
HSTL_III_DCI
(3)
1.28 1.47 1.64 1.90 2.04 2.22 1.90 2.04 2.22 ns
HSTL_IV_DCI
(3)
1.28 1.47 1.64 1.75 1.87 2.03 1.75 1.87 2.03 ns
HSTL_I_DCI_18
(3)
1.26 1.44 1.60 1.89 2.03 2.21 1.89 2.03 2.21 ns
HSTL_II_DCI_18
(3)
1.26 1.44 1.60 1.85 1.98 2.16 1.85 1.98 2.16 ns
HSTL_III_DCI_18
(3)
1.26 1.44 1.60 1.80 1.93 2.09 1.80 1.93 2.09 ns
HSTL_IV_DCI_18
(3)
1.26 1.44 1.60 1.77 1.89 2.06 1.77 1.89 2.06 ns
SSTL2_I_DCI
(3)
1.31 1.51 1.68 2.09 2.25 2.46 2.09 2.25 2.46 ns
SSTL2_II_DCI
(3)
1.31 1.51 1.68 2.07 2.24 2.45 2.07 2.24 2.45 ns
LVPECL_25 1.38 1.59 1.77 1.52 1.61 1.74 1.52 1.61 1.74 ns
SSTL18_I 1.31 1.51 1.68 2.15 2.33 2.54 2.15 2.33 2.54 ns
SSTL18_II 1.31 1.51 1.68 1.92 2.06 2.24 1.92 2.06 2.24 ns
SSTL18_I_DCI
(3)
1.31 1.51 1.68 1.97 2.12 2.32 1.97 2.12 2.32 ns
SSTL18_II_DCI
(3)
1.31 1.51 1.68 1.87 2.00 2.18 1.87 2.00 2.18 ns
Notes:
1. The I/O standard is selected in the Xilinx ISE® software tool using the IOSTANDARD attribute.
2. All I/O timing specifications are measured with V
CCO
at –5% from nominal.
3. The values of the DCI reference resistors must be within a 20Ω–100Ω range. Refer to UG070
, Virtex-4 FPGA User Guide, for detailed information.
Tabl e 27 : IOB Switching Characteristics
(1,2)
(Continued)
IOSTANDARD
Attribute
(1)
T
IOPI
T
IOOP
T
IOTP
Units
Speed Grade Speed Grade Speed Grade
-12 -11 -10 -12 -11 -10 -12 -11 -10
Tabl e 28 : IOB 3-state ON Output Switching Characteristics (T
IOTPHZ
)
Symbol Description
Speed Grade
Units-12 -11 -10
T
IOTPHZ
T input to Pad high-impedance 0.88 1.01 1.12 ns
Tabl e 29 : Maximum Ethernet MAC Performance
Description
Speed Grade
Units-12 -11 -10
Ethernet MAC Maximum Performance 10/100/1000 Mb/s
Virtex-4 FPGA Data Sheet: DC and Switching Characteristics
DS302 (v3.7) September 9, 2009 www.xilinx.com
Product Specification 23
I/O Standard Adjustment Measurement Methodology
Input Delay Measurements
Tabl e 3 0 shows the test setup parameters used for measuring input delay.
Tabl e 30 : Input Delay Measurement Methodology
Description
I/O Standard
Attribute V
L
(1,2)
V
H
(1,2)
V
MEAS
(1,4,5)
V
REF
(1,3,5)
LVTTL (Low-Voltage Transistor-Transistor Logic) LVTTL 0 3.0 1.4
LVCMOS (Low-Voltage CMOS), 3.3V LVCMOS33 0 3.3 1.65
LVCMOS, 2.5V LVCMOS25 0 2.5 1.25
LVCMOS, 1.8V LVCMOS18 0 1.8 0.9
LVCMOS, 1.5V LVCMOS15 0 1.5 0.75
PCI (Peripheral Component Interface),
33 MHz, 3.3V
PCI33_3 Per PCI™ Specification
PCI, 66 MHz, 3.3V PCI66_3 Per PCI Specification
PCI-X, 133 MHz, 3.3V PCIX Per PCI-X™ Specification
GTL (Gunning Transceiver Logic) GTL V
REF
–0.2 V
REF
+0.2 V
REF
0.80
GTL Plus GTLP V
REF
–0.2 V
REF
+0.2 V
REF
1.0
HSTL (High-Speed Transceiver Logic),
Class I & II
HSTL_I, HSTL_II V
REF
–0.5 V
REF
+0.5 V
REF
0.75
HSTL, Class III & IV HSTL_III, HSTL_IV V
REF
–0.5 V
REF
+0.5 V
REF
0.90
HSTL, Class I & II, 1.8V HSTL_I_18, HSTL_II_18 V
REF
–0.5 V
REF
+0.5 V
REF
0.90
HSTL, Class III & IV, 1.8V
HSTL_III_18,
HSTL_IV_18
V
REF
–0.5 V
REF
+0.5 V
REF
1.08
SSTL (Stub Terminated Transceiver Logic),
Class I & II, 3.3V
SSTL3_I, SSTL3_II V
REF
–1.00 V
REF
+1.00 V
REF
1.5
SSTL, Class I & II, 2.5V SSTL2_I, SSTL2_II V
REF
–0.75 V
REF
+0.75 V
REF
1.25
SSTL, Class I & II, 1.8V SSTL18_I, SSTL18_II V
REF
–0.5 V
REF
+0.5 V
REF
0.90
AGP-2X/AGP (Accelerated Graphics Port) AGP
V
REF
(0.2 xV
CCO
)
V
REF
+
(0.2 xV
CCO
)
V
REF
AGP
Spec
LVDS (Low-Voltage Differential Signaling), 2.5V LVDS_25 1.2 – 0.125 1.2 + 0.125 1.2
LVDSEXT (LVDS Extended Mode), 2.5V LVDSEXT_25 1.2 0.125 1.2 + 0.125 1.2
ULVDS (Ultra LVDS), 2.5V ULVDS_25 0.6 – 0.125 0.6 + 0.125 0.6
LDT (HyperTransport), 2.5V LDT_25 0.6 – 0.125 0.6 + 0.125 0.6
Notes:
1. Input delay measurement methodology parameters for LVDCI and HSLVDCI are the same as for LVCMOS standards of the same voltage.
