3-92
TELCOM SEMICONDUCTOR, INC.
ABSOLUTE MAXIMUM RATINGS*
Positive Supply Voltage (GND to V
+
) ..................... +6.2V
Negative Supply voltage (GND to V
–
) ....................... –9V
Analog Input Voltage (Low to High) (Note 1)....... V
+
to V
–
Reference Input Voltage (Low to High (Note 1) .. V
+
to V
–
Digital Input Voltage (Pins 2–27) (Note 2) ..... GND –0.3V
Power Dissipation, T
A
< 70°C, (Note 3)
CerDIP ............................................................. 2.29W
Plastic DIP ....................................................... 1.23W
PLCC ............................................................... 1.23W
PQFP ............................................................... 1.00W
Operating Temperature Range
Plastic Package (C)...............................0°C to +70°C
Ceramic Package (I) ....................... – 25°C to +85°C
(M) ................... – 55°C to +125°C
Storage Temperature Range ............... – 65°C to +150°C
Lead Temperature (Soldering, 10 sec) ................. +300°C
ELECTRICAL CHARACTERISTICS: All parameters with V
+
= +5V, V
–
= –5V, GND = 0V, T
A
= +25°C,
unless otherwise indicated.
Symbol Parameter Test Conditions Min Typ Max Unit
Analog
Overload Recovery Time — 0 1 Measurement
(TC7109A) Cycle
Zero Input Reading V
IN
= 0V – 0000
8
±0000
8
+0000
8
Octal Reading
Full Scale = 409.6 mV
Ratio Metric Reading V
IN
= V
REF
3777
8
3777
8
4000
8
Octal Reading
V
REF
= 204.8 mV 4000
8
NL Nonlinearity (Max Deviation Full Scale = 409.6 mV to –1 ±0.2 +1 Count
From Best Straight Line Fit) 2.048V Over Full Operating
Temperature Range
Roll-Over Error (Difference in Full Scale = 409.6 mV to –1 ±0.02 +1 Count
Reading for Equal Positive and 2.048V Over Full Operating
Negative Inputs Near (Full Scale) Temperature Range
CMRR Input Common-Mode V
CM
±1V, V
IN
= 0V — 50 — µV/V
Rejection Ratio Full Scale = 409.6 mV
V
CMR
Common-Mode Voltage Input High, Input Low, V
–
+1.5 — V
+
–1 V
Range and Common Pins
e
N
Noise (P-P Value Not V
IN
= 0V — 15 — µV
Exceeded 95% of Time) Full Scale = 409.6 mV
I
IN
Leakage Current at Input V
IN
, All Packages: +25°C—110pA
C Device: 0°C ≤ T
A
≤ +70°C 20 100 pA
I Device: –25°C ≤ T
A
≤ +85°C 100 250 pA
M Device: –55°C ≤ T
A
≤ +125°C25nA
TC
ZS
Zero Reading Drift V
IN
= 0V — 0.2 1 µV/°C
TC
FS
Scale-Factor V
IN
= 408.9 mV = >7770
8
—15µV/°C
Temperature Coefficient Reading, Ext Ref = 0 ppm/°C
I
+
Supply Current V
IN
= 0V, Crystal Oscillator — 700 1500 µA
(V
+
to GND) 3.58 MHz Test Circuit
I
S
Supply Current (V
+
to V
–
) Pins 2–21, 25, 26, 27, 29 Open — 700 1500 µA
*Static-sensitive device. Unused devices must be stored in conductive
material. Protect devices from static discharge and static fields. Stresses
above those listed under Absolute Maximum Ratings may cause perma-
nent damage to the device. These are stress ratings only and functional
operation of the device at these or any other conditions above those
indicated in the operational sections of the specifications is not implied.
Exposure to Absolute Maximum Rating Conditions for extended periods
may affect device reliability.
NOTES: 1. Input voltages may exceed supply voltages if input current is
limited to ±100 µA.
2. Connecting any digital inputs or outputs to voltages greater
than V
+
or less than GND may cause destructive device latch-
up. Therefore, it is recommended that inputs from sources
other than the same power supply should not be applied to
the TC7109A before its power supply is established. In
multiple supply systems, the supply to the device should be
activated first.
3. This limit refers to that of the package and will not occur during
normal operation.
TC7109
TC7109A
12-BIT
µP-COMPATIBLE
ANALOG-TO-DIGITAL CONVERTERS
