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HCTS393DMSR

Part # HCTS393DMSR
Description RAD HARD DUAL 4-STAGE BINARYCOUNTER,DP,200K,TTL,CLS V - R
Category IC
Availability In Stock
Qty 9
Qty Price
1 - 1 $460.73512
2 - 2 $366.49385
3 - 3 $345.55134
4 - 6 $321.11842
7 + $286.21424
Manufacturer Available Qty
Harris Corporation
Date Code: 9235
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Technical Document


DISCLAIMER: The information provided herein is solely for informational purposes. Customers must be aware of the suitability of this product for their application, and consider that variable factors such as Manufacturer, Product Category, Date Codes, Pictures and Descriptions may differ from available inventory.

672
CAUTION: These devices are sensitive to electrostatic discharge; follow proper IC Handling Procedures.
1-888-INTERSIL or 321-724-7143 | Copyright © Intersil Corporation 1999
Ordering Information
PART NUMBER TEMPERATURE RANGE SCREENING LEVEL PACKAGE
HCTS393DMSR -55
o
C to +125
o
C Intersil Class S Equivalent 14 Lead SBDIP
HCTS393KMSR -55
o
C to +125
o
C Intersil Class S Equivalent 14 Lead Ceramic Flatpack
HCTS393D/Sample +25
o
C Sample 14 Lead SBDIP
HCTS393K/Sample +25
o
C Sample 14 Lead Ceramic Flatpack
HCTS393HMSR +25
o
C Die Die
HCTS393MS
Radiation Hardened
Dual 4-Stage Binary Counter
Pinouts
14 LEAD CERAMIC DUAL-IN-LINE
METAL SEAL PACKAGE (SBDIP)
MIL-STD-1835 CDIP2-T14
TOP VIEW
14 LEAD CERAMIC METAL SEAL
FLATPACK PACKAGE (FLATPACK)
MIL-STD-1835 CDFP3-F14
TOP VIEW
CP 1
MR 1
Q0 1
Q1 1
Q2 1
Q3 1
GND
VCC
2
CP
2 MR
2 Q0
2 Q1
2 Q2
2 Q3
1
2
3
4
5
6
7
14
13
12
11
10
9
8
14
13
12
11
10
9
8
2
3
4
5
6
7
1CP 1
MR 1
Q0 1
Q1 1
Q2 1
Q3 1
GND
VCC
2
CP
2 MR
2 Q0
2 Q1
2 Q2
2 Q3
Features
3 Micron Radiation Hardened CMOS SOS
Total Dose 200K RAD (Si)
SEP Effective LET No Upsets: >100 MEV-cm
2
/mg
Single Event Upset (SEU) Immunity < 2 x 10
-9
Errors/
Bit-Day (Typ)
Dose Rate Survivability: >1 x 10
12
RAD (Si)/s
Dose Rate Upset >10
10
RAD (Si)/s 20ns Pulse
Latch-Up Free Under Any Conditions
Fanout (Over Temperature Range)
- Standard Outputs: 10 LSTTL Loads
Military Temperature Range: -55
o
C to +125
o
C
Significant Power Reduction Compared to LSTTL ICs
DC Operating Voltage Range: 4.5V to 5.5V
LSTTL Input Compatibility
- VIL = 0.8V Max
- VIH = VCC/2 Min
Input Current Levels Ii 5µA at VOL, VOH
Description
The Intersil HCTS393MS is a Radiation Hardened 4-stage
riple-carry binary counter. All counter stages are master-
slave flip-flop. The state of the stage advances one count on
the negative transition of each clock pulse. A high voltage
level on the MR line resets all counters to their zero state. All
inputs and outputs are buffered.
The HCTS393MS utilizes advanced CMOS/SOS technology
to achieve high-speed operation. This device is a member of
radiation hardened, high-speed, CMOS/SOS Logic Family.
The HCTS393MS is supplied in a 14 lead Ceramic flatpack
(K suffix) or a SBDIP Package (D suffix).
August 1995
Spec Number
518633
File Number 3071.1
DB NA
673
Functional Diagram
Q
R
Q
φ
φ
MR
CP
1(13)
2(12)
Q
R
Q
φ
φ
Q
R
Q
φ
φ
Q
R
Q
φ
φ
3(11) 4(10) 5(9) 6(8)
Q0 Q1 Q2 Q3
TRUTH TABLE
CP
COUNT
OUTPUTS
Q0 Q1 Q2 Q3
0LLLL
1HLLL
2LHLL
3HHLL
4LLHL
5HLHL
6LHHL
7HHHL
8LLLH
9HLLH
10 L H L H
11 H H L H
12 L L H H
13 H L H H
14LHHH
15HHHH
TRUTH TABLE
CP MR OUTPUT
L No Change
L Count
X H L L L L
H = High Lvel
L = Low Logic Level
X = Immaterial
= Low-to-High
= High-to-Low
HCTS393MS
Spec Number 518633
674
Specifications HCTS393MS
Absolute Maximum Ratings Reliability Information
