AVX 12063D475KAT2A

Cross Number:

Item Description: HIGH VALUE CHIP CAP 1206 X5R4.7UF +-10%

Qty Price
1 - 525 $0.19853
526 - 1,050 $0.15491
1,051 - 1,575 $0.13536
1,576 - 2,100 $0.13085
2,101 + $0.11731



Other Cross Reference

Manufacturer Date Code Qty Available Qty
AVX 1052
  • Freelance Stock: 2500
    Ships Immediately





Technical Document


DISCLAIMER: The information provided herein is solely for informational purposes. Customers must be aware of the suitability of this product for their application, and consider that variable factors such as Manufacturer, Product Category, Date Codes, Pictures and Descriptions may differ from available inventory.

19
• General Purpose Dielectric for Ceramic Capacitors
• EIA Class II Dielectric
• Temperature variation of capacitance is within ±15%
from -55°C to +85°C
• Well suited for decoupling and filtering applications
• Available in High Capacitance values (up to 100µF)
X5R Dielectric
General Specifications
PART NUMBER (see page 2 for complete part number explanation)
GENERAL DESCRIPTION
% Capacitance
-60 -40
-20 0 +20 +40 +60 +80
Temperature °C
Temperature Coefficient
20
15
10
5
0
-5
-10
-15
-20
TYPICAL ELECTRICAL CHARACTERISTICS
Insulation Resistance (Ohm-Farads)
1,000
10,000
100
0
Insulation Resistance vs Temperature
0
20
120
40 60 80
Temperature °C
100
2220
Size
(L" x W")
6
Voltage
4 = 4V
6 = 6.3V
Z = 10V
Y = 16V
3 = 25V
D = 35V
5 = 50V
D
Dielectric
D = X5R
107
Capacitance
Code (In pF)
2 Sig. Digits +
Number of
Zeros
M
Capacitance
Tolerance
K = ±10%
M = ±20%
A
Failure
Rate
A = N/A
T
Terminations
T = Plated Ni
and Sn
2
Packaging
2 = 7" Reel
4 = 13" Reel
7 = Bulk Cass.
9 = Bulk
A
Special
Code
A = Std.
20
X5R Dielectric
Specifications and Test Methods
Parameter/Test X5R Specification Limits Measuring Conditions
Operating Temperature Range -55ºC to +85ºC Temperature Cycle Chamber
Capacitance Within specified tolerance
2.5% for 50V DC rating Freq.: 1.0 kHz ± 10%
Dissipation Factor
3.0% for 25V DC rating Voltage: 1.0Vrms ± .2V
3.5% for 16V DC rating For Cap > 10 µF, 0.5Vrms @ 120Hz
5.0% for 10V DC rating
Insulation Resistance
100,000Mor 500M - µF, Charge device with rated voltage for
whichever is less 120 ± 5 secs @ room temp/humidity
Charge device with 300% of rated voltage for
Dielectric Strength No breakdown or visual defects 1-5 seconds, w/charge and discharge current
limited to 50 mA (max)
Appearance No defects Deflection: 2mm
Capacitance Test Time: 30 seconds
Resistance to Variation
±12%
Flexure Dissipation
Meets Initial Values (As Above)
Stresses Factor
Insulation
Initial Value x 0.3
Resistance
Solderability
95% of each terminal should be covered Dip device in eutectic solder at 230 ± 5ºC
with fresh solder for 5.0 ± 0.5 seconds
Appearance No defects, <25% leaching of either end terminal
Capacitance
Variation
±7.5%
Dip device in eutectic solder at 260ºC for 60
Dissipation
Meets Initial Values (As Above)
seconds. Store at room temperature for 24 ± 2
