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AT84AD001BITD

Part # AT84AD001BITD
Description ADC DUAL FLASH 1GSPS 8BIT PARALLEL 144LQFP - Trays
Category IC
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Technical Document


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46
AT84AD001B
2153C–BDC–04/04
Figure 50. Simplified Data Ready Reset Buffer Model
Figure 51. Analog Input Model
VCCD/2
100
VCCD
GNDD
DDRB
DDRBN
100
50
50
GND
GND
Vcca
GND
Vcca
Sel Input I
GND
VinI
VinQ
Sel Input Q
VinQ Reverse
Termination
50
ESD
ESD
VinQ
Double
Pad
VinI Double Pad
DC Coupling
(Common Mode = Ground = 0V)
GND – 0.4V
MAX
50
Vinl Reverse
Termination
47
AT84AD001B
2153C–BDC–04/04
Figure 52. Data Output Buffer Model
Definitions of Terms
VCCO
GNDO
DOAIO, DOAI7
DOBIO, DOBI7
DOAION, DOAI7N
DOBION, DOBI7N
Table 16. Definitions of Terms
Abbreviation Definition Description
BER Bit Error Rate
The probability to exceed a specified error threshold for a sample at a maximum specified
sampling rate. An error code is a code that differs by more than ±4 LSB from the correct code
DNL
Differential
Non-Linearity
The differential non-linearity for an output code i is the difference between the measured step
size of code i and the ideal LSB step size. DNL (i) is expressed in LSBs. DNL is the
maximum value of all DNL (i). A DNL error specification of less than 1 LSB guarantees that
there are no missing output codes and that the transfer function is monotonic
ENOB
Effective Number of
Bits
Where A is the actual input amplitude and Fs is
the full scale range of the ADC under test
FPBW
Full Power Input
Bandwidth
The analog input frequency at which the fundamental component in the digitally
reconstructed output waveform has fallen by 3 dB with respect to its low frequency value
(determined by FFT analysis) for input at full-scale -1 dB (-1 dBFS)
IMD
Inter-Modulation
Distortion
The two tones intermodulation distortion (IMD) rejection is the ratio of either of the two input
tones to the worst third order intermodulation products
INL
Integral
Non-Linearity
The integral non-linearity for an output code i is the difference between the measured input
voltage at which the transition occurs and the ideal value of this transition. INL (i) is
expressed in LSBs and is the maximum value of all |INL (i)|
JITTER
Aperture
uncertainty
The sample-to-sample variation in aperture delay. The voltage error due to jitters depends on
the slew rate of the signal at the sampling point
NPR Noise Power Ratio
The NPR is measured to characterize the ADC’s performance in response to broad
bandwidth signals. When applying a notch-filtered broadband white noise signal as the input
to the ADC under test, the Noise Power Ratio is defined as the ratio of the average out-of-
notch to the average in-notch power spectral density magnitudes for the FFT spectrum of the
ADC output sample test
ENOB
SINAD 1.76 20
A
Fs/2
-----------
log+
6.02
-----------------------------------------------------------------------------=
48
AT84AD001B
2153C–BDC–04/04
ORT
Overvoltage
Recovery Time
The time to recover a 0.2% accuracy at the output, after a 150% full-scale step applied on
the input is reduced to midscale
PSRR
Power Supply
Rejection Ratio
The ratio of input offset variation to a change in power supply voltage
SFDR
Spurious Free
Dynamic Range
The ratio expressed in dB of the RMS signal amplitude, set at 1 dB below full-scale, to the
RMS value of the highest spectral component (peak spurious spectral component). The peak
spurious component may or may not be a harmonic. It may be reported in dB (related to the
converter -1 dB full-scale) or in dBc (related to the input signal level)
SINAD
Signal to Noise and
Distortion Ratio
The ratio expressed in dB of the RMS signal amplitude, set to 1 dB below full-scale (-1
dBFS) to the RMS sum of all other spectral components including the harmonics, except DC
SNR
Signal to Noise
Ratio
The ratio expressed in dB of the RMS signal amplitude, set to 1 dB below full-scale, to the
RMS sum of all other spectral components excluding the first 9 harmonics
SSBW
Small Signal Input
Bandwidth
The analog input frequency at which the fundamental component in the digitally
reconstructed output waveform has fallen by 3 dB with respect to its low frequency value
(determined by FFT analysis) for input at full-scale -10 dB (-10 dBFS)
TA Aperture delay
The delay between the rising edge of the differential clock inputs (CLK, CLKB) [zero crossing
point] and the time at which VIN and VINB are sampled
TC
Encoding Clock
period
TC1 = minimum clock pulse width (high)
TC = TC1 + TC2
TC2 = minimum clock pulse width (low)
TD1
Time Delay from
Data Transition to
Data Ready
The general expression is TD1 = TC1 + TDR - TDO with TC = TC1 + TC2 = 1 encoding clock
period
TD2
Time Delay from
Data Ready to
Data
The general expression is TD2 = TC2 + TDR - TDO with TC = TC1 + TC2 = 1 encoding clock
period
TDO
Digital Data Output
Delay
The delay from the rising edge of the differential clock inputs (CLK, CLKB) [zero crossing
point] to the next point of change in the differential output data (zero crossing) with a
specified load
TDR
Data Ready Output
Delay
The delay from the falling edge of the differential clock inputs (CLK, CLKB) [zero crossing
point] to the next point of change in the differential output data (zero crossing) with a
specified load
TF Fall Time
The time delay for the output data signals to fall from 20% to 80% of delta between the low
and high levels
THD
Total Harmonic
Distortion
The ratio expressed in dB of the RMS sum of the first 9 harmonic components to the RMS
input signal amplitude, set at 1 dB below full-scale. It may be reported in dB (related to the
converter -1 dB full-scale) or in dBc (related to the input signal level )
TPD Pipeline Delay
The number of clock cycles between the sampling edge of an input data and the associated
output data made available (not taking into account the TDO)
TR Rise Time The time delay for the output data signals to rise from 20% to 80% of delta between the low
and high levels
Table 16. Definitions of Terms (Continued)
Abbreviation Definition Description
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