Supply Voltage (VCC). . . . . . . . . . . . . . . . . . . . . . . . . -0.5V to +7.0V
Input Voltage Range, All Inputs . . . . . . . . . . . . .-0.5V to VCC +0.5V
DC Input Current, Any One Input . . . . . . . . . . . . . . . . . . . . . . . .±10mA
DC Drain Current, Any One Output. . . . . . . . . . . . . . . . . . . . . . .±25mA
(All Voltage Reference to the VSS Terminal)
Storage Temperature Range (TSTG) . . . . . . . . . . . -65
o
C to +150
o
C
Lead Temperature (Soldering 10sec) . . . . . . . . . . . . . . . . . . +265
o
C
Junction Temperature (TJ) . . . . . . . . . . . . . . . . . . . . . . . . . . +175
o
C
ESD Classification . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Class 1
Thermal Resistance θ
JA
θ
JC
SBDIP Package. . . . . . . . . . . . . . . . . . . . 74
o
C/W 24
o
C/W
Ceramic Flatpack Package . . . . . . . . . . . 116
o
C/W 30
o
C/W
Maximum Package Power Dissipation at +125
o
C Ambient
SBDIP Package. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 0.68W
Ceramic Flatpack Package . . . . . . . . . . . . . . . . . . . . . . . . . 0.43W
If device power exceeds package dissipation capability, provide heat
sinking or derate linearly at the following rate:
SBDIP Package. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 13.5mW/
o
C
Ceramic Flatpack Package . . . . . . . . . . . . . . . . . . . . . . 8.6mW/
o
C
CAUTION: As with all semiconductors, stress listed under “Absolute Maximum Ratings” may be applied to devices (one at a time) without resulting in permanent
damage. This is a stress rating only. Exposure to absolute maximum rating conditions for extended periods may affect device reliability. The conditions listed
under “Electrical Performance Characteristics” are the only conditions recommended for satisfactory device operation.
Operating Conditions
Supply Voltage . . . . . . . . . . . . . . . . . . . . . . . . . . . . . +4.5V to +5.5V
Input Rise and Fall Times at 4.5V VCC (tr, tf) . . . . . . . . .500ns Max
Operating Temperature Range (T
A
) . . . . . . . . . . . . -55
o
C to +125
o
C
Input Low Voltage (VIL). . . . . . . . . . . . . . . . . . . . . . . . . 0.0V to 0.8V
Input High Voltage (VIH) . . . . . . . . . . . . . . . . . . . . . . .VCC/2 to VCC
TABLE 1. DC ELECTRICAL PERFORMANCE CHARACTERISTICS
PARAMETER SYMBOL
(NOTE 1)
CONDITIONS
GROUP
A SUB-
GROUPS TEMPERATURE
LIMITS
UNITSMIN MAX
Quiescent Current ICC VCC = 5.5V,
VIN = VCC or GND
1 +25
o
C-40µA
2, 3 +125
o
C, -55
o
C - 750 µA
Output Current
(Sink)
IOL VCC = 4.5V, VIH = 4.5V,
VOUT = 0.4V, VIL = 0V
1 +25
o
C 4.8 - mA
2, 3 +125
o
C, -55
o
C 4.0 - mA
Output Current
(Source)
IOH VCC = 4.5V, VIH = 4.5V,
VOUT = VCC - 0.4V,
VIL = 0V
1 +25
o
C -4.8 - mA
2, 3 +125
o
C, -55
o
C -4.0 - mA
Output Voltage Low VOL VCC = 4.5V, VIH = 2.25V,
IOL = 50µA, VIL = 0.8V
1, 2, 3 +25
o
C, +125
o
C, -55
o
C - 0.1 V
VCC = 5.5V, VIH = 2.75V,
IOL = 50µA, VIL = 0.8V
1, 2, 3 +25
o
C, +125
o
C, -55
o
C - 0.1 V
Output Voltage High VOH VCC = 4.5V, VIH = 2.25V,
IOH = -50µA, VIL = 0.8V
1, 2, 3 +25
o
C, +125
o
C, -55
o
C VCC
-0.1
-V
VCC = 5.5V, VIH = 2.75V,
IOH = -50µA, VIL = 0.8V
1, 2, 3 +25
o
C, +125
o
C, -55
o
C VCC
-0.1
-V
Input Leakage
Current
IIN VCC = 5.5V, VIN = VCC or
GND
1 +25
o
C-±0.5 µA
2, 3 +125
o
C, -55
o
C-±5.0 µA
Noise Immunity
Functional Test
FN VCC = 4.5V, VIH = 2.25V,
VIL = 0.8V (Note 2)
7, 8A, 8B +25
o
C, +125
o
C, -55
o
C---
NOTES:
1. All voltages referenced to device GND.
2. For functional tests, VO 4.0V is recognized as a logic “1”, and VO 0.5V is recognized as a logic “0”.
Spec Number 518633
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