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74FCT244P

Part # 74FCT244P
Description
Category IC
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Technical Document


DISCLAIMER: The information provided herein is solely for informational purposes. Customers must be aware of the suitability of this product for their application, and consider that variable factors such as Manufacturer, Product Category, Date Codes, Pictures and Descriptions may differ from available inventory.

MILITARY AND INDUSTRIAL TEMPERATURE RANGES
IDT54/74FCT273T/AT/CT
FAST CMOS OCTAL D FLIP-FLOP WITH MASTER RESET
1
JUNE 2002MILITARY AND INDUSTRIAL TEMPERATURE RANGES
The IDT logo is a registered trademark of Integrated Device Technology, Inc.
© 2002 Integrated Device Technology, Inc. DSC-2568/2
FEATURES:
Std., A, and C grades
Low input and output leakage
1µA (max.)
CMOS power levels
True TTL input and output compatibility:
–VOH = 3.3V (typ.)
–VOL = 0.3V (typ.)
High Drive outputs (-15mA IOH, 48mA IOL)
Meets or exceeds JEDEC standard 18 specifications
Military product compliant to MIL-STD-883, Class B and DESC
listed (dual marked)
Power off disable outputs permit "live insertion"
Available in the following packages:
Industrial: SOIC, SSOP, QSOP
Military: CERDIP, LCC
FUNCTIONAL BLOCK DIAGRAM
IDT54/74FCT273T/AT/CT
FAST CMOS
OCTAL D FLIP-FLOP
WITH MASTER RESET
DESCRIPTION:
The FCT273T is an octal D flip-flop built using an advanced dual metal
CMOS technology. The FCT273T has eight edge-triggered D-type flip-
flops with individual D inputs and O outputs. The common buffered Clock
(CP) and Master Reset (MR) inputs load and reset (clear) all flip-flops
simultaneously.
The register is fully edge-triggered. The state of each D input, one set-
up time before the low-to-high clock transition, is transferred to the corre-
sponding flip-flop’s O output.
All outputs will be forced low independently of Clock or Data inputs by
a low voltage level on the MR input. The device is useful for applications
where the true output only is required and the Clock and Master Reset are
common to all storage elements.
D
CP
Q
R
D
D0
O0
D
CP
Q
R
D
D1
O1
D
CP
Q
R
D
D2
O2
D
CP
Q
R
D
D3
O3
D
CP
Q
R
D
D4
O4
D
CP
Q
R
D
D5
O5
D
CP
Q
R
D
D6
O6
D
CP
Q
R
D
D7
O7
CP
MR
MILITARY AND INDUSTRIAL TEMPERATURE RANGES
2
IDT54/74FCT273T/AT/CT
FAST CMOS OCTAL D FLIP-FLOP WITH MASTER RESET
PIN CONFIGURATION
Symbol Description Max Unit
VTERM
(2)
Terminal Voltage with Respect to GND –0.5 to +7 V
VTERM
(3)
Terminal Voltage with Respect to GND –0.5 to VCC+0.5 V
TSTG Storage Temperature –65 to +150 °C
I
OUT DC Output Current –60 to +120 mA
ABSOLUTE MAXIMUM RATINGS
(1)
NOTES:
1. Stresses greater than those listed under ABSOLUTE MAXIMUM RATINGS may cause
permanent damage to the device. This is a stress rating only and functional operation
of the device at these or any other conditions above those indicated in the operational
sections of this specification is not implied. Exposure to absolute maximum rating
conditions for extended periods may affect reliability. No terminal voltage may exceed
Vcc by +0.5V unless otherwise noted.
2. Inputs and Vcc terminals only.
3. Output and I/O terminals only.
Pin Names Description
Dx Data Inputs
MR Master Reset (Active LOW)
CP Clock Pulse Input (Active Rising Edge)
Ox Data Outputs
PIN DESCRIPTION
Symbol Parameter
(1)
Conditions Typ. Max. Unit
CIN Input Capacitance VIN = 0V 6 10 pF
C
OUT Output Capacitance VOUT = 0V 8 12 pF
CAPACITANCE (TA = +25°C, F = 1.0MHz)
NOTE:
1. This parameter is measured at characterization but not tested.
LCC
TOP VIEW
CERDIP/ SOIC/ SSOP/ QSOP
TOP VIEW
FUNCTION TABLE
(1)
Inputs Outputs
Operating Mode MR CP Dx Ox
Reset (Clear) L X X L
Load "1" L hH
Load "0" H lL
2
3
1
16
15
14
11
19
18
20
17
13
12
5
6
7
4
8
9
10
D1
O0
D0
VCC
O1
D3
O2
D2
O3
GND
O
7
O6
D7
D6
O5
O4
D5
D4
CP
MR
1
23
4
5
7
9
6
8
10 11 12 13
14
15
16
17
18
1920
O6
D7
D6
O5
D5
D
0
O
0
O
3
G
N
D
C
P
O
4
D
4
M
R
V
C
C
O
7
INDEX
D1
O1
D3
O2
D2
NOTE:
1. H = HIGH voltage level steady state
h = HIGH voltage level one set-up time prior to the LOW-to-HIGH clock
transition
L = LOW voltage level steady state
I = LOW voltage level one set-up time prior to the LOW-to-HIGH clock
transition
X = Don’t Care
= LOW-to-HIGH Clock Transition
MILITARY AND INDUSTRIAL TEMPERATURE RANGES
IDT54/74FCT273T/AT/CT
FAST CMOS OCTAL D FLIP-FLOP WITH MASTER RESET
3
Symbol Parameter Test Conditions
(1)
Min. Typ.
(2)
Max. Unit
VIH Input HIGH Level Guaranteed Logic HIGH Level 2 V
VIL Input LOW Level Guaranteed Logic LOW Level 0.8 V
IIH Input HIGH Current
(4)
VCC = Max. VI = 2.7V ±A
IIL Input LOW Current
(4)
VCC = Max. VI = 0.5V ±1
II Input HIGH Current
(4)
VCC = Max., VI = VCC (Max.) ±A
VIK Clamp Diode Voltage VCC = Min., IIN = –18mA –0.7 –1.2 V
IOS Short Circuit Current VCC = Max., VO = GND
(3)
–60 –120 –225 mA
V
OH Output HIGH Voltage VCC = Min IOH = –6mA MIL 2.4 3.3
VIN = VIH or VIL IOH = –8mA IND V
IOH = –12mA MIL 2 3
IOH = –15mA IND
V
OL Output LOW Voltage VCC = Min IOL = 32mA MIL 0.3 0.5 V
VIN = VIH or VIL IOL = 48mA IND
VH Input Hysteresis 200 mV
ICC Quiescent Power Supply Current VCC = Max. 0.01 1 mA
VIN = GND or VCC
DC ELECTRICAL CHARACTERISTICS OVER OPERATING RANGE
Following Conditions Apply Unless Otherwise Specified:
Industrial: TA = –40°C to +85°C, VCC = 5.0V ±5%; Military: TA = –55°C to +125°C, VCC = 5.0V ±10%
NOTES:
1. For conditions shown as Min. or Max., use appropriate value specified under Electrical Characteristics for the applicable device type.
2. Typical values are at VCC = 5.0V, +25°C ambient.
3. Not more than one output should be tested at one time. Duration of the test should not exceed one second.
4. The test limit for this parameter is ±5µA at TA = –55°C.
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