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74F257A

Part # 74F257A
Description
Category IC
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Technical Document


DISCLAIMER: The information provided herein is solely for informational purposes. Customers must be aware of the suitability of this product for their application, and consider that variable factors such as Manufacturer, Product Category, Date Codes, Pictures and Descriptions may differ from available inventory.

Philips Semiconductors Product specification
74F257A
Quad 2-line to 1-line selector/multiplexer, non-inverting
(3-State)
1995 Mar 31
4
ABSOLUTE MAXIMUM RATINGS
(Operation beyond the limits set forth in this table may impair the useful life of the device.
Unless otherwise noted these limits are over the operating free-air temperature range.)
SYMBOL
PARAMETER RATING UNIT
V
CC
Supply voltage –0.5 to +7.0 V
V
IN
Input voltage –0.5 to +7.0 V
I
IN
Input current –30 to +5 mA
V
OUT
Voltage applied to output in High output state –0.5 to V
CC
V
I
OUT
Current applied to output in Low output state 48 mA
T
O
p
erating free air tem
p
erature range
Commercial range 0 to +70 °C
T
amb
Operating
free
-
air
temperat
u
re
range
Industrial range –40 to +85 °C
T
stg
Storage temperature range –65 to +150 °C
RECOMMENDED OPERATING CONDITIONS
SYMBOL
PARAMETER
LIMITS
UNIT
SYMBOL
PARAMETER
MIN NOM MAX
UNIT
V
CC
Supply voltage 4.5 5.0 5.5 V
V
IH
High-level input voltage 2.0 V
V
IL
Low-level input voltage 0.8 V
I
IK
Input clamp current –18 mA
I
OH
High-level output current –3 mA
I
OL
Low-level output current 24 mA
T
O
p
erating free air tem
p
erature range
Commercial range 0 +70 °C
T
amb
Operating
free
-
air
temperat
u
re
range
Industrial range –40 +85 °C
Philips Semiconductors Product specification
74F257A
Quad 2-line to 1-line selector/multiplexer, non-inverting
(3-State)
1995 Mar 31
5
DC ELECTRICAL CHARACTERISTICS
(Over recommended operating free-air temperature range unless otherwise noted.)
SYMBOL
PARAMETER
TEST CONDITIONS
1
LIMITS
UNIT
SYMBOL
PARAMETER
TEST
CONDITIONS
1
MIN TYP
2
MAX
UNIT
V
O
High level out
p
ut voltage
V
= MIN, V
IL
= MAX,
±10%V
CC
2.4 V
V
OH
High
-
le
v
el
o
u
tp
u
t
v
oltage
V
IH
= MIN, I
OH
= MAX
±5%V
CC
2.7 3.3 V
V
O
Low level out
p
ut voltage
V
= MIN, V
IL
= MAX,
±10%V
CC
0.35 0.50 V
V
OL
Lo
w-
le
v
el
o
u
tp
u
t
v
oltage
V
IH
= MIN, I
OL
= MAX
±5%V
CC
0.35 0.50 V
V
IK
Input clamp voltage V
CC
= MIN, I
I
= I
IK
–0.73 –1.2 V
I
I
Input current at maximum input voltage V
CC
= MAX, V
I
= 7.0V 100 µA
I
IH
High-level input current V
CC
= MAX, V
I
= 2.7V 20 µA
I
IL
Low-level input current V
CC
= MAX, V
I
= 0.5V –0.6 mA
I
OZH
Off state output current,
High-level voltage applied
V
CC
= MAX, V
O
= 2.7V 50 µA
I
OZL
Off state output current,
Low-level voltage applied
V
CC
= MAX, V
O
= 0.5V –50 µA
I
OS
Short-circuit output current
3
V
CC
= MAX -60 –150 mA
4
I
CCH
9.0 15.0 mA
I
CC
Supply current
4
(total)