Resistance to
Factor
hours before measuring electrical properties.
Solder Heat
Insulation
Meets Initial Values (As Above)
Resistance
Dielectric
Meets Initial Values (As Above)
Strength
Appearance No visual defects Step 1: -55ºC ± 2º 30 ± 3 minutes
Capacitance
Variation
±7.5% Step 2: Room Temp 3 minutes
Dissipation
Meets Initial Values (As Above) Step 3: +85ºC ± 2º 30 ± 3 minutes
Thermal
Factor
Shock
Insulation
Meets Initial Values (As Above) Step 4: Room Temp 3 minutes
Resistance
Dielectric
Meets Initial Values (As Above)
Repeat for 5 cycles and measure after
Strength 24 ± 2 hours at room temperature
Appearance No visual defects
Capacitance
Variation
±12.5%
Dissipation
Initial Value x 2.0 (See Above)
Load Life Factor
Insulation
Initial Value x 0.3 (See Above)
Resistance
Dielectric
Meets Initial Values (As Above)
Strength
Appearance No visual defects
Capacitance
Variation
±12.5%
Load Dissipation
Initial Value x 2.0 (See Above)
Humidity Factor
Insulation
Initial Value x 0.3 (See Above)
Resistance
Dielectric
Meets Initial Values (As Above)
Strength
Charge device with 1.5X rated voltage in
test chamber set at 85ºC ± 2ºC for 1000 hours
(+48, -0). Note: Contact factory for specific high
CV devices that are tested at 1.5X rated voltage.
Remove from test chamber and stabilize
at room temperature for 24 ± 2 hours
before measuring.
Store in a test chamber set at 85ºC ± 2ºC/
85% ± 5% relative humidity for 1000 hours
(+48, -0) with rated voltage applied.
Remove from chamber and stabilize at
room temperature and humidity for
24 ± 2 hours before measuring.
1mm/sec
90 mm
21
X5R Dielectric
Capacitance Range
PREFERRED SIZES ARE SHADED
SIZE 0201 0402 0603 0805
Soldering Reflow Only Reflow Only Reflow Only Reflow/Wave
Packaging All Paper All Paper All Paper Paper/Embossed
(L) Length
MM 0.60 ± 0.03 1.00 ± 0.10 1.60 ± 0.15 2.01 ± 0.20
(in.) (0.024 ± 0.001) (0.040 ± 0.004) (0.063 ± 0.006) (0.079 ± 0.008)
(W) Width
MM 0.30 ± 0.03 0.50 ± 0.10 0.81 ± 0.15 1.25 ± 0.20
(in.) (0.011 ± 0.001) (0.020 ± 0.004) (0.032 ± 0.006) (0.049 ± 0.008)
(t) Terminal
MM 0.15 ± 0.05 0.25 ± 0.15 0.35 ± 0.15 0.50 ± 0.25
(in.) (0.006 ± 0.002) (0.010 ± 0.006) (0.014 ± 0.006) (0.020 ± 0.010)
WVDC 10 16 25 4 6.3 10 16 25 4 6.3 10 16 25 35 6.3 10 16 25 35 50
Cap 100 A
(pF) 150 A
220 A
330 A
470 A
680 A
1000 A
1500 A
2200 A A
3300 A
4700 A
6800 A
Cap 0.010 A C
(µF 0.015 CG
0.022 CG
0.033 CG
0.047 CGG
0.068 CG N
0.10 C C G N
0.15 C G N
0.22 C G G N
0.33 C C G G N
0.47 C G N
0.68 C G N N
1.0 C C G G G N N
1.5 NN
2.2 GG N N
3.3 N
4.7 GG N N
6.8
10 N
22
47
100
WVDC 10 16 25 4 6.3 10 16 25 4 6.3 10 16 25 35 6.3 10 16 25 35 50
SIZE 0201 0402 0603 0805
L
W
T
t
Letter A C E G J K M N P Q X Y Z
Max. 0.33 0.56 0.71 0.86 0.94 1.02 1.27 1.40 1.52 1.78 2.29 2.54 2.79
Thickness (0.013) (0.022) (0.028) (0.034) (0.037) (0.040) (0.050) (0.055) (0.060) (0.070) (0.090) (0.100) (0.110)
PAPER EMBOSSED
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