Philips Semiconductors Product specification
74F821/822/823/824/825/826Bus interface registers
1996 Jan 05
10
RECOMMENDED OPERATING CONDITIONS
PARAMETER
LIMITS
MIN NOM MAX
V
CC
Supply voltage 4.5 5.0 5.5 V
V
IH
High-level input voltage 2.0 V
V
IL
Low-level input voltage 0.8 V
I
Ik
Input clamp current –18 mA
I
OH
High–level output current –24 mA
I
OL
Low–level output current 64 mA
p
p
Commercial range 0 +70 °C
amb
-
Industrial range –40 +85 °C
DC ELECTRICAL CHARACTERISTICS
(Over recommended operating free-air temperature range unless otherwise noted.)
LIMITS
MIN TYP
2
MAX
±10%V
CC
2.4 V
p
V
CC
= MIN,
OH
= –
±5%V
CC
2.4 V
OH
-
v
u
u
v
IL
=
,
V
IH
= MIN
±10%V
CC
2.0 V
OH
= –
±5%V
CC
2.0 V
p
V
CC
= MIN,
±10%V
CC
0.55 V
OL
w-
v
u
u
v
IL
=
,
V
IH
= MIN
OL
=
±5%V
CC
0.42 0.55 V
V
IK
Input clamp voltage V
CC
= MIN, I
I
= I
IK
–0.73 –1.2 V
I
I
Input current at maximum input voltage V
CC
= 0.0V, V
I
= 7.0V 100 µA
I
IH
High–level input current V
CC
= MAX, V
I
= 2.7V 20 µA
I
IL
Low–level input current V
CC
= MAX, V
I
= 0.5V –20 µA
I
OZH
Off–state output current, high–level voltage applied V
CC
= MAX, V
O
= 2.7V 50 µA
I
OZL
Off–state output current, low–level voltage applied V
CC
= MAX, V
O
= 0.5V –50 µA
I
OS
Short–circuit output current
3
V
CC
= MAX -100 -225 mA
I
CCH
75 105 mA
74F821,
I
CCL
V
CC
= MAX
75 105 mA
I
CCZ
75 115 mA
I
CCH
65 100 mA
I
CC
Supply current (total)
74F823,
I
CCL
V
CC
= MAX
70 105 mA
I
CCZ
75 110 mA
I
CCH
60 85 mA
74F825,
I
CCL
V
CC
= MAX
60 90 mA
I
CCZ
65 95 mA
NOTES:
1. For conditions shown as MIN or MAX, use the appropriate value specified under recommended operating conditions for the applicable type.
2. All typical values are at V
CC
= 5V, T
amb
= 25°C.
3. Not more than one output should be shorted at a time. For testing I
OS
, the use of high-speed test apparatus and/or sample-and-hold
techniques are preferable in order to minimize internal heating and more accurately reflect operational values. Otherwise, prolonged shorting
of a high output may raise the chip temperature well above normal and thereby cause invalid readings in other parameter tests. In any
sequence of parameter tests, I
OS
tests should be performed last.