Parameters for all other DCI standards are the same as for the corresponding non-DCI standards.
2. Input waveform switches between V
L
and V
H
.
3. Measurements are made at typical, minimum, and maximum V
REF
values. Reported delays reflect worst case of these measurements. V
REF
values
listed are typical.
4. Input voltage level from which measurement starts.
5. This is an input voltage reference that bears no relation to the V
REF
/ V
MEAS
parameters found in IBIS models and/or noted in Figure 4.
Virtex-4 FPGA Data Sheet: DC and Switching Characteristics
DS302 (v3.7) September 9, 2009 www.xilinx.com
Product Specification 24
Output Delay Measurements
Output delays are measured using a Tektronix P6245
TDS500/600 probe (< 1 pF) across approximately 4 inches
of FR4 microstrip trace. Standard termination was used for
all testing. The propagation delay of the 4 inch trace is char-
acterized separately and subtracted from the final measure-
ment, and is therefore not included in the generalized test
setup shown in Figure 4.
Measurements and test conditions are reflected in the IBIS
models except where the IBIS format precludes it. Parame-
ters V
REF
, R
REF
, C
REF
, and V
MEAS
fully describe the test
conditions for each I/O standard. The most accurate predic-
tion of propagation delay in any given application can be
obtained through IBIS simulation, using the following
method:
1. Simulate the output driver of choice into the generalized
test setup, using values from Ta bl e 3 1.
2. Record the time to V
MEAS
.
3. Simulate the output driver of choice into the actual PCB
trace and load, using the appropriate IBIS model or
capacitance value to represent the load.
4. Record the time to V
MEAS
.
5. Compare the results of steps 2 and 4. The increase or
decrease in delay yields the actual worst-case
propagation delay (clock-to-input) of the PCB trace.
Figure 4: Generalized Test Setup
V
REF
R
REF
V
MEAS
(voltage level when taking
delay measurement)
C
REF
(probe capacitance)
FPGA Output
DS302_05_031708
Tabl e 31 : Output Delay Measurement Methodology
Description
I/O Standard
Attribute
R
REF
(Ω)
C
REF
(1)
(pF)
V
MEAS
(V)
V
REF
(V)
LVTTL (Low-Voltage Transistor-Transistor Logic) LVTTL (all) 1M 0 1.4 0
LVCMOS (Low-Voltage CMOS), 3.3V LVCMOS33 1M 0 1.65 0
LVCMOS, 2.5V LVCMOS25 1M 0 1.25 0
LVCMOS, 1.8V LVCMOS18 1M 0 0.9 0
LVCMOS, 1.5V LVCMOS15 1M 0 0.75 0
LVCMOS, 1.2V LVCMOS12 1M 0 0.75 0
PCI (Peripheral Component Interface), 33 MHz, 3.3V
PCI33_3 (rising edge) 25 10
(2)
0.94 0
PCI33_3 (falling edge) 25 10
(2)
2.03 3.3
PCI, 66 MHz, 3.3V
PCI66_3 (rising edge) 25 10
(2)
0.94 0
PCI66_3 (falling edge) 25 10
(2)
2.03 3.3
PCI-X, 133 MHz, 3.3V
PCIX (rising edge) 25 10
(3)
0.94
PCIX (falling edge 25 10
(3)
2.03 3.3
GTL (Gunning Transceiver Logic) GTL 25 0 0.8 1.2
GTL Plus GTLP 25 0 1.0 1.5
HSTL (High-Speed Transceiver Logic), Class I HSTL_I 50 0 V
REF
0.75
HSTL, Class II HSTL_II 25 0 V
REF
0.75
HSTL, Class III HSTL_III 50 0 0.9 1.5
HSTL, Class IV HSTL_IV 25 0 0.9 1.5
HSTL, Class I, 1.8V HSTL_I_18 50 0 V
REF
0.9
HSTL, Class II, 1.8V HSTL_II_18 25 0 V
REF
0.9
HSTL, Class III, 1.8V HSTL_III_18
50 0 1.1 1.8
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