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CAT25160VI-G

Part # CAT25160VI-G
Description 16KB SPI SER CMOS EEPROM - Rail/Tube
Category IC
Availability In Stock
Qty 50
Qty Price
1 + $0.16525
Manufacturer Available Qty
CSI
Date Code: 0804
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Technical Document


DISCLAIMER: The information provided herein is solely for informational purposes. Customers must be aware of the suitability of this product for their application, and consider that variable factors such as Manufacturer, Product Category, Date Codes, Pictures and Descriptions may differ from available inventory.

CAT25080, CAT25160
© 2006 Catalyst Semiconductor, Inc. 1 Doc. No. 1122 Rev. A
Characteristics subject to change without notice
8-Kb and 16-Kb SPI Serial CMOS EEPROM
FEATURES
10 MHz SPI compatible
1.8V to 5.5V supply voltage range
SPI modes (0,0) & (1,1)
32-byte page write buffer
Self-timed write cycle
Hardware and software protection
Block write protection
Protect 1/4, 1/2 or entire EEPROM array
Low power CMOS technology
1,000,000 program/erase cycles
100 year data retention
Industrial temperature range
RoHS-compliant 8 lead PDIP, SOIC, TSSOP and
8-pad TDFN, UDFN packages
PIN CONFIGURATION
PDIP (L)
SOIC (V)
TSSOP (Y)
TDFN (VP2)
UDFN (HU2)
CS
¯¯
1 8 V
CC
SO 2 7
HOLD
¯¯¯¯¯
WP
¯¯¯
3 6 SCK
V
SS
4
5 SI
PIN FUNCTION
Pin Name Function
CS
¯¯
Chip Select
SO Serial Data Output
WP
¯¯¯
Write Protect
V
SS
Ground
SI
Serial Data Input
SCK Serial Clock
HOLD
¯¯¯¯¯
Hold Transmission Input
V
CC
Power Supply
DESCRIPTION
The CAT25080/25160 are 8-Kb/16-Kb Serial CMOS
EEPROM devices internally organized as
1024x8/2048x8 bits. They feature a 32-byte page
write buffer and support the Serial Peripheral Interface
(SPI) protocol. The device is enabled through a Chip
Select (CS
¯¯
) input. In addition, the required bus signals
are a clock input (SCK), data input (SI) and data
output (SO) lines. The HOLD
¯¯¯¯¯
input may be used to
pause any serial communication with the
CAT25080/25160 device. These devices feature
software and hardware write protection, including
partial as well as full array protection.
FUNCTIONAL SYMBOL
For Ordering Information details, see page 16.
CS
WP
HOLD
SI
SO
CAT25080
CAT25160
V
CC
GND
SCK
CAT25080, CAT25160
Doc. No. 1122 Rev. A 2 © 2006 Catalyst Semiconductor, Inc.
Characteristics subject to change without notice
ABSOLUTE MAXIMUM RATINGS
(1)
Parameters Ratings Units
Storage Temperature –65 to +150 ºC
Voltage on any Pin with Respect to Ground
(2)
–0.5 to V
CC
+ 0.5 V
RELIABILITY CHARACTERISTICS
(3)
Symbol Parameter Min Units
N
END
(4)
Endurance 1,000,000 Program/ Erase Cycles
T
DR
Data Retention 100 Years
D.C. OPERATING CHARACTERISTICS
V
CC
= +1.8V to +5.5V, T
A
=-40°C to +85°C unless otherwise specified.
Symbol Parameter Test Conditions Min Max Units
I
CC
Supply Current
Read, Write, V
CC
= 5.0V, f
SCK
= 10MHz,
SO open
2 mA
I
SB1
Standby Current
V
IN
= GND or V
CC
, CS
¯¯
= V
CC
, WP
¯¯¯
= V
CC
,
V
CC
= 5.0V
2 µA
I
SB2
Standby Current
V
IN
= GND or V
CC
, CS
¯¯
= V
CC
, WP
¯¯¯
= GND,
V
CC
= 5.0V
4 µA
I
L
Input Leakage Current V
IN
= GND or V
CC
-2 2 µA
I
LO
