Part Number: -100

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Technical Document


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(a)
(c)
(b) (e)
(d)
1. PART NO. EXPRESSION :
(b) Dimension code
(c) Inductance code : R12 = 0.12uH
(a) Series code
2. CONFIGURATION & DIMENSIONS :
4. GENERAL SPECIFICATION :
SUPERWORLD ELECTRONICS (S) PTE LTD
3. SCHEMATIC :
(d) Tolerance code : J = ±5%, K = ±10%, M = ±20%
(e) F : Lead Free
SDI321618 SERIES
WIREWOUND CHIP INDUCTORS
PG. 1
NOTE : Specifications subject to change without notice. Please check our website for latest information.
31.07.2008
S D I 3 2 1 6 1 8 - R 1 2 M F
c) Rated current : Base on temp. rise & ǻL/L0A=10% Max.
b) Operating temp. : -25°C to 85°C
a) Ambient temp. : 20°C
C
1.6±0.23.2±0.3
BA
A
H
1.5 Ref.0.7 Min.0.7 Min.1.8±0.3
ECHF
1.0 Ref.1.5 Ref.
Unit:m/m
JI
FB E
PCB Pattern
I
E
I
J
2
1
SUPERWORLD ELECTRONICS (S) PTE LTD
SDI321618 SERIES
NOTE : Specifications subject to change without notice. Please check our website for latest information.
PG. 2
31.07.2008
5. ELECTRICAL CHARACTERISTICS :
WIREWOUND CHIP INDUCTORS
SDI321618-2R2F
SDI321618-4R7F
SDI321618-1R0F
SDI321618-R47F
SDI321618-R22F
SDI321618-R12F
50 0.533 4301M2.2
1M4.7 31 3400.845
1M1.0
1M
1M
1M
0.47
0.22
0.12
100 0.364 510
180
250
250
0.210
0.140
700
850
0.112 970
Part No.
Test
Frequency
( Hz )
Inductance
( uH )
( MHz )
Min.
SRF
( ȍ )
Max.
DCR
( mA )
Max.
IDC
SDI321618-101F
SDI321618-470F
1M
1M
100
47
7.0
10
15.60 80
10.40 100
SDI321618-220F
SDI321618-100F
1M
1M
22
10
14
20
3.900 160
1.690 230
M
Tolerance
M
M
M
M
K, M
J, K
J, K
J, K
J, K
Tolerance code :
 : J = ±5%
K = ±10%
M = ±20%
Temp
MIL-STD-202G Method 108A
Time
T
More than 95% of termincal electrode should
SUPERWORLD ELECTRONICS (S) PTE LTD
NOTE : Specifications subject to change without notice. Please check our website for latest information.
MIL-STD-202G Method 208H
Physical Characteristics Tests
Reference documents:
IPC J-STD-002B
Solderability Test
be covered with solder.
PG. 3
31.07.2008
Solder : Sn(63)/Pb(37)
Flux : rosin flux
Dip time : 5 secs.
Solder temperature : 245±5°C
-40°C
1. No case deformation or change in appearance.
1. No case deformation or change in appearance.
1. No case deformation or change in appearance.
Reference documents:
MIL-STD-202G Method 107G
Thermal shock test
Reference documents:
4. ǻDCR/DCR<10%
T : weight< 28g : 15 Min.
28g<weight<136g : 30 Min.
2. ǻL/L<30% (Closed Magnetic Circuit)
3. ǻQ/Q < 30%
ǻL/L<10%
MIL-STD-202G Method 103B
4. ǻDCR/DCR<10%
3. ǻQ/Q < 30%
3. ǻQ/Q < 30%
Humidity Test
IEC 68-2-1A 6.1 6.2
2. ǻL/L<30% (Closed Magnetic Circuit)
ǻL/L<10%
4. ǻDCR/DCR<10%
Low Temperature Storage Test
Reference documents:
2. ǻL/L<30% (Closed Magnetic Circuit)
ǻL/L<10%
4. ǻDCR/DCR<10%
Change time < 5 min
Room
Temp
0
Temp
125°C
Conditions of 1 cycle :
Step 2 : 125°C for T time
Step 1 : -40°C for T time
Total : 20 cycles
T
Tested after 1 hour (less than 2 hours) at room temperature
Tested while the specimens are still in the chamber
96H
High temperature
93%RH
0
High humidity
Time : 96±2 hours
Temp & Humidity
40°C
Conditions
1H
Test Time
Room
Dry oven at temperature of 40±5°C for 24 hours
Exposure : Temperature : 40±2°C, Humidity : 93±3% RH,
Temp
Measured after 24 hours
Low temperature
0
-25°C
Room
Temp
96H
Test
Time
96H
Tested after 1 hour (less than 2 hours) at room temperature
Temperature : -25±2°C
Time : 96±2 hours
Room
0
Temp
High temperature
85°C
Test
1H
Time
1. No case deformation or change in appearance.High Temperature Storage Test
6. RELIABILITY AND TEST CONDITION :
Reference documents:
Environmental Tests
ITEM
2. ǻL/L<30% (Closed Magnetic Circuit)
ǻL/L<10%
3. ǻQ/Q < 30%
PERFORMANCE
Tested after 1 hour (less than 2 hours) at room temperature
TEST CONDITION
Temperature : 85±2°C
Time : 96±2 hours
WIREWOUND CHIP INDUCTORS
SDI321618 SERIES
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