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74ACTQ244PC

Part # 74ACTQ244PC
Description Buffer/Line Driver 8-CH Non-Inverting 3-ST CMOS 20-Pin PDI
Category IC
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Technical Document


DISCLAIMER: The information provided herein is solely for informational purposes. Customers must be aware of the suitability of this product for their application, and consider that variable factors such as Manufacturer, Product Category, Date Codes, Pictures and Descriptions may differ from available inventory.

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74ACQ244 74ACTQ244
DC Electrical Characteristics for ACQ (Continued)
Note 2: All outputs loaded thresholds on input associated with output under test.
Note 3: Maximum test duration 2.0 ms, one output loaded at a time.
Note 4: I
IN
and I
CC
@ 3.0V are guaranteed to be less than or equal to the respective limit @ 5.5V V
CC
.
Note 5: DIP package.
Note 6: Max number of outputs defined as (n). Data Inputs are driven 0V to 5V. One output @ GND.
Note 7: Max number of Data Inputs (n) switching. (n 1) Inputs switching 0V to 5V (ACQ). Input-under-test switching: 5V to threshold (V
ILD
),
0V to threshold (V
IHD
), f = 1 MHz.
DC Electrical Characteristics for ACTQ
Note 8: All outputs loaded thresholds on input associated with output under test.
Note 9: Maximum test duration 2.0 ms, one output loaded at a time.
Note 10: DIP package.
Symbol Parameter
V
CC
T
A
= +25°C T
A
= 40°C to +85°C
Units Conditions
(V) Typ Guaranteed Limits
V
OLP
Quiet Output
5.0 1.1 1.5 V
Figure 1, Figure 2
Maximum Dynamic V
OL
(Note 5)(Note 6)
V
OLV
Quiet Output
5.0 0.6 1.2 V
Figure 1, Figure 2
Minimum Dynamic V
OL
(Note 5)(Note 6)
V
IHD
Minimum HIGH Level
5.0 3.1 3.5 V (Note 5)(Note 7)
Dynamic Input Voltage
V
ILD
Maximum LOW Level
5.0 1.9 1.5 V (Note 5)(Note 7)
Dynamic Input Voltage
Symbol Parameter
V
CC
T
A
= +25°C T
A
= 40°C to +85°C
Units Conditions
(V) Typ Guaranteed Limits
V
IH
Minimum HIGH Level 4.5 1.5 2.0 2.0
V
V
OUT
= 0.1V
Input Voltage 5.5 1.5 2.0 2.0 or V
CC
0.1V
V
IL
Maximum LOW Level 4.5 1.5 0.8 0.8
V
V
OUT
= 0.1V
Input Voltage 5.5 1.5 0.8 0.8 or V
CC
0.1V
V
OH
Minimum HIGH Level 4.5 4.49 4.4 4.4
VI
OUT
= 50 µA
Output Voltage 5.5 5.49 5.4 5.4
V
IN
= V
IL
or V
IH
4.5 3.86 3.76 V I
OH
= 24 mA
5.5 4.86 4.76 I
OH
= 24 mA (Note 8)
V
OL
Maximum LOW Level 4.5 0.001 0.1 0.1
VI
OUT
= 50 µA
Output Voltage 5.5 0.001 0.1 0.1
V
IN
= V
IL
or V
IH
4.5 0.36 0.44 V I
OL
= 24 mA
5.5 0.36 0.44 I
OL
= 24 mA (Note 8)
I
IN
(Note
4)
Maximum Input Leakage Current 5.5 ±0.1 ±1.0
µA
V
I
= V
CC
, GND
I
OZ
Maximum 3-STATE
5.5 ±0.25 ±2.5 µA
V
I
= V
IL
, V
IH
Leakage Current V
O
= V
CC
, GND
I
CCT
Maximum I
CC
/Input 5.5 0.6 1.5 mA V
I
= V
CC
2.1V
I
OLD
Minimum Dynamic 5.5 75 mA V
OLD
= 1.65V Max
I
OHD
Output Current (Note 9) 5.5 75 mA V
OHD
= 3.85V Min
I
CC
Maximum Quiescent
5.5 4.0 40.0 µAV
IN
= V
CC
or GND
(Note 4) Supply Current
V
OLP
Quiet Output
5.0 1.1 1.5 V
Figure 1, Figure 2
Maximum Dynamic V
OL
(Note 10)(Note 11)
V
OLV
Quiet Output
5.0 0.6 1.2 V
Figure 1, Figure 2
Minimum Dynamic V
OL
(Note 10)(Note 11)
V
IHD
Minimum HIGH Level
5.0 1.9 2.2 V (Note 10)(Note 12)
Dynamic Input Voltage
V
ILD
Maximum LOW Level
5.0 1.2 0.8 V (Note 10)(Note 12)
Dynamic Input Voltage
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74ACQ244 74ACTQ244
DC Electrical Characteristics for ACTQ (Continued)
Note 11: Max number of outputs defined as (n). Data Inputs are driven 0V to 3V. One output @ GND.
Note 12: Max number of Data Inputs (n) switching. (n1) Inputs switching 0V to 3V (ACTQ). Input-under-test switching: 3V to threshold (V
ILD
),
0V to threshold (V
IHD
), f = 1 MHz.
AC Electrical Characteristics for ACQ
Note 13: Voltage Range 5.0 is 5.0V ± 0.5V.
Voltage Range 3.3 is 3.3V ± 0.3V.
Note 14: Skew is defined as the absolute value of the difference between the actual propagation delay for any two separate outputs of the same device. The
specification applies to any outputs switching in the same direction, either HIGH to LOW (t
OSHL
) or LOW to HIGH (t
OSLH
). Parameter guaranteed by design.
AC Electrical Characteristics for ACTQ
Note 15: Voltage Range 5.0 is 5.0V ± 0.5V.
Note 16: Skew is defined as the absolute value of the difference between the actual propagation delay for any two separate outputs of the same device. The
