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NX29F010-70PL

Part # NX29F010-70PL
Description 1M-BIT (128K x 8-bit)CMOS, 5.0V 32PIN PLCC
Category IC
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NEX FLASH
Date Code: 9952
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Technical Document


DISCLAIMER: The information provided herein is solely for informational purposes. Customers must be aware of the suitability of this product for their application, and consider that variable factors such as Manufacturer, Product Category, Date Codes, Pictures and Descriptions may differ from available inventory.

NexFlash Technologies, Inc.
1
NXPF001F-0600
06/22/00 ©
This document contains PRELIMINARY data. NexFlash reserves the right to make changes to its products at any time without notice in order to improve design and supply the best possible product. We
assume no responsibility for any errors which may appear in this publication. © Copyright 1998, NexFlash Technologies, Inc..
NX29F010
1M-BIT (128K x 8-bit)
CMOS, 5.0V Only
ULTRA-FAST SECTORED FLASH MEMORY
FEATURES
Ultra-fast Performance
35, 45, 55, 70, and 90 ns max. access times
Temperature Ranges
Commercial 0
o
c-70
o
c
Industrial -40
o
c-85
o
c
Single 5V-only Power Supply
5V ± 10% for Read, Program, and Erase
CMOS Low Power Consumption
20 mA (typical) active read current
30 mA (typical) Program/Erase current
Compatible with JEDEC-Standard Pinouts
32-pin DIP, PLCC, TSOP
Program/function Compatible with AM29F010
No system firmware changes
Uses same PROM programer algorithm
Flexible sector architecture
Erase any of eight uniform sectors or full chip erase
Sector protection/unprotection using PROM
programming equipment
100,000 Program/Erase cycles
Embedded algorithms
Automatically programs and verifies data at
specified address
Auto-programs and erases the chip or any
designated sector
Data/Polling and Toggle Bits
Detect program or erase cycle completion
JUNE 2000
DESCRIPTION
The
NexFlash
NX29F010 is a 1 Megabit (131,072 bytes)
single 5.0V-only Sectored Flash Memory. The NX29F010
provides in-system programming with the standard system
5.0V-only Vcc supply and can be programmed or erased in
standard PROM programmers.
The NX29F010 offers access times of 35, 45, 55, 70, and
90 ns allowing high-speed controller and DSPs' to operate
without wait states. Byte-wide data appears on DQ0-DQ7.
Separate chip enable (CE), write enable (WE), and output
enable (OE) controls eliminates bus contention.
Power consumption is greatly reduced when the system
places the device into the Standby Mode.
The device is offered in 32-pin PLCC, TSOP, and PDIP
packages.
Principles of Operation
Only a single 5.0V power supply is required for both read and
write functions. Program or erase operations do not require
12.0V VPP. Internally generated and regulated voltages are
provided for the program and erase operations.
The device is entirely command set compatible with the
JEDEC single power supply Flash standard. Commands
are written to the command register using standard micro-
processor write timings. Register contents serve as input to
an internal state machine that controls the erase and
programming circuitry. Write cycles also internally latch
addresses and data needed for the programming and
erase operations. Reading data out of the device is similar
to reading from other Flash or EPROM devices.
Executing the Program Command Sequence invokes the
Embedded Program Algorithm, an internal algorithm that
automatically times the program pulse widths and verifies
proper cell margin.
NX29F010
2
NexFlash Technologies, Inc.
NXPF001F-0600
06/22/00 ©
WE
STATE
CONTROL
COMMAND
REGISTER
CE
OE
PGM VOLTAGE
GENERATOR
CHIP ENABLE/
OUTPUT ENABLE
LOGIC
ERASE VOLTAGE
GENERATOR
INPUT/OUTPUT
BUFFERS
DATA
LATCH
STB
STB
Y-DECODER
X-DECODER
ADDRESS LATCH
Y-GATING
CELL
MATRIX
VCC
DETECTOR
TIMER
VCC
GND
A0-A16
DQ7-DQ0
8
8
8
8
8
8
Figure 1. NX29F010 Block Diagram
Executing the Erase Command Sequence invokes the
Embedded Erase Algorithm, an internal algorithm that
automatically pre-programs the array to all zeros (if it is not
already programmed) before executing the erase operation.
During erase, the device automatically times the erase
pulse widths and verifies proper cell margin during erase.
By reading the DQ7 (Data Polling) and DQ6 (toggle) status
bits, the host system can detect whether a program or erase
operation is complete. After completion, the device is ready
to read array data or accept another command.
The sector erase architecture is designed to allow memory
sectors to be erased and reprogrammed without affecting
the data contents of other sectors. The device is erased
before it is shipped to customers.
The hardware data protection includes a low Vcc detector
that automatically inhibits write operations during power
transitions. The hardware sector protection feature will
disable both program and erase operations in any combina-
tion of the sectors of memory, and is implemented using
standard EPROM programming algorithm.
The device electrically erases all bits within a sector
simultaneously via Fowler-Nordheim tunneling. Data are
programmed one byte at a time using the EPROM program-
ming algorithm of hot electron injection.
NX29F010
NexFlash Technologies, Inc.
3
NXPF001F-0600
06/22/00 ©
Table 1. Pin Descriptions
A0-A16 Address Inputs
DQ0-DQ7 Data Inputs/Outputs
CE Chip Enable Input
OE Output Enable Input
WE Write Enable Input
Vcc Power Supply Voltage
GND Ground
NC No Internal Connection
DQ1
DQ2
GND
DQ3
DQ4
DQ5
DQ6
A12
A15
A16
NC
VCC
WE
NC
A14
A13
A8
A9
A11
OE
A10
CE
DQ7
A7
A6
A5
A4
A3
A2
A1
A0
DQ0
5
6
7
8
9
10
11
12
13
29
28
27
26
25
24
23
22
21
INDEX
4321323130
14 15 16 17 18 19 20
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
32
31
30
29
28
27
26
25
24
23
22
21
20
19
18
17
A11
A9
A8
A13
A14
NC
WE
VCC
NC
A16
A15
A12
A7
A6
A5
A4
OE
A10
CE
DQ7
DQ6
DQ5
DQ4
DQ3
GND
DQ2
DQ1
DQ0
A0
A1
A2
A3
Figure 3. NX29F010 32-pin PLCC
Figure 4. NX29F010 32-pin TSOP
Figure 2. NX29F010 32-pin Plastic DIP
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
32
31
30
29
28
27
26
25
24
23
22
21
20
19
18
17
NC
A16
A15
A12
A7
A6
A5
A4
A3
A2
A1
A0
DQ0
DQ1
DQ2
GND
VCC
WE
NC
A14
A13
A8
A9
A11
OE
A10
CE
DQ7
DQ6
DQ5
DQ4
DQ3
PIN CONFIGURATIONS
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