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DM7426N

Part # DM7426N
Description Logic Gates Qd 2-Input NAND Buff
Category IC
Availability In Stock
Qty 27
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National Semiconductor Corp
Date Code: 9233
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National Semiconductor Corp
Date Code: 8909
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Technical Document


DISCLAIMER: The information provided herein is solely for informational purposes. Customers must be aware of the suitability of this product for their application, and consider that variable factors such as Manufacturer, Product Category, Date Codes, Pictures and Descriptions may differ from available inventory.

© 2000 Fairchild Semiconductor Corporation DS006508 www.fairchildsemi.com
August 1986
Revised February 2000
DM7426 Quad 2-Input NAND Gates with High Voltage Open-Collector Outputs
DM7426
Quad 2-Input NAND Gates with
High Voltage Open-Collector Outputs
General Description
This device contains four independent gates each of which
performs the logic NAND function. The open-collector out-
puts require external pull-up resistors for proper logical
operation.
Pull-Up Resistor Equations
Where: N
1
(I
OH
) = total maximum output high current
for all outputs tied to pull-up resistor
N
2
(I
IH
) = total maximum input high current for
all inputs tied to pull-up resistor
N
3
(I
IL
) = total maximum input low current for
all inputs tied to pull-up resistor
Ordering Code:
Connection Diagram Function Table
Y = AB
H = HIGH Logic Level
L = LOW Logic Level
Order Number Package Number Package Description
DM7426N N14A 14-Lead Plastic Dual-In-Line Package (PDIP), JEDEC MS-001, 0.300 Wide
Inputs Output
ABY
LLH
LHH
HLH
HHL
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DM7426
Absolute Maximum Ratings(Note 1)
Note 1: The “Absolute Maximum Ratings” are those values beyond which
the safety of the device cannot be guaranteed. The device should not be
operated at these limits. The parametric values defined in the Electrical
Characteristics tables are not guaranteed at the absolute maximum ratings.
The “Recommended Operating Conditions” table will define the conditions
for actual device operation.
Recommended Operating Conditions
Electrical Characteristics
over recommended operating free air temperature range (unless otherwise noted)
Note 2: All typicals are at V
CC
= 5V, T
A
= 25°C.
Switching Characteristics
at V
CC
= 5V and T
A
= 25°C
Supply Voltage 7V
Input Voltage 5.5V
Output Voltage 15V
Operating Free Air Temperature Range 0°C to +70°C
Storage Temperature Range 65°C to +150°C
Symbol Parameter Min Nom Max Units
V
CC
Supply Voltage 4.75 5 5.25 V
V
IH
HIGH Level Input Voltage 2 V
V
IL
LOW Level Input Voltage 0.8 V
V
OH
HIGH Level Output Voltage 15 V
I
OL
LOW Level Output Current 16 mA
T
A
Free Air Operating Temperature 0 70 °C
Symbol Parameter Conditions Min
Typ
Max Units
(Note 2)
V
I
Input Clamp Voltage V
CC
= Min, I
I
= 12 mA 1.5 V
I
CEX
HIGH Level V
CC
= Min V
O
= 15V 1000
µA
Output Current V
IL
= Max V
O
= 12V 50
V
OL
LOW Level V
CC
= Min, I
OL
= Max
0.4 V
Output Voltage V
IH
= Min
I
I
Input Current @ Max V
CC
= Max,
1mA
Input Voltage V
I
= 5.5V
I
IH
High Level Input Current V
CC
= Max, V
I
= 2.4V 40 µA
I
IL
Low Level Input Current V
CC
= Max, V
I
= 0.4V 1.6 mA
I
CCH
Supply Current with Outputs HIGH V
CC
= Max 4 8 mA
I
CCL
Supply Current with Outputs LOW V
CC
= Max 12 22 mA
Symbol Parameter Conditions Min Max Units
t
PLH
Propagation Delay Time C
L
= 15 pF
24 ns
LOW-to-HIGH Level Output R
L
= 1 k (t
PLH
)
t
PHL
Propagation Delay Time
17 ns
HIGH-to-LOW Level Output
3 www.fairchildsemi.com
DM7426 Quad 2-Input NAND Gates with High Voltage Open-Collector Outputs
Physical Dimensions inches (millimeters) unless otherwise noted
14-Lead Plastic Dual-In-Line Package (PDIP), JEDEC MS-001, 0.300 Wide
Package Number N14A
Fairchild does not assume any responsibility for use of any circuitry described, no circuit patent licenses are implied and
Fairchild reserves the right at any time without notice to change said circuitry and specifications.
LIFE SUPPORT POLICY
FAIRCHILD’S PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT
DEVICES OR SYSTEMS WITHOUT THE EXPRESS WRITTEN APPROVAL OF THE PRESIDENT OF FAIRCHILD
SEMICONDUCTOR CORPORATION. As used herein:
1. Life support devices or systems are devices or systems
which, (a) are intended for surgical implant into the
body, or (b) support or sustain life, and (c) whose failure
to perform when properly used in accordance with
instructions for use provided in the labeling, can be rea-
sonably expected to result in a significant injury to the
user.
2. A critical component in any component of a life support
device or system whose failure to perform can be rea-
sonably expected to cause the failure of the life support
device or system, or to affect its safety or effectiveness.
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