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5962F9956002VXC

Part # 5962F9956002VXC
Description REQUIRES EXPORT LICENSEMIL-SPEC
Category IC
Availability Out of Stock
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1 + $82.50000



Technical Document


DISCLAIMER: The information provided herein is solely for informational purposes. Customers must be aware of the suitability of this product for their application, and consider that variable factors such as Manufacturer, Product Category, Date Codes, Pictures and Descriptions may differ from available inventory.

1
Radiation Hardened Dual, Non-Inverting Power MOSFET
Drivers
HS-4424RH, HS-4424EH,
HS-4424BRH, HS-4424BEH
The Radiation Hardened HS-4424RH, HS-4424EH,
HS-4424BRH and HS-4424BEH are non-inverting, dual,
monolithic high-speed MOSFET drivers designed to convert TTL
level signals into high current outputs at voltages up to 18V.
The inputs of these devices are TTL compatible and can be
directly driven by our HS-1825ARH PWM device or by our
ACS/ACTS and HCS/HCTS type logic devices. The fast rise
times and high current outputs allow very quick control of high
gate capacitance power MOSFETs in high frequency
applications.
The high current outputs minimize power losses in MOSFETs by
rapidly charging and discharging the gate capacitance. The
output stage incorporates a low voltage lock-out circuit that
puts the outputs into a three-state mode when the supply
voltage drops below 10V for the HS-4424RH, HS-4424EH and
7.5V for the HS-4424BRH, HS-4424BEH.
Constructed with the Intersil dielectrically isolated Rad Hard
Silicon Gate (RSG) BiCMOS process, these devices are immune
to Single Event Latch-up and have been specifically designed
to provide highly reliable performance in harsh radiation
environments.
Specifications for Rad Hard QML devices are controlled by the
Defense Logistics Agency Land and Maritime (DLA). The SMD
numbers listed here must be used when ordering.
Detailed Electrical Specifications for these devices are
contained in SMD
5962-99560.
Features
Electrically screened to DESC SMD # 5962-99560
QML qualified per MIL-PRF-38535 requirements
EH version acceptance tested to 50krad(Si) (LDR)
•Radiation environment
- High dose rate (50-300rad(Si)/s). . . . . . . . . . . 300krad(Si)
- Latch-up immune
- Low dose rate immune
•I
PEAK
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . >2A (min)
Matched rise and fall times (C
L
= 4300pF) . . . . . . 75ns (max)
Low voltage lock-out feature
- HS-4424RH, HS-4424EH. . . . . . . . . . . . . . . . . . . . . . < 10.0V
- HS-4424BRH, HS-4424BEH . . . . . . . . . . . . . . . . . . . . < 7.5V
Wide supply voltage range . . . . . . . . . . . . . . . . . . . 12V to 18V
Prop delay . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .250ns (max)
Consistent delay times with V
CC
changes
•Low power consumption
- 40mW with inputs high
- 20mW with inputs low
Low equivalent input capacitance . . . . . . . . . . . . . 3.2pF (typ)
ESD protected. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .>4000V
Applications
Switching power supplies
•DC/DC converters
•Motor controllers
Pin Configuration
HS-4424RH, HS-4424EH, HS-4424BRH, HS-4424BEH
(FLATPACK CDFP4-F16)
TOP VIEW
NC
IN A
NC
GND A
GND B
NC
IN B
NC
2
3
4
5
6
7
8
116
15
14
13
12
11
10
9
NC
OUT A
OUT A
V
CC
V
CC
OUT B
OUT B
NC
NOTE: Pins 4 and 5, 10 and 11, 12 and 13, 14 and 15 are double-bonded to their
same electrical points on the die.
CAUTION: These devices are sensitive to electrostatic discharge; follow proper IC Handling Procedures.