specification applies to any outputs switching in the same direction, either HIGH to LOW (t
OSHL
) or LOW to HIGH (t
OSLH
). Parameter guaranteed by design.
Capacitance
V
CC
T
A
= +25°CT
A
= 40°C to +85°C
Symbol Parameter (V)
C
L
= 50 pF C
L
= 50 pF
Units
(Note 13) Min Typ Max Min Max
t
PHL
Propagation Delay 3.3 2.0 7.0 9.0 2.0 9.5
ns
t
PLH
Data to Output 5.0 1.5 5.0 6.0 1.5 6.5
t
PZL
t
PZH
Output Enable Time 3.3 2.5 8.0 12.0 2.5 12.5
ns
5.0 1.5 6.5 8.0 1.5 8.5
t
PHZ
t
PLZ
Output Disable Time 3.3 1.0 9.0 13.5 1.0 14.0
ns
5.0 1.0 7.5 9.0 1.0 9.5
t
OSHL
t
OSLH
Output to Output 3.3 1.0 1.5 1.5
ns
Skew Data to Output (Note 14) 5.0 0.5 1.0 1.0
V
CC
T
A
= +25°CT
A
= 40°C to +85°C
Symbol Parameter (V)
C
L
= 50 pF C
L
= 50 pF
Units
(Note 15) Min Typ Max Min Max
t
PHL
Propagation Delay 5.0 1.5 5.5 6.5 1.5 7.0 ns
t
PLH
Data to Output
t
PZL
Output Enable Time 5.0 1.5 7.0 8.5 1.5 9.0 ns
t
PZH
t
PHZ
Output Disable Time 5.0 1.0 8.0 9.5 1.0 10.0 ns
t
PLZ
t
OSHL
Output to Output 5.0 0.5 1.0 1.0 ns
t
OSLH
Skew Data to Output (Note 16)
Symbol Parameter Typ Units Conditions
C
IN
Input Capacitance 4.5 pF V
CC
= OPEN
C
PD
Power Dissipation Capacitance 70 pF V
CC
= 5.0V
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74ACQ244 74ACTQ244
FACT Noise Characteristics
The setup of a noise characteristics measurement is critical
to the accuracy and repeatability of the tests. The following
is a brief description of the setup used to measure the
noise characteristics of FACT.
Equipment:
Hewlett Packard Model 8180A Word Generator
PC-163A Test Fixture
Tektronics Model 7854 Oscilloscope
Procedure:
1. Verify Test Fixture Loading: Standard Load 50 pF,
500.
2. Deskew the HFS generator so that no two channels
have greater than 150 ps skew between them. This
requires that the oscilloscope be deskewed first. It is
important to deskew the HFS generator channels
before testing. This will ensure that the outputs switch
simultaneously.
3. Terminate all inputs and outputs to ensure proper load-
ing of the outputs and that the input levels are at the
correct voltage.
4. Set the HFS generator to toggle all but one output at a
frequency of 1 MHz. Greater frequencies will increase
DUT heating and effect the results of the measure-
ment.
5. Set the HFS generator input levels at 0V LOW and 3V
HIGH for ACT devices and 0V LOW and 5V HIGH for
AC devices. Verify levels with an oscilloscope.
Note 17: V
OHV
and V
OLP
are measured with respect to ground reference.
Note 18: Input pulses have the following characteristics: f = 1 MHz,
t
r
= 3ns, t
f
= 3 ns, skew < 150 ps.
FIGURE 1. Quiet Output Noise Voltage Waveforms
V
OLP
/V
OLV
and V
OHP
/V
OHV
:
Determine the quiet output pin that demonstrates the
greatest noise levels. The worst case pin will usually be
the furthest from the ground pin. Monitor the output volt-
ages using a 50 coaxial cable plugged into a standard
SMB type connector on the test fixture. Do not use an
active FET probe.
Measure V
OLP
and V
OLV
on the quiet output during the
worst case active and enable transition. Measure V
OHP
and V
OHV
on the quiet output during the worst case
active and enable transition.
Verify that the GND reference recorded on the oscillo-
scope has not drifted to ensure the accuracy and repeat-
ability of the measurements.
V
ILD
and V
IHD
:
Monitor one of the switching outputs using a 50 coaxial
cable plugged into a standard SMB type connector on
the test fixture. Do not use an active FET probe.
First increase the input LOW voltage level, V
IL
, until the
output begins to oscillate or steps out a min of 2 ns.
Oscillation is defined as noise on the output LOW level
that exceeds V
IL
limits, or on output HIGH levels that
exceed V
IH
limits. The input LOW voltage level at which
oscillation occurs is defined as V
ILD
.
Next decrease the input HIGH voltage level, V
IH
, until
the output begins to oscillate or steps out a min of 2 ns.
Oscillation is defined as noise on the output LOW level
that exceeds V
IL
limits, or on output HIGH levels that
exceed V
IH
limits. The input HIGH voltage level at which
oscillation occurs is defined as V
IHD
.
Verify that the GND reference recorded on the oscillo-
scope has not drifted to ensure the accuracy and repeat-
ability of the measurements.
FIGURE 2. Simultaneous Switching Test Circuit
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