Philips Semiconductors Product specification
74F5381-of-8 decoder (3-State)
1989 Apr 06
4
ABSOLUTE MAXIMUM RATINGS
(Operation beyond the limits set forth in this table may impair the useful life of the device.
Unless otherwise noted these limits are over the operating free-air temperature range.)
SYMBOL
PARAMETER RATING UNIT
V
CC
Supply voltage –0.5 to +7.0 V
V
IN
Input voltage –0.5 to +7.0 V
I
IN
Input current –30 to +5.0 mA
V
OUT
Voltage applied to output in High output state –0.5 to +V
CC
V
I
OUT
Current applied to output in Low output state 48 mA
T
amb
Operating free-air temperature range 0 to +70 °C
T
stg
Storage temperature –65 to +150 °C
RECOMMENDED OPERATING CONDITIONS
LIMITS
MIN NOM MAX
V
CC
Supply voltage 4.5 5.0 5.5 V
V
IH
High-level input voltage 2.0 V
V
IL
Low-level input voltage 0.8 V
I
IK
Input clamp current –18 mA
I
OH
High-level output current –3.0 mA
I
OL
Low-level output current 24 mA
T
amb
Operating free-air temperature range 0 70 °C
DC ELECTRICAL CHARACTERISTICS
(Over recommended operating free-air temperature range unless otherwise noted.)
LIMITS
MIN TYP
2
MAX
High level output voltage
V
= MIN
V
= MAX
±10%V
CC
2.4 V
OH
g
-
eve
ou
pu
vo
age
V
IH
= MIN, I
OH
= MAX
±5%V
CC
2.7 3.3 V
p
V
= MIN
V
= MAX
±10%V
CC
0.35 0.50 V
OL
w-
v
u
u
v
V
IH
= MIN, I
OL
= MAX
±5%V
CC
0.35 0.50 V
V
IK
Input clamp voltage V
CC
= MIN, I
I
= I
IK
–0.73 –1.2 V
I
I
Input current at maximum input
voltage
V
CC
= MAX, V
I
= 7.0V 100 µA
I
IH
High-level input current V
CC
= MAX, V
I
= 2.7V 20 µA
I
IL
Low-level input current V
CC
= MAX, V
I
= 0.5V –0.6 mA
I
OZH
Off-state output current
High-level voltage applied
V
CC
= MAX, V
O
= 2.7V 50 µA
I
OZL
Off-state output current
Low-level voltage applied
V
CC
= MAX, V
O
= 0.5V –50 µA
I
OS
Short-circuit output current
3
V
CC
= MAX –60 –150 mA
I
CCH
30 40 mA
I
CC
Supply current I
CCL
V
CC
= MAX 35 50 mA
I
CCZ
35 50 mA
NOTES:
1. For conditions shown as MIN or MAX, use the appropriate value under the recommended operating conditions for the applicable type.
2. All typical values are at V
CC
= 5V, T
amb
= 25°C.
3. Not more than one output should be shorted at a time. For testing I
OS
, the use of high-speed test apparatus and/or sample-and-hold
techniques are preferable in order to minimize internal heating and more accurately reflect operational values. Otherwise, prolonged shorting
of a High output may raise the chip temperature well above normal and thereby cause invalid readings in other parameter tests. In any
sequence of parameter tests, I
OS
should be performed last.