1-888-INTERSIL or 1-888-468-3774
| Copyright Intersil Americas LLC 1999, 2013. All Rights Reserved
Intersil (and design) is a trademark owned by Intersil Corporation or one of its subsidiaries.
All other trademarks mentioned are the property of their respective owners.
September 24, 2013
FN4739.2
HS-4424RH, HS-4424EH, HS-4424BRH, HS-4424BEH
2
FN4739.2
September 24, 2013
Ordering Information
ORDERING
SMD NUMBER
(Note 2)
PART NUMBER
(Note 1)
TEMPERATURE RANGE
(°C)
PACKAGE
(RoHS Compliant)
PKG.
DWG. #
5962F9956004V9A HS0-4424BEH-Q -55 to +125 DIE
5962F9956002V9A HS0-4424BRH-Q -55 to +125 DIE
HS0-4424BRH/SAMPLE HS0-4424BRH/SAMPLE -55 to +125 DIE SAMPLE
5962F9956003V9A HS0-4424EH-Q -55 to +125 DIE
5962F9956001V9A HS0-4424RH-Q -55 to +125 DIE
HS0-4424RH/SAMPLE HS0-4424RH/SAMPLE -55 to +125 DIE SAMPLE
5962F9956001VXC HS9-4424RH-Q -55 to +125 16 Ld Flatpack K16.A
5962F9956004VXC HS9-4424BEH-Q -55 to +125 16 Ld Flatpack K16.A
5962F9956003VXC HS9-4424EH-Q -55 to +125 16 Ld Flatpack K16.A
5962F9956002QXC HS9-4424BRH-8 -55 to +125 16 Ld Flatpack K16.A
5962F9956002VXC HS9-4424BRH-Q -55 to +125 16 Ld Flatpack K16.A
HS9-4424BRH/PROTO HS9-4424BRH/PROTO -55 to +125 16 Ld Flatpack K16.A
HS9-4424RH/PROTO HS9-4424RH/PROTO -55 to +125 16 Ld Flatpack K16.A
5962F9956001QXC HS9-4424RH-8 -55 to +125 16 Ld Flatpack K16.A
NOTES:
1. These Intersil Pb-free Hermetic packaged products employ 100% Au plate - e4 termination finish, which is RoHS compliant and compatible with both
SnPb and Pb-free soldering operations.
2. Specifications for Rad Hard QML devices are controlled by the Defense Logistics Agency Land and Maritime (DLA). The SMD numbers listed in the
“Ordering Information” table on page 2 must be used when ordering..
HS-4424RH, HS-4424EH, HS-4424BRH, HS-4424BEH
3
Intersil products are manufactured, assembled and tested utilizing ISO9000 quality systems as noted
in the quality certifications found at www.intersil.com/en/support/qualandreliability.html
Intersil products are sold by description only. Intersil Corporation reserves the right to make changes in circuit design, software and/or specifications at any time
without notice. Accordingly, the reader is cautioned to verify that data sheets are current before placing orders. Information furnished by Intersil is believed to be
accurate and reliable. However, no responsibility is assumed by Intersil or its subsidiaries for its use; nor for any infringements of patents or other rights of third
parties which may result from its use. No license is granted by implication or otherwise under any patent or patent rights of Intersil or its subsidiaries.
For information regarding Intersil Corporation and its products, see www.intersil.com
FN4739.2
September 24, 2013
For additional products, see www.intersil.com/en/products.html
Die Characteristics
DIE DIMENSIONS:
4890μm x 3370μm (193 mils x 133 mils)
Thickness: 483μm ± 25.4μm (19 mils ± 1 mil)
INTERFACE MATERIALS:
Glassivation:
Type: PSG (Phosphorous Silicon Glass)
Thickness: 8.0kÅ ± 1.0
Top Metallization:
Type: AlSiCu
Thickness: 16.0kÅ ± 2kÅ
Substrate:
Radiation Hardened Silicon Gate,
Dielectric Isolation
Backside Finish:
Silicon
ASSEMBLY RELATED INFORMATION:
Substrate Potential:
Unbiased (DI)
ADDITIONAL INFORMATION:
Worst Case Current Density:
<2.0 x 10
5
A/cm
2
Transistor Count:
125
Metallization Mask Layout
HS-4424RH, HS-4424EH, HS-4424BRH, HS-4424BEH
GND (5)
IN B (7)
OUT B (10)
OUT B (11)
V
CC
(12) V
CC
(13)
GND (4)
IN A (2)
OUT A (15)
OUT A (14)