5

C0G (NP0) Dielectric

Specifications and Test Methods

Parameter/Test NP0 Specification Limits Measuring Conditions

Operating Temperature Range -55ºC to +125ºC Temperature Cycle Chamber

Capacitance Within specified tolerance Freq.: 1.0 MHz ± 10% for cap ≤ 1000 pF

Q

<30 pF: Q≥ 400+20 x Cap Value 1.0 kHz ± 10% for cap > 1000 pF

≥30 pF: Q≥ 1000 Voltage: 1.0Vrms ± .2V

Insulation Resistance

100,000MΩ or 1000MΩ - μF, Charge device with rated voltage for

whichever is less 60 ± 5 secs @ room temp/humidity

Charge device with 300% of rated voltage for

Dielectric Strength No breakdown or visual defects 1-5 seconds, w/charge and discharge current

limited to 50 mA (max)

Note: Charge device with 150% of rated

voltage for 500V devices.

Appearance No defects Deflection: 2mm

Capacitance Test Time: 30 seconds

Resistance to Variation

±5% or ±.5 pF, whichever is greater

Flexure

Q Meets Initial Values (As Above)

Stresses

Insulation

≥ Initial Value x 0.3

Resistance

Solderability

≥ 95% of each terminal should be covered Dip device in eutectic solder at 230 ± 5ºC

with fresh solder for 5.0 ± 0.5 seconds

Appearance No defects, <25% leaching of either end terminal

Capacitance

Variation

≤ ±2.5% or ±.25 pF, whichever is greater

Dip device in eutectic solder at 260ºC for 60

Q Meets Initial Values (As Above)

seconds. Store at room temperature for 24 ± 2

Resistance to

hours before measuring electrical properties.

Solder Heat

Insulation

Meets Initial Values (As Above)

Resistance

Dielectric

Meets Initial Values (As Above)

Strength

Appearance No visual defects Step 1: -55ºC ± 2º 30 ± 3 minutes

Capacitance

Variation

≤ ±2.5% or ±.25 pF, whichever is greater Step 2: Room Temp ≤ 3 minutes

Q Meets Initial Values (As Above) Step 3: +125ºC ± 2º 30 ± 3 minutes

Thermal

Shock

Insulation

Meets Initial Values (As Above) Step 4: Room Temp ≤ 3 minutes

Resistance

Dielectric

Meets Initial Values (As Above)

Repeat for 5 cycles and measure after

Strength 24 hours at room temperature

Appearance No visual defects

Capacitance

Variation

≤ ±3.0% or ± .3 pF, whichever is greater

Charge device with twice rated voltage in

≥ 30 pF: Q≥ 350 test chamber set at 125ºC ± 2ºC

Load Life

Q

≥10 pF, <30 pF: Q≥ 275 +5C/2 for 1000 hours (+48, -0).

(C=Nominal Cap)

<10 pF: Q≥ 200 +10C

Insulation

≥ Initial Value x 0.3 (See Above)

Remove from test chamber and stabilize at

Resistance room temperature for 24 hours

Dielectric

Meets Initial Values (As Above)

before measuring.

Strength

Appearance No visual defects

Capacitance

Variation

≤ ±5.0% or ± .5 pF, whichever is greater

Store in a test chamber set at 85ºC ± 2ºC/

≥ 30 pF: Q≥ 350 85% ± 5% relative humidity for 1000 hours

Load Q ≥10 pF, <30 pF: Q≥ 275 +5C/2 (+48, -0) with rated voltage applied.

Humidity <10 pF: Q≥ 200 +10C

Insulation

≥ Initial Value x 0.3 (See Above)

Remove from chamber and stabilize at

Resistance room temperature for 24 ± 2 hours

Dielectric

Meets Initial Values (As Above)

before measuring.

Strength