I
CCL
V
CC
= MAX
14.5 22.0 mA
I
CCZ
15.0 23.0 mA
NOTES:
1. For conditions shown as MIN or MAX, use the appropriate value specified under recommended operating conditions for the applicable type.
2. All typical values are at V
CC
= 5V, T
amb
= 25°C.
3. Not more than one output should be shorted at a time. For testing I
OS
, the use of high-speed test apparatus and/or sample-and-hold
techniques are preferable in order to minimize internal heating and more accurately reflect operational values. Otherwise, prolonged shorting
of a High output may raise the chip temperature well above normal and thereby cause invalid readings in other parameter tests. In any
sequence of parameter tests, I
OS
tests should be performed last.
4. Measure I
CC
with all outputs open and inputs grounded.
AC ELECTRICAL CHARACTERISTICS
LIMITS
SYMBOL PARAMETER
TEST
CONDITION
T
amb
= +25°C
V
CC
= +5.0V
C
L
= 50pF
R
L
= 500
T
amb
= 0°C to +70°C
V
CC
= +5.0V ± 10%
C
L
= 50pF
R
L
= 500
T
amb
= –40°C to +85°C
V
CC
= +5.0V ± 10%
C
L
= 50pF
R
L
= 500
UNIT
MIN TYP MAX MIN MAX MIN MAX
t
PLH
t
PHL
Propagation delay
In to Yn
Waveform 1
3.0
2.0
4.5
3.5
6.0
5.0
3.0
2.0
7.0
6.0
3.0
2.0
7.0
7.0
ns
t
PLH
t
PHL
Propagation delay
S to Yn
Waveform 1
5.0
4.0
7.5
5.5
9.5
7.0
5.0
4.0
10.5
8.0
5.0
4.0
10.5
8.5
ns
t
PZH
t
PZL
Output Enable time
to High or Low level
Waveform 2
Waveform 3
4.5
4.5
6.5
6.0
7.5
7.5
4.5
4.5
8.5
8.5
4.5
4.5
8.5
8.5
ns
t
PHZ
t
PLZ
Output Disable time
from High or Low level
Waveform 2
Waveform 3
2.0
2.0
4.0
3.5
5.5
5.5
2.0
2.0
6.0
6.0
2.0
2.0
6.0
6.0
ns
Philips Semiconductors Product specification
74F257A
Quad 2-line to 1-line selector/multiplexer, non-inverting
(3-State)
1995 Mar 31
6
AC WAVEFORMS
For all waveforms, V
M
= 1.5V.
V
M
V
M
V
M
V
M
Yn
In or S
t
PHL
t
PLH
SF00679
Waveform 1. Propagation Delay, Data and Select to Output
V
OH
–0.3V
V
M
V
M
V
M
Yn
t
PZH
t
PHZ
SF00213
OE
0V
Waveform 2. 3-State Output Enable Time to High Level and
Output Disable Time from High Level
V
OL
+0.3V
V
M
V
M
V
M
Yn
t
PZL
t
PLZ
SF00214
OE
Waveform 3. 3-State Output Enable Time to Low Level and
Output Disable Time from Low Level
TEST CIRCUIT AND WAVEFORMS
t
w
90%
V
M
10%
90%
V
M
10%
90%
V
M
10%
90%
V
M
10%
NEGATIVE
PULSE
POSITIVE
PULSE
t
w
AMP (V)
0V
0V
t
THL
(
t
f
)
INPUT PULSE REQUIREMENTS
rep. rate
t
w
t
TLH
t
THL
1MHz 500ns
2.5ns 2.5ns
Input Pulse Definition
V
CC
family
74F
D.U.T.
PULSE
GENERATOR
R
L
C
L
R
T
V
IN
V
OUT
Test Circuit for 3-State Outputs
DEFINITIONS:
R
L
= Load resistor;
see AC electrical characteristics for value.
C
L
= Load capacitance includes jig and probe capacitance;
see AC electrical characteristics for value.
R
T
= Termination resistance should be equal to Z
OUT
of
pulse generators.
t
THL
(
t
f
)
t
TLH
(
t
r
)
t
TLH
(
t
r
)
AMP (V)
amplitude
3.0V
1.5V
V
M
R
L
7.0V
SF00777
TEST SWITCH
t
PLZ
closed
t
PZL
closed
All other open
SWITCH POSITION
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