Output Leakage Current
CS
¯¯
= V
CC
, V
OUT
= GND or V
CC
-1 1 µA
V
IL
Input Low Voltage
-0.5 0.3V
CC
V
V
IH
Input High Voltage
0.7V
CC
V
CC
+ 0.5 V
V
OL1
Output Low Voltage V
CC
> 2.5V, I
OL
= 3.0mA
0.4 V
V
OH1
Output High Voltage V
CC
> 2.5V, I
OH
= -1.6mA V
CC
- 0.8V
V
V
OL2
Output Low Voltage V
CC
> 1.8V, I
OL
= 150µA
0.2 V
V
OH2
Output High Voltage V
CC
> 1.8V, I
OH
= -100µA V
CC
- 0.2V
V
PIN CAPACITANCE
(3)
T
A
= 25˚C, f = 1.0MHz, V
CC
= +5.0V
Symbol Test Conditions Min Typ Max Units
C
OUT
Output Capacitance (SO) V
OUT
= 0V 8 pF
C
IN
Input Capacitance (CS
¯¯
, SCK, SI, WP
¯¯¯
, HOLD
¯¯¯¯¯
)
V
IN
= 0V 8 pF
Notes:
(1) Stresses above those listed under “Absolute Maximum Ratings” may cause permanent damage to the device. These are stress ratings only,
and functional operation of the device at these or any other conditions outside of those listed in the operational sections of this specification is
not implied. Exposure to any absolute maximum rating for extended periods may affect device performance and reliability.
(2) The DC input voltage on any pin should not be lower than -0.5V or higher than V
CC
+ 0.5V. During transitions, the voltage on any pin may
undershoot to no less than -1.5V or overshoot to no more than V
CC
+ 1.5V, for periods of less than 20ns.
(3) These parameters are tested initially and after a design or process change that affects the parameter according to appropriate AEC-Q100 and
JEDEC test methods.
(4) Page Mode, V
CC
= 5V, 25°C
CAT25080, CAT25160
© 2006 Catalyst Semiconductor, Inc. 3 Doc. No. 1122 Rev. A
Characteristics subject to change without notice
A.C. CHARACTERISTICS
T
A
= -40°C to +85°C, unless otherwise specified.
(1)
V
CC
= 1.8V-5.5V V
CC
= 2.5V-5.5V
Symbol Parameter
Min. Max. Min. Max.
Units
f
SCK
Clock Frequency DC 5 DC 10 MHz
t
SU
Data Setup Time 30 20 ns
t
H
Data Hold Time 30 20 ns
t
WH
SCK High Time 75 40 ns
t
WL
SCK Low Time 75 40 ns
t
LZ
HOLD
¯¯¯¯¯
to Output Low Z
50 25 ns
t
RI
(2)
Input Rise Time 2 2 µs
t
FI
(2)
Input Fall Time 2 2 µs
t
HD
HOLD
¯¯¯¯¯
Setup Time
0 0 ns
t
CD
HOLD
¯¯¯¯¯
Hold Time
10 10 ns
t
V
Output Valid from Clock Low 75 40 ns
t
HO
Output Hold Time 0 0 ns
t
DIS
Output Disable Time 50 20 ns
t
HZ
HOLD
¯¯¯¯¯
to Output High Z
100 25 ns
t
CS
CS
¯¯
High Time
50 15 ns
t
CSS
CS
¯¯
Setup Time
50 15 ns
t
CSH
CS
¯¯
Hold Time
50 15 ns
t
WPS
WP
¯¯¯
Setup Time
10 10 ns
t
WPH
WP
¯¯¯
Hold Time
10 10 ns
t
WC
(4)
Write Cycle Time 5 5 ms
Power-Up Timing
(2)(3)
Symbol Parameter Max. Units
t
PUR
Power-up to Read Operation 1 ms
t
PUW
Power-up to Write Operation 1 ms
Notes:
(1) AC Test Conditions:
Input Pulse Voltages: 0.3V
CC
to 0.7V
CC
Input rise and fall times: 10ns
Input and output reference voltages: 0.5V
CC
Output load: current source I
OL max
/I
OH max
; C
L
= 50pF
(2) This parameter is tested initially and after a design or process change that affects the parameter.
(3) t
PUR
and t
PUW
are the delays required from the time V
CC
is stable until the specified operation can be initiated.
(4) t
WC
is the time from the rising edge of CS
¯¯
after a valid write sequence to the end of the internal write cycle.
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