
TL03x, TL03xA
ENHANCED-JFET LOW-POWER LOW-OFFSET
OPERATIONAL AMPLIFIERS
SLOS180C – FEBRUARY 1997 – REVISED DECEMBER 2001
24
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
PARAMETER MEASUREMENT INFORMATION
Figure 1. Slew-Rate and Overshoot Test Circuit
V
I
+
–
V
CC+
V
CC–
V
O
C
L
(see Note A)
R
L
NOTE A: C
L
includes fixture capacitance.
Figure 2. Rise Time and Overshoot Waveform
Overshoot
10%
90%
t
r
Figure 3. Noise-Voltage Test Circuit
V
CC–
V
CC+
–
V
O
R
S
R
S
10 kΩ
Figure 4. Unity-Gain Bandwidth and
Phase-Margin Test Circuit
(see Note A)
C
L
V
O
V
CC–
V
CC+
R
L
V
I
10 kΩ
100 Ω
NOTE A: C
L
includes fixture capacitance.
+
–
+
–
V
CC+
V
CC–
Picoammeters
Ground Shield
Figure 5. Input-Bias and Offset-Current Test Circuit