Philips Semiconductor ABT22V10A5A

Cross Number:

Item Description:

Qty Price
1 - 2 $19.80000
3 + $15.45000



Other Cross Reference

Manufacturer Date Code Qty Available Qty
Philips Semiconductor 9535
  • Freelance Stock: 4
    Ships Immediately





Technical Document


DISCLAIMER: The information provided herein is solely for informational purposes. Customers must be aware of the suitability of this product for their application, and consider that variable factors such as Manufacturer, Product Category, Date Codes, Pictures and Descriptions may differ from available inventory.

ABT22V10A5, A7
5V high-speed universal PLD device
with live insertion capability
Product specification 1996 Dec 16
INTEGRATED CIRCUITS
IC13 Data Handbook
Philips Semiconductors
Product specification
ABT22V10A5, A7
5V high-speed universal PLD device
with live insertion capability
2
1996 Dec 16 853–1795 17606
DESCRIPTION
The ABT22V10A is a versatile PAL device fabricated on Philips
BiCMOS process known as QUBiC.
The QUBiC process produces very high speed, 5 volt devices
(5.0ns) which have excellent noise immunity. The ground bounce of
an output held low while the 9 remaining outputs are switching is
less than 1.0V (typical).
The ABT22V10A outputs are designed to support Live
Insertion/Extraction into powered-up systems. The output is
specially designed so that during V
CC
ramp, the output remains
3-Stated until V
CC
2.1V. At that time, the outputs become fully
functional, depending upon device inputs. (See DC Electrical
Characteristics, Symbol I
PU/PD
, Page 4).
The ABT family of devices have virtually no ground bounce— less
than 1.0 volts V
OLP
, measured on an unswitched output (9 remaining
outputs switching, each with a 50pF load tied to ground).
The ABT family of devices has been designed with high drive
outputs (48mA sink and 16mA source currents), which allow for
direct connection to a backplane bus. This feature eliminates the
need for additional, standalone bus drivers, which are traditionally
required to boost the drive of a standard 16/–4mA PLDs.
Philips has developed a new means of testing the integrity of fuses,
both blown and intact fuses, which insures that all the fuses have
been correctly programmed and that each and every fuse—whether
“blown” or “intact”—is at the appropriate and optimal fuse resistance.
This dual verify scheme represents a significant improvement over
single reference voltage comparison schemes that have been used
for bipolar devices since the late 1980’s.
The ABT22V10A uses the familiar AND/OR logic array structure,
which allows direct implementation of sum-of-products equations.
This device has a programmable AND array, which drives a fixed
OR array. The OR sum-of-products feeds an “Output Macro Cell”
(OMC) that can be individually configured as a dedicated input, a
combinatorial output, or a registered output with internal feedback.
FEATURES
Fastest 5V 22V10
Low ground bounce (<1.0V typical)
Live insertion/extraction permitted
High output drive capability: 48mA/–16mA
Varied product term distribution with up to 16 product terms per
output for complex functions
Metastable hardened flip-flops
Programmable output polarity
Design support provided for third party CAD development and
programming hardware
Improved fuse verification circuitry increases reliability
PIN CONFIGURATIONS
V
CC
1234
5
6
7
8
9
10
11
12 13 14 15 16 17 18
19
20
21
22
23
24
25
262728
GND
A Package
GND
I7
CLK/
I0
I1I2
I3
I4
I5
GND
I6
I8
I9 I10
GND
I11 F0 F1
F2
F3
F7
F6
F5
F4
F8F9
A = Plastic Leaded Chip Carrier
V
CC
SP00367
PIN LABEL DESCRIPTIONS
SYMBOL FUNCTION
I1 – I11 Dedicated Input
F0 – F9 Macro Cell Input/Output
CLK/I0 Clock Input/Dedicated Input
V
CC
Supply Voltage
GND Ground
ORDERING INFORMATION
DESCRIPTION ORDER CODE DRAWING NUMBER
28-Pin Plastic Leaded Chip Carrier
ABT22V10A5A (5ns device)
SOT261-3
28-Pin Plastic Leaded Chip Carrier
ABT22V10A7A (7.5ns device)
SOT261-3
PAL is a registered trademark of Advanced Micro Devices, Inc.
Philips Semiconductors Product specification
ABT22V10A5, A7
5V high-speed universal PLD device
with live insertion capability
1996 Dec 16
3
ABSOLUTE MAXIMUM RATINGS
1
SYMBOL
PARAMETER
RATINGS
UNIT
SYMBOL
PARAMETER
MIN MAX
UNIT
V
CC
Supply voltage
2
–0.5 +7.0 V
DC
V
IN
Input voltage
2
–1.2 V
CC
+ 0.5 V
DC
V
OUT
Output voltage –0.5 V
CC
+ 0.5 V
DC
I
IN
Input currents –30 +30 mA
I
OUT
Output currents +100 mA
T
stg
Storage temperature range –65 +150 °C
NOTES:
1. Stresses above those listed may cause malfunction or permanent damage to the device. This is a stress rating only. Functional operation at
these or any other condition above those indicated in the operational and programming specification of the device is not implied.
2. Except in programming mode.
OPERATING RANGES
SYMBOL
PARAMETER
RATINGS
UNIT
SYMBOL
PARAMETER
MIN MAX
UNIT
V
CC
Supply voltage +4.75 +5.25 V
DC
T
amb
Operating free-air temperature 0 +75 °C
THERMAL RATINGS
TEMPERATURE
Maximum junction 150°C
Maximum ambient 75°C
Allowable thermal rise ambient to junction 75°C
VOLTAGE WAVEFORM
90%
10%
1.5ns1.5ns
+3.0V
0V
t
R
t
F
MEASUREMENTS:
All circuit delays are measured at the +1.5V level of
inputs and outputs, unless otherwise specified.
Input Pulses
SP00368
TEST LOAD CIRCUIT
+5V
C
L
R
1
R
2
S
1
C
2
C
1
NOTE:
C
1
and C
2
are to bypass V
CC
to GND.
V
CC
GND
CK
I
n
I
0
F
0
F
n
DUT
OE
INPUTS
SP00369
123456NEXT

Freelance Electronics
13197 Sandoval Street
Santa Fe Springs, CA 90670

Hours of Operation
Monday-Friday 7:30am-4:30pm PST
(Deadline for next day shipment 2:00pm PST)

Trustworthy Standards Serving the Electronic Components
Industry since 1986

Government Cage code#-1V4R6
Duns Number# 788130532
Certified Small Disadvantaged Business