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74LVC125D

Part # 74LVC125D
Description
Category IC
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Philips Semiconductor
Date Code: 9519
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Technical Document


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74LVC125
Quad buffer/line driver; 3-State
Product specification
Supersedes data of February 1996
IC24 Data Handbook
1997 Mar 18
INTEGRATED CIRCUITS
Philips Semiconductors Product specification
74LVC125Quad buffer/line driver; 3-State
2
1997 Mar 18 853–1951 17865
FEATURES
Wide supply voltage range of 1.2 to 3.6 V
In accordance with JEDEC standard no. 8-1A
Inputs accept voltages up to 5.5 V
CMOS lower power consumption
Direct interface with TTL levels
Output drive capability 50 transmission lines at 85°C
DESCRIPTION
The 74LVC125 is a high performance, low-power, low-voltage
Si-gate CMOS device and superior to most advanced CMOS
compatible TTL families.
The 74LVC125 consists of four non-inverting buffers/line drivers with
3-State outputs. The 3-State outputs (nY) are controlled by the
output enable input (nOE
). A HIGH at nOE causes the outputs to
assume a high impedance OFF-state.
QUICK REFERENCE DATA
GND = 0 V; T
amb
= 25°C; t
r
= t
f
2.5 ns
SYMBOL
PARAMETER CONDITIONS TYPICAL UNIT
t
PHL
/t
PLH
Propagation delay
nA to nY
C
L
= 15 pF;
V
CC
= 3.3 V
3.5 ns
C
I
Input capacitance 5.0 pF
C
PD
Power dissipation capacitance per buffer Notes 1 and 2 22 pF
NOTES:
1. C
PD
is used to determine the dynamic power dissipation (P
D
in µW)
P
D
= C
PD
× V
CC
2
× f
i
+Σ (C
L
× V
CC
2
× f
o
) where:
f
i
= input frequency in MHz; C
L
= output load capacity in pF;
f
o
= output frequency in MHz; V
CC
= supply voltage in V;
Σ (C
L
× V
CC
2
× f
o
) = sum of the outputs.
2. The condition is V
I
= GND to V
CC
ORDERING INFORMATION
PACKAGES TEMPERATURE RANGE OUTSIDE NORTH AMERICA NORTH AMERICA PKG. DWG. #
14-Pin Plastic SO –40°C to +85°C 74LVC125 D 74LVC125 D SOT108-1
14-Pin Plastic SSOP Type II –40°C to +85°C 74LVC125 DB 74LVC125 DB SOT337-1
14-Pin Plastic TSSOP Type I –40°C to +85°C 74LVC125 PW 74LVC125PW DH SOT402-1
PIN CONFIGURATION
SV00455
1
2
3
4
5
6
7
1OE
1A
1Y
2OE
2A
2Y
GND
V
CC
4OE
4A
4Y
3OE
3A
3Y
14
13
12
11
10
9
8
PIN DESCRIPTION
PIN
NUMBER
SYMBOL NAME AND FUNCTION
1, 4, 10, 13 1OE – 4OE Data enable inputs (active LOW)
2, 5, 9, 12 1A – 4A Data inputs
3, 6, 8, 11 1Y – 4Y Data Outputs
7 GND Ground (0 V)
14 V
CC
Positive supply voltage
LOGIC SYMBOL
SV00456
1Y
2Y
3Y
4Y
1
2
3
1OE
1A
4
5
6
2OE
2A
10
9
8
3OE
3A
13
12
11
4OE
4A
Philips Semiconductors Product specification
74LVC125Quad buffer/line driver; 3-State
1997 Mar 18
3
FUNCTION TABLE
INPUTS OUTPUT
nOE nA nY
L L L
L H H
H X Z
NOTES:
H = HIGH voltage level
L = LOW voltage level
X = don’t care
Z = high impedance OFF-state
LOGIC SYMBOL (IEEE/IEC)
SV00457
1
2
EN1
1
3
4
5
6
10
9
8
13
12
11
RECOMMENDED OPERATING CONDITIONS
SYMBOL
PARAMETER
CONDITIONS
LIMITS
UNIT
SYMBOL
PARAMETER
CONDITIONS
MIN MAX
UNIT
V
CC
DC supply voltage (for max. speed performance) 2.7 3.6 V
V
CC
DC supply voltage (for low-voltage applications) 1.2 3.6 V
V
I
DC input voltage range 0 5.5 V
V
I/O
DC input voltage range for I/Os 0 V
CC
V
V
O
DC output voltage range 0 V
CC
V
T
amb
Operating free-air temperature range –40 +85 °C
t
r
, t
f
Input rise and fall times
V
CC
= 1.2 to 2.7V
V
CC
= 2.7 to 3.6V
0
0
20
10
ns/V
ABSOLUTE MAXIMUM RATINGS
1
In accordance with the Absolute Maximum Rating System (IEC 134).
Voltages are referenced to GND (ground = 0 V).
SYMBOL
PARAMETER CONDITIONS RATING UNIT
V
CC
DC supply voltage –0.5 to +6.5 V
I
IK
DC input diode current V
I
0 –50 mA
V
I
DC input voltage Note 2 –0.5 to +5.5 V
V
I/O
DC input voltage range for I/Os –0.5 to V
CC
+0.5 V
I
OK
DC output diode current V
O
V
CC
or V
O
0 50 mA
V
OUT
DC output voltage Note 2 –0.5 to V
CC
+0.5 V
I
OUT
DC output source or sink current V
O
= 0 to V
CC
50 mA
I
GND
, I
CC
DC V
CC
or GND current 100 mA
T
stg
Storage temperature range –60 to +150 °C
Power dissipation per package
P
TOT
– plastic mini-pack (SO) above +70°C derate linearly with 8 mW/K 500
mW
– plastic shrink mini-pack (SSOP and TSSOP) above +60°C derate linearly with 5.5 mW/K 500
mW
NOTES:
1. Stresses beyond those listed may cause permanent damage to the device. These are stress ratings only and functional operation of the
device at these or any other conditions beyond those indicated under “recommended operating conditions” is not implied. Exposure to
absolute-maximum-rated conditions for extended periods may affect device reliability.
2. The input and output voltage ratings may be exceeded if the input and output current ratings are observed.
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